-
1Conference
Authors: Ukida, Hiroyuki, Tamura, Toshiya
Source: 2024 SICE Festival with Annual Conference (SICE FES) Festival with Annual Conference (SICE FES), 2024 SICE. :385-390 Aug, 2024
Relation: 2024 SICE Festival with Annual Conference (SICE FES)
-
2Conference
Authors: Ikeda, Hinata, Ukida, Hiroyuki, Yamazoe, Kouki, Tominaga, Masahide, Sasao, Tomoyo, Terada, Kenji
Source: 2022 61st Annual Conference of the Society of Instrument and Control Engineers (SICE) Instrument and Control Engineers (SICE), 2022 61st Annual Conference of the Society of. :592-597 Sep, 2022
Relation: 2022 61st Annual Conference of the Society of Instrument and Control Engineers (SICE)
-
3Conference
Authors: Togo, Shoichiro, Ukida, Hiroyuki
Source: 2021 60th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE) Instrument and Control Engineers of Japan (SICE), 2021 60th Annual Conference of the Society of. :1122-1127 Sep, 2021
Relation: 2021 60th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE)
-
4Conference
Authors: Ukida, Hiroyuki, Sasao, Tomoyo, Terada, Kenji, Yoshida, Atsuya
Source: 2019 58th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE) Instrument and Control Engineers of Japan (SICE), 2019 58th Annual Conference of the Society of. :136-141 Sep, 2019
Relation: 2019 58th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE)
-
5Conference
Source: Communications in computer and information science. 1578:49-63
-
6Conference
Authors: Ukida, Hiroyuki
Source: 2016 55th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE) Society of Instrument and Control Engineers of Japan (SICE), 2016 55th Annual Conference of the. :385-390 Sep, 2016
Relation: 2016 55th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE)
-
7Conference
Source: 2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings Instrumentation and Measurement Technology Conference Proceedings (I2MTC), 2016 IEEE International. :1-6 May, 2016
Relation: 2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
-
8Conference
Authors: Tanimoto, Yoshio, Yamamoto, Hideki, Nanba, Kuniharu, Tokuhiro, Akihiro, Furusawa, Kazunari, Ukida, Hiroyuki
Source: 2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings Instrumentation and Measurement Technology Conference Proceedings (I2MTC), 2016 IEEE International. :1-6 May, 2016
Relation: 2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
-
9Conference
Authors: Ukida, Hiroyuki
Source: 2017 56th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE) Society of Instrument and Control Engineers of Japan (SICE), 2017 56th Annual Conference of the. :476-478 Sep, 2017
Relation: 2017 56th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE)
-
10Conference
Authors: Ukida, Hiroyuki, Sano, Tetsuya, Tanimoto, Yoshio, Yamamoto, Hideki
Source: 2015 IEEE International Conference on Imaging Systems and Techniques (IST) Imaging Systems and Techniques (IST), 2015 IEEE International Conference on. :1-5 Sep, 2015
Relation: 2015 IEEE International Conference on Imaging Systems and Techniques (IST)
-
11Conference
Authors: Ukida, Hiroyuki, Tanaka, Kazuki
Source: 2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE) Society of Instrument and Control Engineers of Japan (SICE), 2015 54th Annual Conference of the. :1-6 Jul, 2015
Relation: 2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE)
-
12Conference
Authors: Tanimoto, Yoshio, Nanba, Kuniharu, Furusawa, Kazunari, Yamamoto, Hideki, Tokuhiro, Akihiro, Ukida, Hiroyuki
Source: 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International. :1348-1352 May, 2015
Relation: 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
-
13Conference
Authors: Ukida, Hiroyuki, Achi, Keita, Yoshida, Akihito
Source: The SICE Annual Conference 2013 SICE Annual Conference (SICE), 2013 Proceedings of. :2122-2127 Sep, 2013
Relation: SICE 2013 - 52nd Annual Conference of the Society of Instrument and Control Engineers of Japan
-
14Conference
Source: 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2013 IEEE International. :1386-1391 May, 2013
Relation: 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
-
15Conference
Authors: Tanimoto, Yoshio, Nanba, Kuniharu, Furusawa, Kazunari, Yamamoto, Hideki, Tokuhiro, Akihiro, Ukida, Hiroyuki
Source: 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2013 IEEE International. :1755-1760 May, 2013
Relation: 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
-
16Conference
Authors: Ukida, Hiroyuki, Harada, Takashi
Source: The 19th Korea-Japan Joint Workshop on Frontiers of Computer Vision Frontiers of Computer Vision, (FCV), 2013 19th Korea-Japan Joint Workshop on. :190-196 Jan, 2013
Relation: 2013 19th Korea-Japan Joint Workshop on Frontiers of Computer Vision (FCV2013)
-
17Conference
Authors: Ukida, Hiroyuki, Terama, Yasuhiro, Ohnishi, Hiroki
Source: 2012 Proceedings of SICE Annual Conference (SICE) SICE Annual Conference (SICE), 2012 Proceedings of. :1920-1925 Aug, 2012
Relation: SICE 2012 - 51st Annual Conference of the Society of Instrument and Control Engineers of Japan
-
18Conference
Authors: Tanimoto, Yoshio, Namba, Kuniharu, Furusawa, Kazunari, Yamamoto, Hideki, Tokuhiro, Akihiro, Ukida, Hiroyuki
Source: 2012 IEEE International Conference on Imaging Systems and Techniques Proceedings Imaging Systems and Techniques (IST), 2012 IEEE International Conference on. :309-314 Jul, 2012
Relation: 2012 IEEE International Conference on Imaging Systems and Techniques (IST)
-
19Conference
Source: 2012 IEEE International Conference on Imaging Systems and Techniques Proceedings Imaging Systems and Techniques (IST), 2012 IEEE International Conference on. :321-326 Jul, 2012
Relation: 2012 IEEE International Conference on Imaging Systems and Techniques (IST)
-
20Conference
Authors: Ukida, Hiroyuki, Kawanami, Masayuki, Terama, Yasuhiro
Source: SICE Annual Conference 2011 SICE Annual Conference (SICE), 2011 Proceedings of. :2004-2009 Sep, 2011
Relation: SICE 2011 - 50th Annual Conference of the Society of Instrument and Control Engineers of Japan