Pre-Charged Collapse-Mode Capacitive Micromachined Ultrasonic Transducer (CMUT) Receivers for Efficient Power Transfer

Authors: Saccher, M., Stuart Savoia, A., van Schaijk, R., Klootwijk, J.H., Dekker, R.

Source: IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control IEEE Trans. Ultrason., Ferroelect., Freq. Contr. Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on. 72(2):283-297 Feb, 2025

Modeling and Characterization of Pre-Charged Collapse-Mode CMUTs

Authors: Saccher, M., Kawasaki, S., Klootwijk, J.H., Van Schaijk, R., Dekker, R.

Source: IEEE Open Journal of Ultrasonics, Ferroelectrics, and Frequency Control IEEE Open J. Ultrason., Ferroelect., Freq. Contr. Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Open Journal of. 3:14-28 2023

Polymer coated MEMS resonator for room temperature NH3 sensing

Authors: Dam, V.A.T., Wouters, D., Knoben, W., Brongersma, S.H., van Schaijk, R.

Source: IEEE SENSORS 2014 Proceedings SENSORS, 2014 IEEE. :194-197 Nov, 2014

Relation: 2014 IEEE Sensors

Improved mechanical reliability of MEMS piezoelectric vibration energy harvesters for automotive applications

Authors: Renaud, M., Wang, Z., Jambunathan, M., Matova, S., Elfrink, R., Rovers, M., Goedbloed, M., de Nooijer, C., Vullers, R. J. M., van Schaijk, R.

Source: 2014 IEEE 27th International Conference on Micro Electro Mechanical Systems (MEMS) Micro Electro Mechanical Systems (MEMS), 2014 IEEE 27th International Conference on. :568-571 Jan, 2014

Relation: 2014 IEEE 27th International Conference on Micro Electro Mechanical Systems (MEMS)

MEMS based vibration harvesting: Facing the ugly facts

Authors: Vullers, R. J. M., Renaud, M., Elfrink, R., van Schaijk, R.

Source: 2013 Transducers & Eurosensors XXVII: The 17th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII) Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII), 2013 Transducers & Eurosensors XXVII: The 17th International Conference on. :685-688 Jun, 2013

Relation: 2013 Transducers & Eurosensors XXVII: The 17th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII)

A high performance electrostatic MEMS vibration energy harvester with corrugated inorganic SiO2-Si3N4 electret

Authors: Renaud, M., Altena, G., Goedbloed, M., Nooijer, C.de, Matova, S., Naito, Y., Yamakawa, T., Takeuchi, H., Onishi, K., van Schaijk, R.

Source: 2013 Transducers & Eurosensors XXVII: The 17th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII) Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII), 2013 Transducers & Eurosensors XXVII: The 17th International Conference on. :693-696 Jun, 2013

Relation: 2013 Transducers & Eurosensors XXVII: The 17th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII)

Large power amplification of a piezoelectric energy harvester excited by random vibrations

Authors: Wang, Z., Elfrink, R., Vullers, R. J. M., van Acht, V., Tutelaers, M., Matova, S., Oudenhoven, J., van Schaijk, R.

Source: 2013 IEEE 26th International Conference on Micro Electro Mechanical Systems (MEMS) Micro Electro Mechanical Systems (MEMS), 2013 IEEE 26th International Conference on. :106-109 Jan, 2013

Relation: 2013 IEEE 26th International Conference on Micro Electro Mechanical Systems (MEMS)

A piezoelectric vibration harvester based on clamped-guided beams

Authors: Wang, Z., Matova, S., Elfrink, R., Jambunathan, M., de Nooijer, C., van Schaijk, R., Vullers, R. J. M.

Source: 2012 IEEE 25th International Conference on Micro Electro Mechanical Systems (MEMS) Micro Electro Mechanical Systems (MEMS), 2012 IEEE 25th International Conference on. :1201-1204 Jan, 2012

Relation: 2012 IEEE 25th International Conference on Micro Electro Mechanical Systems (MEMS)

Design, modeling, fabrication and characterization of an electret-based MEMS electrostatic energy harvester

Authors: Altena, G., Hohlfeld, D., Elfrink, R., Goedbloed, M.H., van Schaijk, R.

Source: 2011 16th International Solid-State Sensors, Actuators and Microsystems Conference Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International. :739-742 Jun, 2011

Relation: TRANSDUCERS 2011 - 2011 16th International Solid-State Sensors, Actuators and Microsystems Conference

Power optimization in body sensor networks: The case of an Autonomous wireless EMG sensor powered by PV-cells

Authors: Penders, J., Pop, V., Caballero, L., van de Molengraft, J., van Schaijk, R., Vullers, R., Van Hoof, C.

Source: 2010 Annual International Conference of the IEEE Engineering in Medicine and Biology Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE. :2017-2020 Aug, 2010

Relation: 2010 32nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC)

On the passivation of interface states in SONOS test structures: impact of device layout and annealing process

Authors: Driussi, F., Selmi, L., Akil, N., van Duuren, M.J., van Schaijk, R.

Source: 2006 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on. :51-55 2006

Relation: Proceedings of the 2006 International Conference on Microelectronic Test Structures

Pushing the scaling limits of embedded non-volatile memories with high-K materials

Authors: van Duuren, M., van Schaijk, R., Slotboom, M., Tello, P.G., Akil, N., Miranda, A.H., Golubovic, D.S.

Source: 2006 IEEE International Conference on IC Design and Technology Integrated Circuit Design and Technology, 2006. ICICDT '06. 2006 IEEE International Conference on. :1-4 2006

Relation: 2006 IEEE International Conference on IC Design and Technology

Reliability of embedded SONOS memories

Authors: van Schaijk, R., van Duuren, M., Goarin, P., Wan Yuet Mei, van der Jeugd, K.

Source: Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) Solid-state device research conference Solid-State Device Research Conference, 2004. ESSDERC 2004. Proceeding of the 34th European. :277-280 2004

Relation: Proceedings of the 34th European Solid-State Device Research Conference

Self-aligned access gate technology for compact embedded flash memories

Authors: Goarin, P., van Schaijk, R., Slotboom, M., Tello, P.G., van Duuren, M., Akil, N., Baks, W.

Source: Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) Solid-state device research conference Solid-State Device Research Conference, 2004. ESSDERC 2004. Proceeding of the 34th European. :281-284 2004

Relation: Proceedings of the 34th European Solid-State Device Research Conference

Gate oxide reliability and deuterated CMOS processing

Authors: Hof, A.J., Kovalgin, A., van Schaijk, R., Baks, W.M., Schmitz, J.

Source: IEEE International Integrated Reliability Workshop Final Report, 2004 Integrated reliability workshop Integrated Reliability Workshop Final Report, 2004 IEEE International. :7-10 2004

Relation: 2004 IEEE International Integrated Reliability Workshop Final Report

A High Voltage Self-Biased Integrated DC-DC Buck Converter With Fully Analog MPPT Algorithm for Electrostatic Energy Harvesters

Authors: Stanzione, S., van Liempd, C., van Schaijk, R., Naito, Y., Yazicioglu, F., Van Hoof, C.

Source: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 48(12):3002-3010 Dec, 2013

Charge Retention in a Patterned ${\rm SiO}_{2}/{\rm Si}_{3}{\rm N}_{4}$ Electret

Authors: Leonov, V., van Schaijk, R., Van Hoof, C.

Source: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 13(9):3369-3376 Sep, 2013

Spectroscopic analysis of trap assisted tunneling in thin oxides by means of substrate hot electron injection experiments

Authors: Driussi, F., Iob, R., Esseni, D., Selmi, L., van Schaijk, R., Widdershoven, F.

Source: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :159-162 2002

Relation: IEEE International Electron Devices Meeting

Experimental Characterization of the Vertical Position of the Trapped Charge in Si Nitride-Based Nonvolatile Memory Cells

Authors: Arreghini, A., Driussi, F., Vianello, E., Esseni, D., van Duuren, M. J., Golubovic, D. S., Akil, N., van Schaijk, R.

Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 55(5):1211-1219 May, 2008

Impact of Device Layout and Annealing Process During the Passivation of Interface States in Presence of Silicon Nitride Layers

Authors: Driussi, F., Selmi, L., Akil, N., van Duuren, M. J., van Schaijk, R.

Source: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 21(2):195-200 May, 2008