In-situ XRD study of Ga/In interdiffusion in Cu(In,Ga)Se2 in an industrially relevant selenization furnace

Authors: Aninat, Remi, van den Bruele, F.J., Tinnemans, Paul, Schermer, J.J., Emmelkamp, Jurjen, Vlieg, Elias, Theelen, Mirjam, van der Vleuten, Maarten, Linden, Hans

Source: 2020 47th IEEE Photovoltaic Specialists Conference (PVSC) Photovoltaic Specialists Conference (PVSC), 2020 47th IEEE. :1279-1282 Jun, 2020

Relation: 2020 IEEE 47th Photovoltaic Specialists Conference (PVSC)

In-situ XRD study on the selenisation parameters driving Ga/In interdiffusion in Cu(In,Ga)Se2 in a versatile, industrially-relevant selenisation furnace

Authors: Aninat, R., van den Bruele, F.J., Schermer, J.J., Tinnemans, P., Emmelkamp, J., Vlieg, E., van der Vleuten, M., Linden, H., Theelen, M.

Source: In Solar Energy December 2021 230:1085-1094

In-situ XRD study on the selenisation parameters driving Ga/In interdiffusion in Cu(In, Ga)Se2 in a versatile, industrially-relevant selenisation furnace

Authors: Aninat, R., van den Bruele, F.J., Schermer, J.J., Tinnemans, P., Emmelkamp, J., Vlieg, E., van der Vleuten, M., Linden, H., Theelen, M.

Source: Solar energy. 230:1085-1094

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In-situ X-ray diffraction annealing study of electroplated and sputtered Cu-In-Ga precursors for application to sequential Cu(In, Ga)Se2 processes

Authors: Aninat, R., Hovestad, A., van Zelst, F., van den Bruele, F.J., Schermer, J.J., Emmelkamp, J., Vlieg, E., Linden, H., Theelen, M.

Source: Thin solid films. 758

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Monolayer and aggregate formation of a modified phthalocyanine on mica determined by a delicate balance of surface interactions

Authors: van den Bruele, F.J., de Poel, W., Sturmans, H.W.M., Pintea, S., de Gelder, R., Wermeille, D., Juríček, M., Rowan, A.E., van Enckevort, W.J.P., Vlieg, E.

Source: In Surface Science May 2012 606(9-10):830-835

A unique growth mechanism of donut-shaped Mg–Al layered double hydroxides crystals revealed by AFM and STEM–EDX

Authors: Budhysutanto, W.N., Van Den Bruele, F.J., Rossenaar, B.D., Van Agterveld, D., Van Enckevort, W.J.P., Kramer, H.J.M

Source: In Journal of Crystal Growth 1 March 2011 318(1):110-116

Surface Degradation during Separation of Crystals from Solution: Minimizing the Shut-off Effect

Authors: van den Bruele, F.J., Marks, K.M., Harmsen, B., Alfring, A.L., Sprong, H., van Enckevort, W.J.P., Vlieg, E.

Source: CRYSTAL GROWTH AND DESIGN. 12(5):2265-2271

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Anticaking Activity of Ferrocyanide on Sodium Chloride Explained by Charge Mismatch

Authors: Bode, A.A.C., Vonk, V., van den Bruele, F.J., Kok, D.J., Kerkenaar, A.M., Mantilla, M.F., Jiang, S., Meijer, J.A.M., van Enckevort, W.J.P., Vlieg, E.

Source: CRYSTAL GROWTH AND DESIGN. 12(4):1919-1924

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Cooperative Double Deprotonation of Bis(2-picolyl)amine Leading to Unexpected Bimetallic Mixed Valence (M^-^1, M^1) Rhodium and Iridium Complexes

Authors: Tejel, C., del Rio, M.P., Asensio, L., van den Bruele, F.J., Ciriano, M.A., Spithas, N.T.i., Hetterscheid, D.G.H., de Bruin, B.

Source: INORGANIC CHEMISTRY -AMERICAN CHEMICAL SOCIETY-. 50(16):7524-7534

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Self-Assembly of Porphyrins on a Single Crystalline Organic Substrate

Authors: van den Bruele, F.J., Elemans, J.A.A.W., Rowan, A.E., van Enckevort, W.J.P., Vlieg, E.

Source: LANGMUIR. 26(1):498-503

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Atmospheric pressure plasma enhanced spatial ALD of silver

Authors: van den Bruele, F.J., Smets, M., Illiberi, A., Creyghton, Y., Buskens, P., Roozeboom, F., Poodt, P.

Source: JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY A VACUUM SURFACES AND FILMS. 33(1):01A131-01A131

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Deprotonation Induced Ligand-to-Metal Electron Transfer: Synthesis of a Mixed-Valence Rh(-I,I) Dinuclear Compound and Its Reaction with Dioxygen

Authors: Tejel, C., Ciriano, M.A., del Rio, M.P., van den Bruele, F.J., Hetterscheid, D.G.H., Spithas, N.T.i., de Bruin, B.

Source: JOURNAL- AMERICAN CHEMICAL SOCIETY. 130(18):5844-5845

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In-situ X-ray diffraction annealing study of electroplated and sputtered Cu-In-Ga precursors for application to sequential Cu(In,Ga)Se2 processes.

Authors: Aninat, R.¹, Hovestad, A.¹, van Zelst, F.¹, van den Bruele, F.J.¹, Schermer, J.J.², Emmelkamp, J.¹, Vlieg, E.³, Linden, H.¹, Theelen, M.¹

Source: Thin Solid Films; Sep2022, Vol. 758, pN.PAG-N.PAG, 1p