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1Academic Journal
Authors: Takahiro Nagata, Toyohiro Chikyow, Akira Ando
Source: ACS Omega, Vol 9, Iss 24, Pp 25968-25975 (2024)
File Description: electronic resource
Relation: https://doaj.org/toc/2470-1343
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2Academic Journal
Source: Science and Technology of Advanced Materials: Methods, Vol 2, Iss 1, Pp 23-37 (2022)
Subject Terms: two-dimensional x-ray diffraction, thin films, machine learning, feature extraction, dimensionality reduction, non-negative matrix factorization, variational autoencoder, Materials of engineering and construction. Mechanics of materials, TA401-492
File Description: electronic resource
Relation: https://doaj.org/toc/2766-0400
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3Academic Journal
Authors: Shinjiro Yagyu, Tadashi Mitsui, Toyohiro Chikyow, Takahiro Nagata
Source: Science and Technology of Advanced Materials: Methods, Vol 1, Iss 1, Pp 192-199 (2021)
Subject Terms: kerr effect microscope, combinatorial technology, pulse magnet, Materials of engineering and construction. Mechanics of materials, TA401-492
File Description: electronic resource
Relation: https://doaj.org/toc/2766-0400
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4Academic Journal
Source: ACS Omega, Vol 4, Iss 12, Pp 14680-14687 (2019)
File Description: electronic resource
Relation: https://doaj.org/toc/2470-1343
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5Academic Journal
Authors: Yongxun Liu, Toshihide Nabatame, Takashi Matsukawa, Kazuhiko Endo, Shinichi O'uchi, Junichi Tsukada, Hiromi Yamauchi, Yuki Ishikawa, Wataru Mizubayashi, Yukinori Morita, Shinji Migita, Hiroyuki Ota, Toyohiro Chikyow, Meishoku Masahara
Source: Journal of Low Power Electronics and Applications, Vol 4, Iss 2, Pp 153-167 (2014)
Subject Terms: charge trapping (CT), flash memory, silicon on insulator (SOI), FinFET, blocking layer, high-k metal gate, variability, Applications of electric power, TK4001-4102
File Description: electronic resource
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6Conference
Authors: Kenji Shiraishi, Yasushi Akasaka, Naoto Umezawa, Yasuo Nara, Keisaku Yamada, Hideki Takeuchi, Heiji Watanabe, Toyohiro Chikyow, Tsu-Jae King Liu
Source: 2006 International Conference on Simulation of Semiconductor Processes and Devices Simulation of Semiconductor Processes and Devices, 2006 International Conference on. :306-313 Sep, 2006
Relation: 2006 International Conference on Simulation of Semiconductor Processes and Devices
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7Academic Journal
Authors: Mahammedi, Nassim Ahmed1,2,3, n.mahammedi@lagh-univ.dz, Ferhat, Marhoun2,4, Takao Tsumuraya5, Toyohiro Chikyow3
Source: Journal of Applied Physics; 11/28/2017, Vol. 122 Issue 20, p1-11, 11p
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8Academic Journal
Source: Journal of Applied Physics; 11/28/2017, Vol. 122 Issue 20, p1-11, 11p
Subject Terms: SILICON, CLATHRATE compounds, DENSITY functional theory, CRYSTAL structure, PHOTOVOLTAIC power generation
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9Academic Journal
Source: ACS Omega; 9/17/2019, Vol. 4 Issue 12, p14680-14697, 18p
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10Academic Journal
Authors: Lei Zhang, Gerlach, Dominic, Dönni, Andreas, Toyohiro Chikyow, Yoshio Katsuya, Masahiko Tanaka, Shigenori Ueda, Kazunari Yamaura, Belik, Alexei A.
Source: Inorganic Chemistry; 3/5/2018, Vol. 57 Issue 5, p2773-2781, 9p
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11Academic Journal
Influence of Al2O3 layer insertion on the electrical properties of Ga-In-Zn-O thin-film transistors.
Authors: Kazunori Kurishima1,2, ce41034@meiji.ac.jp, Toshihide Nabatame3, NABATAME.Toshihide@nims.go.jp, Maki Shimizu4, Nobuhiko Mitoma4, Takio Kizu4, Shinya Aikawa4, Kazuhito Tsukagoshi4, Akihiko Ohi5, Toyohiro Chikyow2, Atsushi Ogura1
Source: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Nov/Dec2015, Vol. 33 Issue 6, p1-6, 6p
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12Academic Journal
Influence of Al
2 O3 layer insertion on the electrical properties of Ga-In-Zn-O thin-film transistors.Authors: Kazunori Kurishima, Toshihide Nabatame, Maki Shimizu, Nobuhiko Mitoma, Takio Kizu, Shinya Aikawa, Kazuhito Tsukagoshi, Akihiko Ohi, Toyohiro Chikyow, Atsushi Ogura
Source: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Nov/Dec2015, Vol. 33 Issue 6, p1-6, 6p
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13Academic Journal
Authors: Seungjun Oh1, Ryoma Hayakawa1, Toyohiro Chikyow1, Yutaka Wakayama1,2, WAKAYAMA.Yutaka@nims.go.jp
Source: Applied Physics Letters; 6/15/2015, Vol. 106 Issue 24, p1-4, 4p, 2 Diagrams, 1 Chart, 2 Graphs
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14Academic Journal
Authors: Takayuki Nakane, Takashi Naka, Koichi Sato, Minori Taguchi, Minako Nakayama, Tadashi Mitsui, Akiyuki Matsushita, Toyohiro Chikyow
Source: Dalton Transactions: An International Journal of Inorganic Chemistry; 2015, Vol. 44 Issue 3, p997-1008, 12p
Subject Terms: SPECTRUM analysis, CRYSTALLOGRAPHY, SPINEL, KIRKENDALL effect, GENETIC mutation
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15Academic Journal
Authors: Hyojung Bae1, Jun-Seok Ha1, Seunghwan Park1, Toyohiro Chikyow1, Jiho Chang1, Dongcheol Oh1
Source: Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; Sep/Oct2012, Vol. 30 Issue 5, p1-4, 4p
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16Academic Journal
Authors: Seiichi TakamiPresent address: IMRAM, Tohoku University, 2-1-1 Katahira, Sendai, 980-8577, Japan. Email: stakami@tagen.tohoku.ac.jp, Satoshi Ohara, Tadafumi Adschiri, Yutaka Wakayama, Toyohiro Chikyow
Source: Dalton Transactions: An International Journal of Inorganic Chemistry; Oct2008, Vol. 2008 Issue 40, p5442-5446, 5p
Subject Terms: INORGANIC compounds, NANOCRYSTALS, ADIPIC acid, CERIUM
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17Academic Journal
Authors: Yutaka Wakayama, Kenji Kobayashi, Ryoma Hayakawa, Toyohiro Chikyow, Shinichi Machida, Tomonobu Nakayama, Stefan Egger, Dimas G. de Oteyza, Helmut Dosch
Source: Nano Letters; Aug2008, Vol. 8 Issue 10, p3273-3277, 5p
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18Academic Journal
Authors: Kota Tatejima, Takahiro Nagata, Keiji Ishibashi, Kenichiro Takahashi, Setsu Suzuki, Atsushi Ogura, Toyohiro Chikyow
Source: Japanese Journal of Applied Physics; 6/2/2019, Vol. 58 Issue SD, p1-1, 1p
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19Academic Journal
Source: Japanese Journal of Applied Physics; 6/2/2019, Vol. 58 Issue SD, p1-1, 1p
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20Academic Journal
Authors: Takahiro Nagata, Oliver Bierwagen, Zbigniew Galazka, Masataka Imura, Shigenori Ueda, Yoshiyuki Yamashita, Toyohiro Chikyow
Source: Japanese Journal of Applied Physics; 6/2/2019, Vol. 58 Issue SD, p1-1, 1p