Inter-laboratory comparison of S-parameter measurements with dynamic uncertainty evaluation

Authors: Singh, D., Salter, M. J., Votsi, H., Ridler, N. M.

Source: 2020 94th ARFTG Microwave Measurement Symposium (ARFTG) ARFTG Microwave Measurement Symposium (ARFTG), 2020 94th. :1-4 Jan, 2020

Relation: 2020 94th ARFTG Microwave Measurement Symposium (ARFTG)

Electrooptic Measurements to Assess the Quality of Calibration Kit Design

Authors: Votsi, H., Urbonas, J., Iezekiel, S., Aaen, P.H.

Source: IEEE Microwave and Wireless Components Letters IEEE Microw. Wireless Compon. Lett. Microwave and Wireless Components Letters, IEEE. 31(1):80-83 Jan, 2021

Dynamic Temperature Measurements of a GaN DC–DC Boost Converter at MHz Frequencies

Authors: Matei, C., Urbonas, J., Votsi, H., Kendig, D., Aaen, P.H.

Source: IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 35(8):8303-8310 Aug, 2020

On-Wafer Broadband Microwave Measurement of High Impedance Devices-CPW Test Structures with Integrated Metallic Nano-Resistances

Authors: Daffe, K., Mubarak, F., Mascolo, V., Votsi, H., Ridler, N. M., Dambrine, G., Roch, I., Haddadi, K.

Source: 2018 48th European Microwave Conference (EuMC) Microwave Conference (EuMC), 2018 48th European. :25-28 Sep, 2018

Relation: 2018 48th European Microwave Conference (EuMC)

Modelling of Solution Processed Indium Arsenide Nanowire Microwave Switches

Authors: Votsi, H., Mirkhaydarov, B., Gillespie, S., Young, P., Shkunov, M., Aaen, P. H.

Source: 2018 IEEE/MTT-S International Microwave Symposium - IMS Microwave Symposium - IMS, 2018 IEEE/MTT-S International. :232-235 Jun, 2018

Relation: 2018 IEEE/MTT-S International Microwave Symposium - IMS 2018

Development of a reference wafer for on-wafer testing of extreme impedance devices

Authors: Votsi, H., I. Roch-Jeune, Haddadi, K., Li, C., Dambrine, G., Aaen, P.H., Ridler, N.

Source: 2016 88th ARFTG Microwave Measurement Conference (ARFTG) Microwave Measurement Conference (ARFTG), 2016 88th ARFTG. :1-4 Dec, 2016

Relation: 2016 88th ARFTG Microwave Measurement Conference (ARFTG)

An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements

Authors: Votsi, H., Li, C., Aaen, P.H., Ridler, N.M.

Source: IEEE Microwave and Wireless Components Letters IEEE Microw. Wireless Compon. Lett. Microwave and Wireless Components Letters, IEEE. 27(11):1034-1036 Nov, 2017