Design and Analysis of 8T Radiation Hardened SRAM using 65nm Process

Authors: Gupta, Hari Shanker, Satyendra, Singh Shruti, Deo, Bhumika, Santosh, Rane Prathamesh, Khole, Ritesh, Singh, Varun Dev, Kumar, Nishant, Prakash, Krish

Source: 2024 28th International Symposium on VLSI Design and Test (VDAT) VLSI Design and Test (VDAT), 2024 28th International Symposium on. :1-4 Sep, 2024

Relation: 2024 28th International Symposium on VLSI Design and Test (VDAT)

Fault Resilient Micro-Coded Control Unit for Space-Based Digital Systems

Authors: Deepanjali, S, Sk, Noor Mahammad, Kumar Sakali, Raghavendra

Source: 2024 28th International Symposium on VLSI Design and Test (VDAT) VLSI Design and Test (VDAT), 2024 28th International Symposium on. :1-6 Sep, 2024

Relation: 2024 28th International Symposium on VLSI Design and Test (VDAT)

ISFD: Efficient and Fault-tolerant In-System-Failure-Detection for LP FPGA-based Smart-Sensors in Space Expeditions

Authors: Rahman, Kazi Mohammad Abidur, Dirkes, Timo, Delfs, Bjoern, Wyrwoll, Vanessa, Kulau, Ulf

Source: 2024 20th International Conference on Distributed Computing in Smart Systems and the Internet of Things (DCOSS-IoT) DCOSS-IOT Distributed Computing in Smart Systems and the Internet of Things (DCOSS-IoT), 2024 20th International Conference on. :74-83 Apr, 2024

Relation: 2024 20th International Conference on Distributed Computing in Smart Systems and the Internet of Things (DCOSS-IoT)

A G-Band SiGe BiCMOS LNA With an Area Efficient Built-In Temperature Compensation Circuit and Robust to TID Radiation

Authors: Urain, A., Rio, D.d., Ujan-Martinez, C.I., Kantanen, M., Berenguer, R.

Source: IEEE Access Access, IEEE. 12:138180-138191 2024

Challenges in FPGA Design for Complex, High Performance Space Applications

Authors: Le, Chinh H., Miles, Lynn R.

Source: 2023 IEEE Space Computing Conference (SCC) SCC Space Computing Conference (SCC), 2023 IEEE. :45-50 Jul, 2023

Relation: 2023 IEEE Space Computing Conference (SCC)

Architectural Radiation Hardening of CMOS Power Management Circuits through Bias Tuning

Authors: Koli, Gauri, Nguyen, Liam, Kitchen, Jennifer

Source: 2023 IEEE 41st VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2023 IEEE 41st. :1-8 Apr, 2023

Relation: 2023 IEEE 41st VLSI Test Symposium (VTS)

Qualitative Risk Assessment in the Application of Circuit-based Protection Against SEL in Space Electronics

Authors: Yanenko, Andrey

Source: 2022 Moscow Workshop on Electronic and Networking Technologies (MWENT) Electronic and Networking Technologies (MWENT), 2022 Moscow Workshop on. :1-4 Jun, 2022

Relation: 2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)

Effects of a Conformal Coating on the Signal Integrity of Space Electronics Systems

Authors: Gong, Z., Sun, D., Liu, Y.

Source: IEEE Transactions on Components, Packaging and Manufacturing Technology IEEE Trans. Compon., Packag. Manufact. Technol. Components, Packaging and Manufacturing Technology, IEEE Transactions on. 12(11):1882-1889 Nov, 2022

Total Ionizing Dose and Radiation Particle Strike Analysis of Nanoscale FinFET Devices and Circuits

Authors: Spoorthi, Ch., Grace, Jessy, Chavan, Ameet, Rao, Chinnam SV Maruthi

Source: 2020 4th International Conference on Electronics, Communication and Aerospace Technology (ICECA) Electronics, Communication and Aerospace Technology (ICECA), 2020 4th International Conference on. :479-484 Nov, 2020

Relation: 2020 4th International Conference on Electronics, Communication and Aerospace Technology (ICECA)

Method of Digital Counterpart Creation of Physical Processes at Productive Foresight Modeling of Cyber-Physical Systems

Authors: Kofanov, Yury N., Sotnikova, Svetlana Y.

Source: 2020 Moscow Workshop on Electronic and Networking Technologies (MWENT) Electronic and Networking Technologies (MWENT), 2020 Moscow Workshop on. :1-5 Mar, 2020

Relation: 2020 Moscow Workshop on Electronic and Networking Technologies (MWENT)

Design of a LC Voltage-Controlled Oscillator for Space Applications in C-Band

Authors: Uzun, Yasemin, Kabaoglu, Aykut, Yelten, Mustafa Berke

Source: 2019 11th International Conference on Electrical and Electronics Engineering (ELECO) Electrical and Electronics Engineering (ELECO), 2019 11th International Conference on. :388-391 Nov, 2019

Relation: 2019 11th International Conference on Electrical and Electronics Engineering (ELECO)

Lead-Free Soldering Risks and Reliability Problems in Space Electronics

Authors: Cal, Baris

Source: 2019 3rd International Symposium on Multidisciplinary Studies and Innovative Technologies (ISMSIT) Multidisciplinary Studies and Innovative Technologies (ISMSIT), 2019 3rd International Symposium on. :1-8 Oct, 2019

Relation: 2019 3rd International Symposium on Multidisciplinary Studies and Innovative Technologies (ISMSIT)

Radiation Tolerance of RHBD techniques on a SiGe BiCMOS 350 nm ASIC technology

Authors: Chen, Si, Prele, Damien, Voisin, Fabrice, Laurent, Philippe, Goldwurm, Andrea

Source: 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2019 19th European Conference on. :01-11 Sep, 2019

Relation: 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

Metod of Foresight Modeling in Electronic Space Projects

Authors: Kofanov, Yury N., Sotnikova, Svetlana Y., Sargsyan, Grigor A.

Source: 2019 International Conference "Quality Management, Transport and Information Security, Information Technologies" (IT&QM&IS) "Quality Management, Transport and Information Security, Information Technologies" (IT&QM&IS), 2019 International Conference. :264-267 Sep, 2019

Relation: 2019 International Conference "Quality Management, Transport and Information Security, Information Technologies" (IT&QM&IS)

Recipes to build-up a rad-hard CMOS memory

Authors: Calligaro, Cristiano, Gatti, Umberto

Source: 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS ), 2019 IEEE 25th International Symposium on. :216-219 Jul, 2019

Relation: 2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS)

A Cryogenic LC VCO Utilizing Cryogenic Models of Active Devices

Authors: Gulec, Huseyin Ozan, Yelten, Mustafa Berke

Source: 2019 6th International Conference on Electrical and Electronics Engineering (ICEEE) ICEEE Electrical and Electronics Engineering (ICEEE), 2019 6th International Conference on. :220-224 Apr, 2019

Relation: 2019 6th International Conference on Electrical and Electronics Engineering (ICEEE)

The Foresight Modeling in Ensuring High Quality of Space Electronic Equipment

Authors: Kofanov, Yury N., Sotnikova, Svetlana Y.

Source: 2019 International Seminar on Electron Devices Design and Production (SED) Electron Devices Design and Production (SED), 2019 International Seminar on. :1-6 Apr, 2019

Relation: 2019 International Seminar on Electron Devices Design and Production (SED)

Increase in Accuracy of the Solution of the Problem of Identification of Production Batches of Semiconductor Devices

Authors: Rozhnov, I.P., Orlov, V.I., Kazakovtsev, L.A.

Source: 2018 XIV International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) Actual Problems of Electronics Instrument Engineering (APEIE), 2018 XIV International Scientific-Technical Conference on. :363-367 Oct, 2018

Relation: 2018 XIV International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE)

Thermal Analysis of the Solar Orbiter PHI Electronics Unit

Authors: Torralbo, I., Perez-Grande, I., Gasent-Blesa, J.L., Piqueras, J., Sanchis-Kilders, E., Rodriguez, P., Lopez, A.

Source: IEEE Transactions on Aerospace and Electronic Systems IEEE Trans. Aerosp. Electron. Syst. Aerospace and Electronic Systems, IEEE Transactions on. 56(1):186-195 Feb, 2020

A 10-Bit Radiation-Hardened by Design (RHBD) SAR ADC for Space Applications

Authors: Baghbanmanesh, MohammadReza, Maloberti, Franco, Gatti, Umberto

Source: 2017 New Generation of CAS (NGCAS) NGCAS CAS (NGCAS), 2017 New Generation of. :53-56 Sep, 2017

Relation: 2017 New Generation of CAS (NGCAS)