Showing 1 - 20 results of 55 Refine Results
  1. 1
  2. 2
    Conference

    Source: 2012 IEEE International Solid-State Circuits Conference Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2012 IEEE International. :434-436 Feb, 2012

    Relation: 2012 IEEE International Solid- State Circuits Conference - (ISSCC)

  3. 3
  4. 4
    Conference

    Source: 2010 IEEE International Solid-State Circuits Conference - (ISSCC) Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2010 IEEE International. :266-267 Feb, 2010

    Relation: 2010 IEEE International Solid- State Circuits Conference - (ISSCC)

  5. 5
    Conference

    Source: 2009 IEEE International Workshop on Memory Technology, Design, and Testing Memory Technology, Design, and Testing, 2009. MTDT '09. IEEE International Workshop on. :20-24 Aug, 2009

    Relation: 2009 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT)

  6. 6
  7. 7
  8. 8
  9. 9
  10. 10
  11. 11
  12. 12
  13. 13
  14. 14
    Academic Journal
  15. 15
  16. 16
  17. 17
    Academic Journal

    Authors: Yang, Shu-Meng1 (AUTHOR) n56074287@gs.ncku.edu.tw, Yen, Hsi-Kai1 (AUTHOR) n56091302@gs.ncku.edu.tw, Lu, Kuo-Chang1,2 (AUTHOR) gkclu@mail.ncku.edu.tw

    Source: Nanomaterials (2079-4991). Mar2022, Vol. 12 Issue 6, p897. 12p.

  18. 18
  19. 19
    Academic Journal

    Authors: Kao, Yuan-Tse1 jinnii10377@yahoo.com.tw, Yang, Shu-Meng1 young263263@gmail.com, Lu, Kuo-Chang1,2 gkclu@mail.ncku.edu.tw

    Source: Materials (1996-1944). 4/1/2019, Vol. 12 Issue 7, p1106-1106. 1p.

    HTML Full Text     PDF Full Text
  20. 20
    Academic Journal