Alpha Emission Rate Characterization and Risk Evaluation of Substrate Materials Used in Memory Packages

Authors: Huang, Chen Yu, Chen, Chi Yung, Gan, Chong Leong, Tennamt, Tracy

Source: 2024 IEEE 40th International Electronics Manufacturing Technology (IEMT) Electronics Manufacturing Technology (IEMT),2024 IEEE 40th International. :1-5 Oct, 2024

Relation: 2024 IEEE 40th International Electronics Manufacturing Technology (IEMT)

Investigation of Radiation Effects on Multichannel Nanosheet-FETs, Forksheet-FETs, and Complementary-FETs

Authors: Choi, G., Kim, S., Jeon, J.

Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(12):7263-7269 Dec, 2024

Characterization of Single Event Functional Interrupts in COTS and Rad-Hard ARM Microcontrollers

Authors: Esquer, Stefania, Mee, Jesse K., Quinn, Heather M., Sierawski, Brian D., Schrimpf, Ronald D.

Source: 2024 IEEE Space Computing Conference (SCC) SCC Space Computing Conference (SCC), 2024 IEEE. :28-39 Jul, 2024

Relation: 2024 IEEE Space Computing Conference (SCC)

Contribution of Secondary Alpha Particles to Soft Error Rates in Space Systems

Authors: Cadena, R.M., Warren, K.M., Dodds, N.A., Trippe, J.M., Sierawski, B.D., Ball, D.R., Reed, R.A., Schrimpf, R.D.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(4):535-541 Apr, 2024

Single-Event Performance of Flip Flop Designs at the 5-nm Bulk FinFET Node at Near-Threshold Supply Voltages

Authors: Kronenberg, J., Xiong, Y., Pieper, N., Ball, D., Bhuva, B.

Source: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-5 Apr, 2024

Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

Evaluation of Radiation Tolerance of Neutron-Sensitive Semiconductor Lithium Indium Phosphor Selenide

Authors: Hoegberg, E. K., Qian, E., Benkechkache, A., Lukosi, E. D., Kanatzidis, M., Stracuzzi, L. Stand

Source: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD) Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), 2024 IEEE. :1-2 Oct, 2024

Relation: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)

Development of a Neutron-Based Method for Onsite Fuel Inspection

Authors: Sudac, D., Obhodas, J., Valkovic, V., Nad, K., Orlic, Z., Korolija, M., Kolar, M., Lucic, M., Cubric, J., Jedvaj, K.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(5):1109-1115 May, 2024

Single-Event Upset Cross Section at High Frequencies for RHBD Flip-Flop Designs at the 5-nm Bulk FinFET Node

Authors: Xiong, Y., Pieper, N.J., Qian, Y., Wodzro, S.E., Narasimham, B., Fung, R., Wen, S., Bhuva, B.L.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(4):839-844 Apr, 2024

Single-Event Burnout in Vertical β-Ga₂O₃ Diodes With Pt/PtOₓ Schottky Contacts and High-k Field-Plate Dielectrics

Authors: Islam, S., Senarath, A.S., Farzana, E., Ball, D.R., Sengupta, A., Hendricks, N.S., Bhattacharyya, A., Reed, R.A., Zhang, E.X., Speck, J.S., Fleetwood, D.M., Schrimpf, R.D.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(4):515-521 Apr, 2024

Alpha Particle-Induced Persistent Effects in a COTS 3-D-Integrated CMOS Imager

Authors: Hu, M.D., McCurdy, M.W., Sierawski, B.D., Schrimpf, R.D., Reed, R.A., Alles, M.L.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(4):759-769 Apr, 2024

Dead-Layer-Free Semiconductor Detectors via Highly Charged Dielectrics

Authors: Setala, O., Pasanen, T., Ott, J., Heinonen, J., Vahanissi, V., Savin, H.

Source: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD) Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), 2024 IEEE. :1-1 Oct, 2024

Relation: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)

Measurement of mixed samples of alpha and beta (gamma) nuclides using a high spatial resolution alpha-particle imager with Quantitative CMOS camera

Authors: Fujisawa, M., Morishita, Y., Sagawa, N., Kurosawa, S., Sasano, M., Masateru, H.

Source: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD) Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), 2024 IEEE. :1-1 Oct, 2024

Relation: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)

2D Hybrid Perovskites for Alpha Particle Spectroscopy: from Single Crystals to Thin Films

Authors: Margotti, L., Ciavatti, A., Ghosh, J., Sellin, P., Fraboni, B.

Source: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD) Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), 2024 IEEE. :1-1 Oct, 2024

Relation: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)

Development of a Fast Detector for Associated Particle Imaging

Authors: Giacomini, G., Carini, G., Chen, W., Dellapenna, A., Deptuch, G., Durando, S., Fabris, L., Fried, J., Kierstead, J., Kotov, I., Gorni, D., Guidolini-Cecato, R., Mcconchie, S., Mandal, S., Muller, E.

Source: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD) Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), 2024 IEEE. :1-1 Oct, 2024

Relation: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)

Leveraging Algorithm-based Fault Tolerance for Propagation Error Detection in NPUs

Authors: Kim, Sihyung, Hong, Seokin

Source: 2024 21st International SoC Design Conference (ISOCC) SoC Design Conference (ISOCC), 2024 21st International. :157-158 Aug, 2024

Relation: 2024 21st International SoC Design Conference (ISOCC)

Mitigation of Single Event Upset Effects in Nanosheet FET 6T SRAM Cell

Authors: Bang, M., Ha, J., Suh, M., Lee, D., Ryu, M., Han, J., Sagong, H., Lee, H., Kim, J.

Source: IEEE Access Access, IEEE. 12:130347-130355 2024

Soft Errors Rate Assessment in SRAM and Sequential Circuits manufactured in ST 40 nm BCD Technology

Authors: Benfante, A., Crippa, D., Jain, A., Veggetti, A.M., Bagatin, M., Gerardin, S.

Source: 2023 23rd European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2023 23rd European Conference on. :1-5 Sep, 2023

Relation: 2023 23rd European Conference on Radiation and Its Effects on Components and Systems (RADECS)

L2-Charged Particle Environment (L2-CPE) Low Energy Radiation Fluence Model

Authors: Minow, Joseph I., Diekmann, Anne M., Willis, Emily M., Coffey, Victoria N.

Source: 2023 23rd European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2023 23rd European Conference on. :1-6 Sep, 2023

Relation: 2023 23rd European Conference on Radiation and Its Effects on Components and Systems (RADECS)

Low-Temperature Annealing of Electron, Neutron, and Proton Irradiation Effects on SiC Radiation Detectors

Authors: Rafi, J.M., Pellegrini, G., Godignon, P., Rius, G., Dauderys, V., Tsunoda, I., Yoneoka, M., Takakura, K., Kramberger, G., Moll, M.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 70(10):2285-2296 Oct, 2023

Center-of-Mass Corrections in Associated Particle Imaging

Authors: Egan, C., Amsellem, A., Klyde, D., Ludewigt, B., Persaud, A.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 70(10):2322-2328 Oct, 2023