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    Academic Journal

    Authors: Hoyos Vallejo, Carlos Arturo1,2 (AUTHOR) choyosv@pucp.pe, Chinelato, Flavia Braga1,2 (AUTHOR) fchinelato@pucp.edu.pe

    Source: International Journal of Quality & Reliability Management. 2025, Vol. 42 Issue 1, p107-121. 15p.

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    Conference

    Source: 2009 IEEE International Technology Management Conference (ICE) Technology Management Conference (ICE), 2009 IEEE International. :1-9 Jun, 2009

    Relation: 2009 IEEE International Technology Management Conference (ICE)

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