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1Academic Journal
Source: IEEE Transactions on Industrial Informatics IEEE Trans. Ind. Inf. Industrial Informatics, IEEE Transactions on. 21(1):337-346 Jan, 2025
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2Academic Journal
Source: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 24(13):21776-21785 Jul, 2024
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3Academic Journal
Source: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 73:1-10 2024
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4Academic Journal
Source: IEEE Signal Processing Letters IEEE Signal Process. Lett. Signal Processing Letters, IEEE. 31:2615-2619 2024
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5Academic Journal
Source: IEEE Transactions on Geoscience and Remote Sensing IEEE Trans. Geosci. Remote Sensing Geoscience and Remote Sensing, IEEE Transactions on. 62:1-16 2024
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6Conference
Authors: Yang, Jing, Fang, Jianwu, Xu, Hongke
Source: 2023 35th Chinese Control and Decision Conference (CCDC) Control and Decision Conference (CCDC), 2023 35th Chinese. :4616-4622 May, 2023
Relation: 2023 35th Chinese Control and Decision Conference (CCDC)
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7Academic Journal
Source: IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing, Vol 18, Pp 321-336 (2025)
Subject Terms: Earth observation, geospatial foundation models, masked autoencoder (MAE), remote sensing (RS), self-supervised learning, Ocean engineering, TC1501-1800, Geophysics. Cosmic physics, QC801-809
File Description: electronic resource
Relation: https://ieeexplore.ieee.org/document/10766851/; https://doaj.org/toc/1939-1404; https://doaj.org/toc/2151-1535
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8Academic Journal
Source: IEEE Transactions on Geoscience and Remote Sensing IEEE Trans. Geosci. Remote Sensing Geoscience and Remote Sensing, IEEE Transactions on. 61:1-12 2023
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9Academic Journal
Authors: Zhang, Shubin a, An, Dong b, c, d, e, f, Liu, Jincun b, c, d, e, f, Wei, Yaoguang b, c, d, e, f, ⁎
Source: In Applied Soft Computing February 2025 170
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10Academic Journal
Authors: Yibo Chen, Haolong Peng, Le Huang, Jianming Zhang, Wei Jiang
Source: IEEE Access, Vol 11, Pp 127526-127538 (2023)
Subject Terms: Defect localization, self-supervised learning, visual transformer (ViT), masked autoencoder (MAE), industrial products, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
File Description: electronic resource