Showing 1 - 20 results of 38 Refine Results
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    Conference

    Source: Design, Automation and Test in Europe Design, Automation and Test in Europe, 2005. Proceedings. :1108-1113 Vol. 2 2005

    Relation: Proceedings. Design, Automation and Test in Europe

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    Academic Journal

    Source: IEEE Transactions on Automation Science and Engineering IEEE Trans. Automat. Sci. Eng. Automation Science and Engineering, IEEE Transactions on. 1(1):26-37 Jul, 2004

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    Conference

    Source: 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) VLSI Design, 2007. Held jointly with 6th International Conference on Embedded Systems., 20th International Conference on. :37-42 Jan, 2007

    Relation: 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems

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    Conference

    Authors: Zhaohui Fu, Malik, S.

    Source: 2006 IEEE/ACM International Conference on Computer Aided Design Computer-Aided Design, 2006. ICCAD '06. IEEE/ACM International Conference on. :852-859 Nov, 2006

    Relation: 2006 IEEE/ACM International Conference on Computer Aided Design

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    Conference

    Source: 36th Annual Hawaii International Conference on System Sciences, 2003. Proceedings of the Systems sciences System Sciences, 2003. Proceedings of the 36th Annual Hawaii International Conference on. :10 pp. 2003

    Relation: 36th Hawaii International Conference on Systems Sciences

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    Academic Journal

    Authors: XINYU CHENG1 xycheng@fudan.edu.cn, ZHAOHUI FU2 fuzh@math.ubc.ca, WETTON, BRIAN2 wetton@math.ubc.ca

    Source: SIAM Journal on Applied Mathematics. 2023, Vol. 83 Issue 1, p52-78. 27p.

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    Academic Journal

    Source: Formal Methods in System Design; Jun2008, Vol. 32 Issue 3, p285-301, 17p

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    Academic Journal
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    Academic Journal

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    Academic Journal

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