Reliability growth prediction of mine-used low-voltage switchgear

Authors: XIA Haoxuan, LIU Zixu, WANG Jingqin, YANG Chunwen, WANG Li

Source: Gong-kuang zidonghua, Vol 41, Iss 2, Pp 36-39 (2015)

Subject Terms: low-voltage switchgear, reliability growth prediction, bayes method, mtbf, Mining engineering. Metallurgy, TN1-997

File Description: electronic resource

Relation: https://doaj.org/toc/1671-251X

Access URL: https://doaj.org/article/f49082eb7f664b54bdee8e9783b68137

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