Frequency spectra in the ATR mode of ellipsometric parameters of a periodic medium with a resonant defect in which polaritons are excited.

Authors: Yatsyshen, Valery¹ valeryyat@gmail.com

Source: EPJ Web of Conferences. 2/17/2025, Vol. 318, p1-7. 7p.

Subject Terms: *FREQUENCY spectra, *ELLIPSOMETRY, *RESONANT tunneling, *POLARIZATION (Electricity), *SEMICONDUCTORS

Spectroscopic ellipsometry of epitaxially stressed ferroelectric films.

Authors: Nepomniashchaia, N.¹, nepomni@fzu.cz, Pacherova, O.¹, Kocourek, T.¹, Dejneka, A.¹, Tyunina, M.^1,2, tjunina@fzu.cz

Source: Journal of Applied Physics; 1/7/2025, Vol. 137 Issue 1, p1-10, 10p

Optimizing laser-induced phase transformations in Sb2S3 thin films: Simulation framework and experiments.

Authors: Resl, J.¹, josef.resl@jku.at, Hingerl, K.¹, Gutierrez, Y.², Losurdo, M.³, Cobet, C.¹

Source: Journal of Applied Physics; 11/7/2024, Vol. 136 Issue 17, p1-16, 16p

Photochromic YHO darkening: Local or non-local mechanism?

Authors: Hansen, Per-Anders¹, Per-Anders.Hansen@ife.no, Baba, Elbruz Murat¹

Source: Journal of Applied Physics; 10/21/2024, Vol. 136 Issue 15, p1-7, 7p

An innovative approach to control the Hf/Ti ratio in monolayers grown via atomic partial layer deposition.

Authors: Pérez-Valverde, M. I.¹, maritza.iveth.perez@gmail.com, López-Luna, E.¹, Martínez-Guerra, E.², Hernández-Arteaga, J. G. R.¹, Vidal, M. A.¹

Source: Journal of Applied Physics; 9/21/2024, Vol. 136 Issue 11, p1-10, 10p

Characterization of ScAlN/GaN Toward Electronic Device Application

Authors: Maeda, Takuya, Wakamoto, Yusuke, Kobayashi, Atsushi

Source: 2024 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS) BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2024 IEEE. :1-4 Oct, 2024

Relation: 2024 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)

Dielectric Response of Different Alcohols in Water-Rich Binary Mixtures from THz Ellipsometry.

Authors: Mazaheri, Zahra^1,2 (AUTHOR) zahra.mazaheri@unina.it, Papari, Gian Paolo^1,2 (AUTHOR) gianpaolo.papari@unina.it, Andreone, Antonello^1,2 (AUTHOR) andreone@unina.it

Source: International Journal of Molecular Sciences. Apr2024, Vol. 25 Issue 8, p4240. 10p.

Subject Terms: *BINARY mixtures, *ELLIPSOMETRY, *ALIPHATIC alcohols, *ETHYLENE glycol, *DIELECTRICS, *HYDROGEN bonding

A Label-Free Measurement Method for Plane Stress States in Optical Isotropic Films with Spectroscopic Ellipsometry.

Authors: Sun, X.¹, Wang, S.¹, Xing, W.¹, Cheng, X.¹, Li, L.¹, Li, C.¹, licw16@tju.edu.cn, Wang, Z.¹, zywang@tju.edu.cn

Source: Experimental Mechanics; Apr2024, Vol. 64 Issue 3, p341-352, 12p

A Novel Space Charge Optical Measurement Method in Electronic Device Insulation System

Authors: Qi, T., Ren, H., Gao, H., Li, Q.

Source: IEEE Transactions on Industrial Electronics IEEE Trans. Ind. Electron. Industrial Electronics, IEEE Transactions on. 72(4):4280-4290 Apr, 2025

Development of an Optical Library for Coevaporated CdSexTe1−x

Authors: Oliveira, A.J.N., Du, B., Dobson, K.D., Teixeira, J.P., Correia, M.R.P., Salome, P.M.P., Shafarman, W.N.

Source: IEEE Journal of Photovoltaics IEEE J. Photovoltaics Photovoltaics, IEEE Journal of. 15(2):252-260 Mar, 2025

Ensemble Learning-Fused Solution to the Inverse Problem in Integrated Optical Critical Dimension Metrology

Authors: Guo, C., Liu, J., Gu, H., Zhu, J., Zhang, C., Chen, X., Jiang, H., Liu, S.

Source: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 74:1-15 2025

Temperature-Dependent Dielectric Response, Index of Refraction, and Absorption Coefficient of GeSn Films up to 8.4% Sn

Authors: Lemire, A.N., Grossklaus, K.A., Vandervelde, T.E.

Source: IEEE Journal of Selected Topics in Quantum Electronics IEEE J. Select. Topics Quantum Electron. Selected Topics in Quantum Electronics, IEEE Journal of. 31(1: SiGeSn Infrared Photon. and Quantum Electronics):1-5 Jan, 2025

Adhesion Layer Analysis by Spectroscopic Ellipsometry

Authors: Richter, Uwe

Source: 2024 IEEE 10th Electronics System-Integration Technology Conference (ESTC) Electronics System-Integration Technology Conference (ESTC), 2024 IEEE 10th. :1-4 Sep, 2024

Relation: 2024 IEEE 10th Electronics System-Integration Technology Conference (ESTC)

Advanced Ultrathin Spray Coating Process Technology for Heterogeneous Integration Applications

Authors: Rimbock, Johanna, Ertl, Stefan, Ramaswamy, Prasanna, Farrell, Alex, Uzun, Ali, Pires, Mariana, Corbett, Brian, Loi, Ruggero, Varga, Ksenija, Ossieur, Peter

Source: 2024 IEEE 10th Electronics System-Integration Technology Conference (ESTC) Electronics System-Integration Technology Conference (ESTC), 2024 IEEE 10th. :1-9 Sep, 2024

Relation: 2024 IEEE 10th Electronics System-Integration Technology Conference (ESTC)

Assessment of the Charge Perturbation Effect of the Terahertz Pulse: Towards to the Space Charge Ellipsometry Detection

Authors: Gao, Haoyu, Qi, Tianrun, Ren, Hanwen, Li, Qingmin, Xiao, Tao, Ma, Yiqun, Ma, Yidan

Source: 2024 3rd International Conference on Power Systems and Electrical Technology (PSET) Power Systems and Electrical Technology (PSET), 2024 3rd International Conference on. :494-498 Aug, 2024

Relation: 2024 3rd International Conference on Power Systems and Electrical Technology (PSET)

Determination of carcinoembryonic antigen (CEA) by surface plasmon resonance-enhanced total internal reflection ellipsometry (SPRe-TIRE).

Authors: Erkal-Aytemur, Aslı¹ (AUTHOR), Şahin, Samet² (AUTHOR), Üstündağ, Zafer³ (AUTHOR), Mülazımoğlu, İbrahim Ender⁴ (AUTHOR) mulazimoglu@gmail.com, Caglayan, Mustafa Oguzhan² (AUTHOR) mocaglayan@gmail.com

Source: Instrumentation Science & Technology. 2024, Vol. 52 Issue 2, p203-219. 17p.

Subject Terms: *CARCINOEMBRYONIC antigen, *ELLIPSOMETRY, *SURFACE plasmon resonance, *X-ray photoelectron spectroscopy, *CYCLIC voltammetry, *GOLD nanoparticles

Regime Map of the Effective Medium Approximation Modelling of Micro-Rough Surfaces in Ellipsometry.

Authors: Huang, Meijiao¹ (AUTHOR) huangmeijiao@ciomp.ac.cn, Guo, Liang¹ (AUTHOR), Jiang, Fengyi¹ (AUTHOR) jiangfengyi@ciomp.ac.cn

Source: Sensors (14248220). Feb2024, Vol. 24 Issue 4, p1242. 12p.

Subject Terms: *FINITE difference time domain method, *ELLIPSOMETRY, *SOLID surfacing materials, *ROOT-mean-squares, *OPTICAL constants, *ROUGH surfaces

Temperature Coefficient of Electronic Polarizability in Thin Polymer Films Deposited on Si and SiO 2 Substrates Determined via Spectroscopic Ellipsometry.

Authors: Bednarski, Henryk¹, hbednarski@cmpw-pan.plpkumari@cmpw-pan.pl, Hajduk, Barbara¹, hbednarski@cmpw-pan.pl, Jarka, Paweł², pawel.jarka@polsl.pl, Kumari, Pallavi¹

Source: Coatings (2079-6412); Feb2024, Vol. 14 Issue 2, p166, 17p

Atomic Layer Deposition for Tailoring Tamm Plasmon-Polariton with Ultra-High Accuracy.

Authors: Drazdys, Mantas¹, mantas.drazdys@ftmc.lt, Bužavaitė-Vertelienė, Ernesta¹, ernesta.verteliene@ftmc.lt, Astrauskytė, Darija¹, darija.astrauskyte@ftmc.lt, Balevičius, Zigmas^1,2, zigmas.balevicius@ftmc.lt

Source: Coatings (2079-6412); Jan2024, Vol. 14 Issue 1, p33, 9p

Mid-Infrared (MIR) Complex Refractive Index Spectra of Polycrystalline Copper-Nitride Films by IR-VASE Ellipsometry and Their FIB-SEM Porosity.

Authors: Márquez, Emilio¹, eduardo.blanco@uca.esemilio.marquez@uca.es, Blanco, Eduardo¹, jose.manuel@uca.es, Mánuel, José M.¹, marcos.garciagu@alum.uca.es, Ballester, Manuel², manuelballestermatito2021@u.northwestern.edu, García-Gurrea, Marcos¹, Rodríguez-Tapiador, María I.³, mariaisabel.rodriguez@ciemat.es, Fernández, Susana M.³, susanamaria.fernandez@ciemat.es, Willomitzer, Florian⁴, fwillomitzer@arizona.edu, Katsaggelos, Aggelos K.⁵, a-katsaggelos@northwestern.edu

Source: Coatings (2079-6412); Jan2024, Vol. 14 Issue 1, p5, 11p