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1Conference
Authors: Chiang, H. L., Chen, T. C., Wang, J. F., Mukhopadhyay, S., Lee, W. K., Chen, C. L., Khwa, W. S., Pulicherla, B., Liao, P. J., Su, K. W., Yu, K. F., Wang, T., Wong, H. S. P., Diaz, C. H., Cai, J.
Source: 2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020
Relation: 2020 IEEE Symposium on VLSI Technology
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2Conference
Authors: Yeap, Geoffrey, Lin, S. S., Chen, Y. M., Shang, H. L., Wang, P. W., Lin, H. C., Peng, Y. C., Sheu, J. Y., Wang, M., Chen, X., Yang, B. R., Lin, C. P., Yang, F. C., Leung, Y. K., Lin, D. W., Chen, C. P., Yu, K. F., Chen, D. H., Chang, C. Y., Chen, H. K., Hung, P., Hou, C. S., Cheng, Y. K., Chang, J., Yuan, L., Lin, C. K., Chen, C. C., Yeo, Y. C., Tsai, M. H., Lin, H. T., Chui, C. O., Huang, K. B., Chang, W., Lin, H. J., Chen, K. W., Chen, R., Sun, S. H., Fu, Q., Yang, H. T., Chiang, H. T., Yeh, C. C., Lee, T. L., Wang, C. H., Shue, S. L., Wu, C. W., Lu, R., Lin, W. R., Wu, J., Lai, F., Wu, Y. H., Tien, B. Z., Huang, Y. C., Lu, L. C., He, Jun, Ku, Y., Lin, J., Cao, M., Chang, T. S., Jang, S. M.
Source: 2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :36.7.1-36.7.4 Dec, 2019
Relation: 2019 IEEE International Electron Devices Meeting (IEDM)
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3Periodical
Authors: Yu, K. F., Wen, W., Liu, P., Gao, X., Lo, E. C. M., Wong, M. C. M.
Source: Journal of dental research. 101(3):286-294
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4Academic Journal
Authors: Chiu, J. P., Chung, Y. T., Wang, T., Chen, M.-C., Lu, C. Y., Yu, K. F.
Source: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 33(2):176-178 Feb, 2012
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5Periodical
Authors: Yu, K. f., Lehmkuhl, F., Falk, D.
Source: JOURNAL OF MOUNTAIN SCIENCE -ENGLISH EDITION-. 14(1):77-93
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6Conference
Authors: Yu, K.-F., Zeng, K.-H.
Source: LECTURE NOTES IN COMPUTER SCIENCE. (7390):51-58
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7Conference
Authors: Levine, R. J., Qian, C., Maynard, S. E., Yu, K. F., Epstein, F. H., Karumanchi, S. A.
Source: AMERICAN JOURNAL OF OBSTETRICS AND GYNECOLOGY. 194(NO 4):1034-1041
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8Conference
Authors: Yu, K. F., Zhao, J. X., Wei, G. J., Cheng, X. R., Wang, P. X.
Source: GLOBAL AND PLANETARY CHANGE. 47(2/4):301-316
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9Periodical
Authors: Li, S. Q., Ma, S. Q., Yu, K. F., Zhu, W. Y.
Source: Shi jie hua ren xiao hua za zhi. 24(12):1846-1852
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10Periodical
Authors: Liu, Y. D., Yu, K. F., Zhu, W. Y.
Source: Shi jie hua ren xiao hua za zhi. 24(5):706-713
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11Periodical
Authors: Li, C. M., Yu, K. F., Kao, S. H., Hwang, T.
Source: QUANTUM INFORMATION PROCESSING. 15(7):2881-2893
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12Conference
Authors: Lee, J.-H., Weng, W.-T., Yu, K.-F., Ong, T.-C.
Source: PROCEEDINGS OF THE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS. CONF 11:85-88
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13Conference
Authors: Shen, C. D., Yi, W. X., Yu, K. F., Sun, Y. M., Yang, Y., Zhou, B.
Source: RADIOCARBON. 46(NO 2):595-602
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14Conference
Authors: Yu, K. F., Lau, K. S., Chan, C. K.
Source: JOURNAL OF COMPUTATIONAL AND APPLIED MATHEMATICS. 163(NO 1):319-331
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15Conference
Authors: Liu, A., Schisterman, E. F., Yu, K. F.
Source: ASA PROCEEDINGS -CD-ROM EDITION-. :2479-2496
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16Conference
Source: AMERICAN JOURNAL OF OBSTETRICS AND GYNECOLOGY. 189(NOS 4):939-943
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17Conference
Authors: Chen, M. J., Shih, J. R., Yu, K. F., Hsieh, C. C., Sung, W. L., Lin, F. S., Chu, L. H., Shiue, R. Y., Peng, Y. K., Yue, J. T.
Source: INTERNATIONAL SYMPOSIUM ON PLASMA PROCESS-INDUCED DAMAGE. :12-15
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18Conference
Authors: Wu, C. O., Yu, K. F., Yuan, V. W.
Source: COMMUNICATIONS IN STATISTICS THEORY AND METHODS. 29(NO 5-6):1017-1038
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19Periodical
Source: OCEANOLOGIA ET LIMNOLOGIA SINICA. 45(1):51-58
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20Periodical
Authors: Yu, K. F., Yang, C. W., Liao, C. H., Hwang, T.
Source: QUANTUM INFORMATION PROCESSING. 13(6):1457-1465