Showing 1 - 20 results of 402 Refine Results
  1. 1
    Academic Journal

    Source: IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 71(12):6495-6506 Dec, 2024

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  2. 2
    Conference

    Source: 2024 IEEE European Solid-State Electronics Research Conference (ESSERC) Solid-State Electronics Research Conference (ESSERC), 2024 IEEE European. :665-668 Sep, 2024

    Relation: 2024 IEEE European Solid-State Electronics Research Conference (ESSERC)

  3. 3
    Conference

    Source: 2024 IEEE European Solid-State Electronics Research Conference (ESSERC) Solid-State Electronics Research Conference (ESSERC), 2024 IEEE European. :21-24 Sep, 2024

    Relation: 2024 IEEE European Solid-State Electronics Research Conference (ESSERC)

  4. 4
    Conference

    Source: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-7 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

  5. 5
    Conference

    Source: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

  6. 6
  7. 7
  8. 8
    Conference

    Source: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-7 Mar, 2023

    Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

  9. 9
    Academic Journal

    Source: IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 70(7):2858-2867 Jul, 2023

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  10. 10
    Academic Journal
  11. 11
    Academic Journal
  12. 12
    Academic Journal

    Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 30(11):1757-1769 Nov, 2022

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  13. 13
    Academic Journal

    Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 30(11):1668-1676 Nov, 2022

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  14. 14
    Academic Journal

    Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 30(10):1497-1506 Oct, 2022

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  15. 15
    Conference

    Source: 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2022. :616-621 Mar, 2022

    Relation: 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)

  16. 16
    Conference

    Source: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023

    Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

  17. 17
    Academic Journal

    Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(6):3113-3117 Jun, 2022

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  18. 18
    Conference

    Source: 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-6 Mar, 2021

    Relation: 2021 IEEE International Reliability Physics Symposium (IRPS)

  19. 19
    Conference

    Source: 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-7 Mar, 2021

    Relation: 2021 IEEE International Reliability Physics Symposium (IRPS)

  20. 20
    Conference

    Source: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2020 International Conference o. :253-256 Sep, 2020

    Relation: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)