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1Academic Journal
Authors: Zhao, J.R., Hung, F.Y., Wu, S.C.
Source: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 35(4):698-705 Nov, 2022
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2Academic Journal
Source: Computing in Science & Engineering Comput. Sci. Eng. Computing in Science & Engineering. 21(3):4-5 Jun, 2019
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3Academic Journal
Authors: Xu, Y.X., Yang, B., Wu, S.C., Shi, Y., Bao, X.W., Liu, Y., Zhang, Y., Yang, Y.J., Wang, Q.Y., Xia, Q.K.
Source: In Ore Geology Reviews December 2021 139 Part B
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4Conference
Authors: Tu, C.Y., Zeng, Y.J., Ren, X.Y., Wu, S.C., Yang, X.C.
Source: The 26th Annual International Conference of the IEEE Engineering in Medicine and Biology Society Engineering in Medicine and biology Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE. 1:361-364 2004
Relation: Conference Proceedings. 26th Annual International Conference of the IEEE Engineering in Medicine and Biology Society
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5Conference
Source: The 26th Annual International Conference of the IEEE Engineering in Medicine and Biology Society Engineering in Medicine and biology Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE. 1:624-627 2004
Relation: Conference Proceedings. 26th Annual International Conference of the IEEE Engineering in Medicine and Biology Society
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6Conference
Authors: Jinfeng Kang, Xiaoyan Liu, Ruqi Han, Yangyuan Wang, Lian, G.J., Kun Xun, Yu, D.P., Xiong, G.C., Wu, S.C., Wang, Y.G.
Source: 2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443) Solid-state and integrated circuit technology Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on. 1:321-324 vol.1 2001
Relation: Proceedings of 6th International Conference on Solid-State and IC Technology
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7Academic Journal
Authors: Branco, R., Costa, J.D., Borrego, L.P., Wu, S.C., Long, X.Y., Antunes, F.V.
Source: In Engineering Failure Analysis August 2020 114
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8Academic Journal
Authors: Hu, Y.N., Wu, S.C., Withers, P.J., Zhang, J., Bao, H.Y.X., Fu, Y.N., Kang, G.Z.
Source: In Materials & Design July 2020 192
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9Academic Journal
Authors: Hu, Y.N., Wu, S.C., Wu, Z.K., Zhong, X.L., Ahmed, S., Karabal, S., Xiao, X.H., Zhang, H.O., Withers, P.J.
Source: In International Journal of Fatigue July 2020 136
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10Conference
Authors: Chen, J.C., Yang-Chih Fan, Wang, J.Y., Lin, T.K., Leea, S.H., Wu, S.C., Lan, Y.J.
Source: 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat No.99CH36314) Semiconductor manufacturing Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International Symposium on. :317-320 1999
Relation: 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings
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11Conference
Authors: Jone, W.B., Huang, D.C., Wu, S.C., Lee, K.J.
Source: Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) VLSI test symposium VLSI Test Symposium, 1999. Proceedings. 17th IEEE. :246-251 1999
Relation: Proceedings 17th IEEE VLSI Test Symposium
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12Academic Journal
Source: In International Journal of Fatigue March 2020 132
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13Academic Journal
Collaborative crack initiation mechanism of 25CrMo4 alloy steels subjected to foreign object damages
Authors: Wu, S.C., Luo, Y., Shen, Z., Zhou, L.C., Zhang, W.H., Kang, G.Z.
Source: In Engineering Fracture Mechanics 15 February 2020 225
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14Academic Journal
Authors: Wu, S.C., Li, C.H., Luo, Y., Zhang, H.O., Kang, G.Z.
Source: In International Journal of Fatigue February 2020 131
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15Conference
Authors: Wu, S.C., Melbourne, W.G.
Source: IEEE PLANS 92 Position Location and Navigation Symposium Record Position Location and Navigation Symposium, 1992. Record. 500 Years After Columbus - Navigation Challenges of Tomorrow. IEEE PLANS '92., IEEE. :21-26 1992
Relation: IEEE PLANS 92 Position Location and Navigation Symposium Record
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16Academic Journal
Authors: Jone, W.B., Huang, D.C., Wu, S.C., Lee, K.J.
Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 10(4):512-515 Aug, 2002
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17Academic Journal
Authors: Branco, R., Costa, J.D., Borrego, L.P., Wu, S.C., Long, X.Y., Zhang, F.C.
Source: In International Journal of Fatigue December 2019 129
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18Conference
Authors: Tang, X.H., Wu, S.C., Zheng, C., Zhang, J.H.
Source: 2009 Fifth International Conference on Natural Computation Natural Computation, 2009. ICNC '09. Fifth International Conference on. 6:453-457 Aug, 2009
Relation: 2009 Fifth International Conference on Natural Computation (ICNC)
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19Academic Journal
Authors: Teng, Z.H., Liao, D.M., Wu, S.C., Sun, F., Chen, T., Zhang, Z.B.
Source: In Theoretical and Applied Fracture Mechanics October 2019 103
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20Academic Journal
Authors: Long, X.Y., Liu, K., Jiang, C., Xiao, Y., Wu, S.C.
Source: In Theoretical and Applied Fracture Mechanics October 2019 103