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1Conference
Authors: Ge, Yu-Hang, Wang, Shu-Juan, Liang, Bao, Li, Xi
Source: 2021 IEEE Far East NDT New Technology & Application Forum (FENDT) New Technology & Application Forum (FENDT), 2021 IEEE Far East NDT. :119-123 Dec, 2021
Relation: 2021 IEEE Far East NDT New Technology & Application Forum (FENDT)
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2Academic Journal
Authors: Vithanage, R.K.W., Mohseni, E., Qiu, Z., MacLeod, C., Javadi, Y., Sweeney, N., Pierce, G., Gachagan, A.
Source: IEEE Transactions on Industrial Electronics IEEE Trans. Ind. Electron. Industrial Electronics, IEEE Transactions on. 68(12):12781-12790 Dec, 2021
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3Academic Journal
Authors: Ana Beatriz Lopez, José Pedro Sousa, João P. M. Pragana, Ivo M. F. Bragança, Telmo G. Santos, Carlos M. A. Silva
Source: Machines, Vol 10, Iss 11, p 1069 (2022)
Subject Terms: wire arc additive manufacturing, non-destructive testing, ultrasonic testing, high-temperature inspection, Mechanical engineering and machinery, TJ1-1570
File Description: electronic resource
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4Academic Journal
Authors: Maria Kogia, Tat-Hean Gan, Wamadeva Balachandran, Makis Livadas, Vassilios Kappatos, Istvan Szabo, Abbas Mohimi, Andrew Round
Source: Sensors, Vol 16, Iss 4, p 582 (2016)
Subject Terms: Electromagnetic Acoustic Transducers, EMAT, Guided Wave Testing, high temperature inspection, Chemical technology, TP1-1185
File Description: electronic resource
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5Report
Contributors: Daniel, J
Source: Other Information: From 14th National Symposium of the Society of Aerospace Material and Process Engineers, Cocoa Beach, Fla. UNCL. Orig. Receipt Date: 31-DEC-69
File Description: Medium: X; Size: Pages: 41
Access URL: http://www.osti.gov/scitech/biblio/4785724
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6Report
Contributors: Minushkin, B
Source: Other Information: Orig. Receipt Date: 31-DEC-59
File Description: Medium: X; Size: Pages: 52
Access URL: http://www.osti.gov/scitech/biblio/4238006