First Demonstration of HZO/beta-Ga2O3 Ferroelectric FinFET with Improved Memory Window

Authors: Park, Seohyeon, Yoo, Jaewook, Song, Hyeojun, Lee, Hongseung, Lim, Seongbin, Kim, Soyeon, Park, Minah, Kim, Bongjoong, Heo, Keun, Ye, Peide D., Bae, Hagyoul

Subject Terms: Physics - Applied Physics, Condensed Matter - Materials Science

Access URL: http://arxiv.org/abs/2407.18187

SeeThroughNet: Resurrection of Auxiliary Loss by Preserving Class Probability Information

Authors: Han, Dasol, Yoo, Jaewook, Oh, Dokwan

Source: 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) CVPR Computer Vision and Pattern Recognition (CVPR), 2022 IEEE/CVF Conference on. :4453-4462 Jun, 2022

Relation: 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)

Speeding Up Affordance Learning for Tool Use, Using Proprioceptive and Kinesthetic Inputs

Authors: Nguyen, Khuong N., Yoo, Jaewook, Choe, Yoonsuck

Source: 2019 International Joint Conference on Neural Networks (IJCNN) Neural Networks (IJCNN), 2019 International Joint Conference on. :1-8 Jul, 2019

Relation: 2019 International Joint Conference on Neural Networks (IJCNN)

Tracing and analysis of the whole mouse brain vasculature with systematic cleaning to remove and consolidate erroneous images

Authors: Lee, Junseok, Yoo, Jaewook, Choe, Yoonsuck

Source: 2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC) IEEE Engineering in Medicine and Biology Society (EMBC), 2018 40th Annual International Conference of the. :143-146 Jul, 2018

Relation: 2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC)

Low-frequency noise characterization of positive bias stress effect on the spatial distribution of trap in β-Ga2O3 FinFET

Authors: Bae, Hagyoul, Lee, Geon Bum, Yoo, Jaewook, Lee, Khwang-Sun, Ku, Ja-Yun, Kim, Kihyun, Kim, Jungsik, Ye, Peide D., Park, Jun-Young, Choi, Yang-Kyu

Source: In Solid State Electronics May 2024 215

Fast submicrometer-scale imaging of whole zebrafish using the knife-edge scanning microscope

Authors: Miller, Daniel E., Shah, Raj S., Zhang, Wencong, Yoo, Jaewook, Kwon, Jaerock, Mayerich, David, Keyser, John, Abbott, Louise C., Choe, Yoonsuck

Source: 2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC) Engineering in Medicine and Biology Society (EMBC), 2016 IEEE 38th Annual International Conference of the. :5901-5904 Aug, 2016

Relation: 2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC)

Dynamical analysis of recurrent neural circuits in articulated limb controllers for tool use

Authors: Wang, Han, Li, Qinbo, Yoo, Jaewook, Choe, Yoonsuck

Source: 2016 International Joint Conference on Neural Networks (IJCNN) Neural Networks (IJCNN), 2016 International Joint Conference on. :4339-4345 Jul, 2016

Relation: 2016 International Joint Conference on Neural Networks (IJCNN)

Emergence of tool use in an articulated limb controlled by evolved neural circuits

Authors: Li, Qinbo, Yoo, Jaewook, Choe, Yoonsuck

Source: 2015 International Joint Conference on Neural Networks (IJCNN) Neural Networks (IJCNN), 2015 International Joint Conference on. :1-8 Jul, 2015

Relation: 2015 International Joint Conference on Neural Networks (IJCNN)

Real-time detection of imaging errors in the Knife-Edge Scanning Microscope through change detection

Authors: Zhang, Wencong, Yoo, Jaewook, Keyser, John, Abbott, Louise C., Choe, Yoonsuck

Source: 2015 IEEE 12th International Symposium on Biomedical Imaging (ISBI) Biomedical Imaging (ISBI), 2015 IEEE 12th International Symposium on. :177-181 Apr, 2015

Relation: 2015 IEEE 12th International Symposium on Biomedical Imaging (ISBI 2015)

The Impact of Technological Innovation and Strategic CSR on Firm Value: Implication for Social Open Innovation

Authors: Choi, Soohwan, Yoo, Jaewook ^*

Source: In Journal of Open Innovation: Technology, Market, and Complexity December 2022 8(4)

Low-frequency noise and DC I–V characterization of gamma-ray irradiation-induced degradation and trap behaviors in a-IGZO TFTs.

Authors: Lee, Hongseung¹ (AUTHOR), Yoo, Jaewook¹ (AUTHOR), Song, Hyeonjun¹ (AUTHOR), Lee, Binhyeong² (AUTHOR), Yoon, Soon Joo² (AUTHOR), Lim, Seongbin¹ (AUTHOR), Jeong, Jo Hak³ (AUTHOR), Kim, Soyeon¹ (AUTHOR), Park, Minah¹ (AUTHOR), Park, Seohyeon¹ (AUTHOR), Jung, Sojin¹ (AUTHOR), Pandit, Bhishma³ (AUTHOR), Moon, Taehwan⁴ (AUTHOR), Hwang, Jin-Ha⁵ (AUTHOR), Lee, Kiyoung⁵ (AUTHOR), Lee, Yoon Kyeung² (AUTHOR), Heo, Keun³ (AUTHOR) kheo@jbnu.ac.kr, Bae, Hagyoul¹ (AUTHOR) hagyoul.bae@jbnu.ac.kr

Source: Applied Physics Letters. 2/10/2025, Vol. 126 Issue 6, p1-5. 5p.

Subject Terms: *X-ray photoelectron spectroscopy, *ACCELERATED life testing, *MARKETING channels, *RADIATION, *TRANSISTORS

Low-Frequency Noise Related to the Scattering Effect in p‑Type Copper(I) Oxide Thin-Film Transistors.

Authors: Yoo, Jaewook, Park, Seohyeon, Lee, Hongseung, Lim, Seongbin, Song, Hyeonjun, Park, Minah, Kim, Soyeon, Jeong, Jo Hak, Bong, JungWoo, Heo, Keun, Lee, Kiyoung, Kim, TaeWan, Ye, Peide D., Bae, Hagyoul

Source: ACS Applied Materials & Interfaces; 1/15/2024, Vol. 17 Issue 2, p3538-3547, 10p

Rapid Thermal Annealing under O2 Ambient to Recover the Deterioration by Gamma-Ray Irradiation in a-IGZO TFTs.

Authors: Park, Minah, Yoo, Jaewook, Lee, Hongseung, Song, Hyeonjun, Kim, Soyeon, Lim, Seongbin, Park, Seohyeon, Jeong, Jo Hak, Kim, Bongjoong, Lee, Kiyoung, Lee, Yoon Kyeung, Heo, Keun, Kwon, Jiseok, Bae, Hagyoul

Source: Electronic Materials Letters; Jan2025, Vol. 21 Issue 1, p111-118, 8p

Quantitative Analysis of Trap Behaviors for Deuterium Annealing Effect on IGZO TFTs by TCAD and Experimental Characterization

Authors: Song, Hyeonjun, Yoon, Soon Joo, Yoo, Jaewook, Lim, Seongbin, Ku, Ja-Yun, Kil, Tae-Hyun, Lee, Hongseung, Jeong, Jo Hak, Kim, Soyeon, Lee, Moon-Kwon, Jang, Hyeon-Sik, Lee, Kiyoung, Heo, Keun, Park, Jun-Young, Lee, Yoon Kyeung, Bae, Hagyoul

Source: IEEE Transactions on Electron Devices; 2025, Vol. 72 Issue: 3 p1180-1183, 4p

Rapid Thermal Annealing under O2Ambient to Recover the Deterioration by Gamma-Ray Irradiation in a-IGZO TFTs

Authors: Park, Minah, Yoo, Jaewook, Lee, Hongseung, Song, Hyeonjun, Kim, Soyeon, Lim, Seongbin, Park, Seohyeon, Jeong, Jo Hak, Kim, Bongjoong, Lee, Kiyoung, Lee, Yoon Kyeung, Heo, Keun, Kwon, Jiseok, Bae, Hagyoul

Source: Electronic Materials Letters; January 2025, Vol. 21 Issue: 1 p111-118, 8p

Intangible Resources and Internationalization for the Innovation Performance of Chinese High-Tech Firms

Authors: Liu, Yuhan, Kim, Junic, Yoo, Jaewook ^*

Source: In Journal of Open Innovation: Technology, Market, and Complexity September 2019 5(3)

The Effects of Entrepreneurial Orientation and Environmental Uncertainty on Korean Technology Firms’ R&D Investment

Authors: Yoo, Jaewook, Kim, Junic ^*

Source: In Journal of Open Innovation: Technology, Market, and Complexity June 2019 5(2)

A Junction Temperature Reduction Technique for a Microprocessor Considering Temperature Coupled Leakage Power

Authors: Yoo, Jaewook, Choi, Kiwon, Kang, Sayoon

Source: Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium Semiconductor Thermal Measurement and Management Symposium, 2007. SEMI-THERM 2007. Twenty Third Annual IEEE. :74-78 Mar, 2007

Relation: Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Direct Observation for Distinct Behaviors of Gamma‐Ray Irradiation‐Induced Subgap Density‐of‐States in Amorphous InGaZnO TFTs by Multiple‐Wavelength Light Source.

Authors: Yoo, Jaewook¹, Jo, Hyeun Seung², Jeon, Seung‐Bae³, Moon, Taehwan⁴, Lee, Hongseung¹, Lim, Seongbin¹, Song, Hyeonjun¹, Lee, Binhyeong⁵, Yoon, Soon Joo⁵, Kim, Soyeon¹, Park, Minah¹, Park, Seohyeon¹, Jeong, Jo Hak⁶, Heo, Keun⁶, Lee, Yoon Kyeung⁵, Ye, Peide D.⁷, Kim, TaeWan⁸, twkim@uos.ac.kr, Bae, Hagyoul¹, hagyoul.bae@jbnu.ac.kr

Source: Advanced Electronic Materials; Aug2024, Vol. 10 Issue 8, p1-10, 10p

Immersive panorama TV service system

Authors: Seo, Dongmahn, Kim, Suhyun, Yoo, JaeWook, Park, Hogun, Ko, Heedong

Source: 2012 IEEE International Conference on Consumer Electronics (ICCE) Consumer Electronics (ICCE), 2012 IEEE International Conference on. :201-202 Jan, 2012

Relation: 2012 IEEE International Conference on Consumer Electronics (ICCE)