First Demonstration of an N-P Oxide Semiconductor Complementary Gain Cell Memory

Authors: Athena, F. F., Ambrosi, E., Jana, K., Wu, C. H., Hartanto, J., Lee, Y. M., Kuo, C. C., Liu, S., Saini, B., Wang, C. C., Hsu, C. F., Zeevi, G., Wang, X., Kang, J., Pop, E., Lee, T. Y., McIntyre, P. C., Wong, H.-S. P., Bao, X. Y.

Source: 2024 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2024 IEEE International. :1-4 Dec, 2024

Relation: 2024 IEEE International Electron Devices Meeting (IEDM)

ISO-Performance N-Type and P-Type MOSFETs on Densely Aligned CNT Array Enabled by Self-Aligned Extension Doping with Barrier Booster

Authors: Li, Shengman, Zhong, Donglai, Gilardi, Carlo, Safron, Nathaniel, Chao, Tzu-Ang, Zeevi, Gilad, Van Rijs, Samantha, Bechdolt, Andrew Denis, Passlack, Matthias, Pitner, Gregory, Radu, Iuliana, Wong, H.-S. Philip, Mitra, Subhasish

Source: 2024 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2024 IEEE International. :1-4 Dec, 2024

Relation: 2024 IEEE International Electron Devices Meeting (IEDM)

Statistics Based Modeling and Analysis of Ultra-Low Impedance Carbon Nanotube MOS Capacitors

Authors: Passlack, Matthias, Safron, Nathaniel, Oberoi, Aaryan, Gilardi, Carlo, Zuo, Jack, Su, Sheng-Kai, Chao, Tzu-Ang, Azizi, Amin, Natani, Shreyam, Zeevi, Gilad, Bandaru, Prabhakar, Kummel, Andrew, Wong, H.-S. Philip, Pitner, Gregory, Radu, Iuliana

Source: 2024 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2024 IEEE International. :1-4 Dec, 2024

Relation: 2024 IEEE International Electron Devices Meeting (IEDM)

Linear Bandits with Partially Observable Features

Authors: Kim, Wonyoung, Park, Sungwoo, Iyengar, Garud, Zeevi, Assaf, Oh, Min-hwan

Subject Terms: Statistics - Machine Learning, Computer Science - Machine Learning

Access URL: http://arxiv.org/abs/2502.06142

Enhancing Uncertainty Estimation in Semantic Segmentation via Monte-Carlo Frequency Dropout

Authors: Zeevi, Tal, Staib, Lawrence H., Onofrey, John A.

Subject Terms: Computer Science - Computer Vision and Pattern Recognition, Computer Science - Machine Learning, Electrical Engineering and Systems Science - Image and Video Processing, Statistics - Machine Learning

Access URL: http://arxiv.org/abs/2501.11258

SRE-Conv: Symmetric Rotation Equivariant Convolution for Biomedical Image Classification

Authors: Du, Yuexi, Zhang, Jiazhen, Zeevi, Tal, Dvornek, Nicha C., Onofrey, John A.

Subject Terms: Computer Science - Computer Vision and Pattern Recognition, Computer Science - Machine Learning, Electrical Engineering and Systems Science - Image and Video Processing

Access URL: http://arxiv.org/abs/2501.09753

Rate-In: Information-Driven Adaptive Dropout Rates for Improved Inference-Time Uncertainty Estimation

Authors: Zeevi, Tal, Shwartz-Ziv, Ravid, LeCun, Yann, Staib, Lawrence H., Onofrey, John A.

Subject Terms: Computer Science - Machine Learning, Computer Science - Computer Vision and Pattern Recognition, Statistics - Machine Learning

Access URL: http://arxiv.org/abs/2412.07169

Monte-Carlo Frequency Dropout for Predictive Uncertainty Estimation in Deep Learning

Authors: Zeevi, Tal, Venkataraman, Rajesh, Staib, Lawrence H., Onofrey, John A.

Source: 2024 IEEE International Symposium on Biomedical Imaging (ISBI) Biomedical Imaging (ISBI), 2024 IEEE International Symposium on. :1-5 May, 2024

Relation: 2024 IEEE International Symposium on Biomedical Imaging (ISBI)

High-performance and low parasitic capacitance CNT MOSFET: 1.2 mA/μm at VDS of 0.75 V by self-aligned doping in sub-20 nm spacer

Authors: Li, Shengman, Chao, Tzu-Ang, Gilardi, Carlo, Safron, Nathaniel, Su, Sheng-Kai, Zeevi, Gilad, Bechdolt, Andrew Denis, Passlack, Matthias, Oberoi, Aaryan, Lin, Qing, Zhang, Ziehen, Wang, Kesong, Kashyap, Harshil, Liew, San-Lin, Hou, Vincent D.-H, Kummel, Andrew, Radu, Luliana, Pitner, Gregory, Wong, H.-S. Philip, Mitra, Subhasish

Source: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023

Relation: 2023 International Electron Devices Meeting (IEDM)

Barrier Booster for Remote Extension Doping and its DTCO for 1D & 2D FETs

Authors: Gilardi, Carlo, Zeevi, Gilad, Choi, Suhyeong, Su, Sheng-Kai, Hung, Terry Y.T., Li, Shengman, Safron, Nate, Lin, Qing, Srimani, Tathagata, Passlack, Matthias, Pitner, Gregory, Chen, Edward, Radu, Iuliana, Wong, H.-S. Philip, Mitra, Subhasish

Source: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023

Relation: 2023 International Electron Devices Meeting (IEDM)

Optimal single threshold stopping rules and sharp prophet inequalities

Authors: Goldenshluger, Alexander, Malinovsky, Yaakov, Zeevi, Assaf

Subject Terms: Mathematics - Probability, Computer Science - Computer Science and Game Theory, Mathematics - Optimization and Control, Mathematics - Statistics Theory, 60G40, 62L12, 91A05

Access URL: http://arxiv.org/abs/2404.12949

LungNet: a deep learning model for diagnosis of respiratory pathologies from lung sounds

Authors: Levy, Jeremy, Raz-Pasteur, Ayelet, Ovics, Paz, Arraf, Tarek, Dotan, Yaniv, Zeevi, Yehoshua Y.

Source: 2023 5th International Conference on Bio-engineering for Smart Technologies (BioSMART) Bio-engineering for Smart Technologies (BioSMART), 2023 5th International Conference on. :1-4 Jun, 2023

Relation: 2023 5th International Conference on Bio-engineering for Smart Technologies (BioSMART)

Learning Approximation Sets for Exploratory Queries

Authors: Davidson, Susan B., Milo, Tova, Razmadze, Kathy, Zeevi, Gal

Subject Terms: Computer Science - Databases

Access URL: http://arxiv.org/abs/2401.17059

Exact Optimal Fixed Width Confidence Interval Estimation for the Mean

Authors: Deep, Vikas, Bassamboo, Achal, Juneja, Sandeep, Zeevi, Assaf

Source: 2022 Winter Simulation Conference (WSC) Winter Simulation Conference (WSC), 2022. :713-723 Dec, 2022

Relation: 2022 Winter Simulation Conference (WSC)

A Doubly Robust Approach to Sparse Reinforcement Learning

Authors: Kim, Wonyoung, Iyengar, Garud, Zeevi, Assaf

Subject Terms: Statistics - Machine Learning, Computer Science - Machine Learning

Access URL: http://arxiv.org/abs/2310.15286

Bayesian Design Principles for Frequentist Sequential Learning

Authors: Xu, Yunbei, Zeevi, Assaf

Subject Terms: Computer Science - Machine Learning, Mathematics - Optimization and Control, Mathematics - Statistics Theory

Access URL: http://arxiv.org/abs/2310.00806

Bandits with Dynamic Arm-acquisition Costs

Authors: Kalvit, Anand, Zeevi, Assaf

Source: 2022 58th Annual Allerton Conference on Communication, Control, and Computing (Allerton) Communication, Control, and Computing (Allerton), 2022 58th Annual Allerton Conference on. :1-7 Sep, 2022

Relation: 2022 58th Annual Allerton Conference on Communication, Control, and Computing (Allerton)

MNL-Prophet: Sequential Assortment Selection under Uncertainty

Authors: Goyal, Vineet, Humair, Salal, Papadigenopoulos, Orestis, Zeevi, Assaf

Subject Terms: Computer Science - Data Structures and Algorithms, Computer Science - Computer Science and Game Theory

Access URL: http://arxiv.org/abs/2308.05207

Last Switch Dependent Bandits with Monotone Payoff Functions

Authors: Foussoul, Ayoub, Goyal, Vineet, Papadigenopoulos, Orestis, Zeevi, Assaf

Subject Terms: Computer Science - Machine Learning, Computer Science - Data Structures and Algorithms

Access URL: http://arxiv.org/abs/2306.00338

Learning the Pareto Front Using Bootstrapped Observation Samples

Authors: Kim, Wonyoung, Iyengar, Garud, Zeevi, Assaf

Subject Terms: Statistics - Machine Learning, Computer Science - Machine Learning

Access URL: http://arxiv.org/abs/2306.00096