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1Conference
Authors: Kabin, Ievgen, Langendoerfer, Peter, Dyka, Zoya
Source: 2025 IEEE 26th Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2025 IEEE 26th. :1-4 Mar, 2025
Relation: 2025 IEEE 26th Latin American Test Symposium (LATS)
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2Academic Journal
Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 44(4):1276-1289 Apr, 2025
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3Academic Journal
Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 72(1):111-118 Jan, 2025
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4Academic Journal
Authors: Kubica, R.M.R., Albouy, A., Balestra, F., Aliane, A., Leduc, P.
Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(8):4476-4482 Aug, 2024
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5Conference
Authors: Liu, Yihao, Ye, Yaoyao
Source: 2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC) Design Automation Conference (ASP-DAC), 2024 29th Asia and South Pacific. :860-865 Jan, 2024
Relation: 2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC)
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6Conference
Authors: Ching, Keyt Yeng, Tan, Jethro, Chan, Gary
Source: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2023 IEEE International Symposium on the. :1-4 Jul, 2023
Relation: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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7Conference
Authors: Moussavi, Elmira, Sisejkovic, Dominik, Singh, Animesh, Kizatov, Daniyar, Leupers, Rainer, Ingebrandt, Sven, Pachauri, Vivek, Merchant, Farhad
Source: 2022 IEEE 23rd Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2022 IEEE 23rd. :1-4 Sep, 2022
Relation: 2022 IEEE 23rd Latin American Test Symposium (LATS)
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8Academic Journal
Authors: Kocyigit, A., Aydogan, S., Incekara, U., Yilmaz, M.
Source: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 23(8):8184-8191 Apr, 2023
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9Academic Journal
Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(2):720-725 Feb, 2023
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10Academic Journal
Source: Zaštita Materijala, Vol 65, Iss 4, Pp 660-667 (2024)
Subject Terms: building, electrical resistance, temperature sensing, thermal sensitivity index, waste, Chemical technology, TP1-1185
File Description: electronic resource
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11Conference
Authors: Senyk, Andriy, Pabyrivskyi, Viktor, Ukhanska, Oksana, Futryk, Yuriy, Senyk, Yuliya, Stepanyuk, Oleksandr
Source: 2022 IEEE 16th International Conference on Advanced Trends in Radioelectronics, Telecommunications and Computer Engineering (TCSET) Advanced Trends in Radioelectronics, Telecommunications and Computer Engineering (TCSET), 2022 IEEE 16th International Conference on. :746-750 Feb, 2022
Relation: 2022 IEEE 16th International Conference on Advanced Trends in Radioelectronics, Telecommunications and Computer Engineering (TCSET)
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12Academic Journal
Authors: Shunyu Zhang, Xiangrui Zhao, Liangguo Cheng, Zhihang Shen, Zhenlei Chen
Source: Case Studies in Thermal Engineering, Vol 66, Iss , Pp 105745- (2025)
Subject Terms: Arithmetic superposition index P, Thermal sensitivity weighting, Multi-objective optimization, Kitchen comfort, Orthogonal experiments, Auxiliary ventilation, Engineering (General). Civil engineering (General), TA1-2040
File Description: electronic resource
Relation: http://www.sciencedirect.com/science/article/pii/S2214157X2500005X; https://doaj.org/toc/2214-157X
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13Academic Journal
Authors: Shi, B., Marra, G., Feng, Z., Sakr, H., Hayes, J.R., Fokoua, E.R.N., Ding, M., Poletti, F., Richardson, D.J., Slavik, R.
Source: Journal of Lightwave Technology J. Lightwave Technol. Lightwave Technology, Journal of. 40(16):5716-5721 Aug, 2022
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14Conference
Source: 2021 IEEE Industrial Electronics and Applications Conference (IEACon) Industrial Electronics and Applications Conference (IEACon), 2021 IEEE. :97-102 Nov, 2021
Relation: 2021 IEEE Industrial Electronics and Applications Conference (IEACon)
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15Conference
Authors: Shi, Bo, Davidson, Ian A., Mahdiraji, Ghafour A., Rzegocki, Jaroslaw, Numkam Fokoua, Eric R., Mousavi, Mohammad, Feng, Zitong, Ding, Meng, Poletti, Francesco, Richardson, David J., Slavik, Radan
Source: 2023 Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFCS) Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFCS), 2023 Joint Conference of the European. :1-2 May, 2023
Relation: 2023 Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFCS)
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16Academic Journal
Authors: Dian Shofinita, Yazid Bindar, Tjokorde Walmiki Samadhi, Arwinda Jaelawijaya, Darien Theodric, Amarthya Benigna Achmadi
Source: International Journal of Technology, Vol 15, Iss 5, Pp 1282-1291 (2024)
Subject Terms: antioxidant, dragon fruit skin, food colorants, spray drying, thermal sensitivity, Technology, Technology (General), T1-995
File Description: electronic resource
Relation: https://ijtech.eng.ui.ac.id/article/view/6040; https://doaj.org/toc/2086-9614; https://doaj.org/toc/2087-2100
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17Academic Journal
Authors: Nguyen, Van Nghia a, ⁎, Trinh, Duc Thien b, Nguyen, Dinh Lam c, Nguyen, Thanh Huong d, Le Thi, Minh Cham a, Nguyen Thi, Ha Phuong a, Nguyen, Ngoc Thanh e, Pham, Hung-Vuong f, Le, Quoc Minh d, g
Source: In Ceramics International April 2025 51(10):13580-13585
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18Academic Journal
Authors: Chen, Weiming a, b, Chang, Junrui c, Wang, Qin c, Liu, Ningrui d, Gao, Xinting e, Zhang, Hui f, Zhu, Yingxin a, g, Cao, Bin a, b, ⁎
Source: In Sustainable Cities and Society 1 March 2025 121
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19Academic Journal
Authors: Yue, Huanyu a, b, Cao, Bin a, b, ⁎
Source: In Building and Environment 15 February 2025 270
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20Academic Journal
Authors: Li, Han a, Wu, Zhiyao a, Hu, Haiyu b, Kong, Xiangfei a, ⁎, Fan, Man a
Source: In Building and Environment 15 February 2025 270