Improvement of HRS Variability in OxRRAM by Tailored Metallic Liner

Authors: Guillaume, N., Azzaz, M., Blonkowski, S., Jalaguier, E., Gonon, P., Vallée, C., Blomberg, T., Tuominen, M., Sprey, H., Bernasconi, S., Charpin-Nicolle, C., Nowak, E.

Subject Terms: Physics - Applied Physics, Condensed Matter - Materials Science

Access URL: http://arxiv.org/abs/2010.12210

Nucleation and high-density packing of 360{\deg} domain walls on planar ferromagnetic nanowires by using circular magnetic fields

Authors: Kaya, F. I., Sarella, A., Wang, D., Tuominen, M., Aidala, K. E.

Subject Terms: Condensed Matter - Materials Science

Access URL: http://arxiv.org/abs/1511.00167

Experimental investigation of aging effects of dry-band arcing on ADSS fiber-optic cables

Authors: Karady, G.G., Lei, Y., Devarajan Srinivasan, Tuominen, M., Risch, B.G.

Source: 2003 IEEE PES Transmission and Distribution Conference and Exposition (IEEE Cat. No.03CH37495) Transmission and distribution conference Transmission and Distribution Conference and Exposition, 2003 IEEE PES. 3:898-903 vol.3 2003

Relation: 2003 IEEE PES Transmission and Distribution Conference and Exposition

ALD metal-gate/high-/spl kappa/ gate stack for Si and Si/sub 0.7/Ge/sub 0.3/ surface-channel pMOSFETs

Authors: Wu, D., Persson, S., Lindgren, A.-C., Sjoblom, G., Hellstrom, P.-E., Olsson, J., Zhang, S.-L., Ostling, M., Vainonen-Ahlgren, E., Tois, E., Li, W.-M., Tuominen, M.

Source: ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. Solid-state device research - ESSDERC '03 European Solid-State Device Research, 2003. ESSDERC '03. 33rd Conference on. :263-266 2003

Relation: ESSDERC 2003. Proceedings of the 33rd European Solid-State Device Research - ESSDERC '03

Study on the effect of test circuit parameters on dry band arcing failure of ADSS fiber optic cable

Authors: Qu Huang, Baozhuang Shi, Karady, G.G., Tuominen, M.

Source: 2003 IEEE Power Engineering Society General Meeting (IEEE Cat. No.03CH37491) Power engineering society Power Engineering Society General Meeting, 2003, IEEE. 1:207-210 Vol. 1 2003

Relation: 2003 IEEE Power Engineering Society General Meeting

An analytic approach to measuring the overall effectiveness of R&D-a case study in the telecom sector

Authors: Ojanen, V., Tuominen, M.

Source: IEEE International Engineering Management Conference Engineering management conference Engineering Management Conference, 2002. IEMC '02. 2002 IEEE International. 2:667-672 vol.2 2002

Relation: 2002 IEEE International Engineering Management Conference

Organisational advantage of inter-firm networks compared with markets and hierarchies

Authors: Nironen, E., Tuominen, M.

Source: IEEE International Engineering Management Conference Engineering management conference Engineering Management Conference, 2002. IEMC '02. 2002 IEEE International. 1:403-406 vol.1 2002

Relation: 2002 IEEE International Engineering Management Conference

Infrared interface analysis of high-k dielectrics deposited by atomic layer chemical vapour deposition

Authors: Cosnier, V., Bender, H., Caymax, A., Chen, J., Conard, T., Nohira, H., Richard, O., Tsai, W., Vandervorst, W., Young, E., Zhao, C., De Gendt, S., Heyns, A., Maes, J.W.H., Tuominen, M., Rochat, N., Olivier, M., Chabli, A.

Source: Extended Abstracts of International Workshop on Gate Insulator. IWGI 2001 (IEEE Cat. No.01EX537) Gate insulator Gate Insulator, 2001. IWGI 2001. Extended Abstracts of International Workshop on. :226-229 2001

Relation: Extended Abstracts of International Workshop on Gate Insulator. IWGI 2001

Sensor design for leakage current measurement on ADSS fiber-optic cable

Authors: Karady, G.G., Qi Huang, Reta-Hernandez, M., Srinivasan, D., Tuominen, M.

Source: 2001 IEEE Power Engineering Society Winter Meeting. Conference Proceedings (Cat. No.01CH37194) Power Engineering Society Winter meeting Power Engineering Society Winter Meeting, 2001. IEEE. 1:281-286 vol.1 2001

Relation: Proceedings of 2001 Winter Meeting of the IEEE Power Engineering Society

Gate stack preparation with high-k materials in a cluster tool

Authors: De Gendt, S., Heyns, M., Conard, T., Hohira, H., Richard, O., Vandervorst, W., Caymax, M., Maes, J.W., Tuominen, M.

Source: 2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203) Semiconductor manufacturing Semiconductor Manufacturing Symposium, 2001 IEEE International. :395-398 2001

Relation: 2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings

A mitigation method for dry-band arcing caused deterioration of ADSS fiberoptic cables

Authors: Karady, G., Srinivasan, D., Reta-Hernandez, M., Torgerson, D., Tuominen, M., Han, B.

Source: 2000 IEEE Power Engineering Society Winter Meeting. Conference Proceedings (Cat. No.00CH37077) Power engineering Power Engineering Society Winter Meeting, 2000. IEEE. 4:2391-2396 vol.4 2000

Relation: 2000 IEEE Power Engineering Society Winter Meeting. Conference Proceedings

Computer simulation of fiber-optic cable failures due to dry-band arcing

Authors: Karady, G.G., Tuominen, M., Han, B.

Source: 1999 IEEE Power Engineering Society Summer Meeting. Conference Proceedings (Cat. No.99CH36364) Power engineering society summer meeting Power Engineering Society Summer Meeting, 1999. IEEE. 2:890-894 vol.2 1999

Relation: 1999 IEEE Power Engineering Society Summer Meeting

New test method for evaluation of corona-caused aging in fiber-optic cables

Authors: Karady, G.G., Torgerson, M., Torgerson, D., Wild, J., Tuominen, M.

Source: 1999 IEEE Transmission and Distribution Conference (Cat. No. 99CH36333) Transmission and distribution Transmission and Distribution Conference, 1999 IEEE. 2:734-738 vol.2 1999

Relation: 1999 IEEE Transmission and Distribution Conference

Experimental Correlation of the Aging Process of the ADSS Fiber-Optic Cables in ASU's Environmental Chamber to Field Tests in Bandon, OR

Authors: Al-Ammar, E., Karady, G. G., Tuominen, M. W., Vermeers, D. J.

Source: IEEE Transactions on Power Delivery IEEE Trans. Power Delivery Power Delivery, IEEE Transactions on. 23(2):1049-1054 Apr, 2008

Group decision support for analysing logistics development projects

Authors: Korpela, J., Tuominen, M.

Source: Proceedings of the Thirtieth Hawaii International Conference on System Sciences System sciences System Sciences, 1997, Proceedings of the Thirtieth Hawaii International Conference on. 2:493-502 vol.2 1997

Relation: Proceedings of the Thirtieth Hawaii International Conference on System Sciences

ODSS in strategic financial and production planning

Authors: Kivijarvi, H., Tuominen, M.

Source: Proceedings of the Thirtieth Hawaii International Conference on System Sciences System sciences System Sciences, 1997, Proceedings of the Thirtieth Hawaii International Conference on. 3:337-346 vol.3 1997

Relation: Proceedings of the Thirtieth Hawaii International Conference on System Sciences

Group decision support for defining the vision and strategic goals for distribution logistics

Authors: Korpela, J., Tuominen, M.

Source: Proceedings of the Twenty-Eighth Annual Hawaii International Conference on System Sciences System sciences System Sciences, 1995. Proceedings of the Twenty-Eighth Hawaii International Conference on. 4:475-484 vol.4 1995

Relation: Proceedings of the Twenty-Eighth Annual Hawaii International Conference on System Sciences

Study on development of dry band on ADSS fibre optic cable

Authors: Huang, Q., Karacly, G.G., Shi, B., Tuominen, M.

Source: IEEE Transactions on Dielectrics and Electrical Insulation IEEE Trans. Dielect. Electr. Insul. Dielectrics and Electrical Insulation, IEEE Transactions on. 12(3):487-495 Jun, 2005

Numerical simulation of dry-band arcing on the surface of ADSS fiber optic cable

Authors: Qi Huang, Karady, G.G., Shi, B., Tuominen, M.

Source: IEEE Transactions on Dielectrics and Electrical Insulation IEEE Trans. Dielect. Electr. Insul. Dielectrics and Electrical Insulation, IEEE Transactions on. 12(3):496-503 Jun, 2005

The application of ALD WN/sub x/C/sub y/ as a copper diffusion barrier

Authors: Smith, S., Book, G., Li, W.M., Sun, Y.M., Gillespie, P., Tuominen, M., Pfeifer, K.

Source: Proceedings of the IEEE 2003 International Interconnect Technology Conference (Cat. No.03TH8695) Interconnect technology Interconnect Technology Conference, 2003. Proceedings of the IEEE 2003 International. :135-137 2003

Relation: IEEE International Interconnect Technology Conference