Uneven Illumination Surface Defects Inspection Based on Saliency Detection and Intrinsic Image Decomposition

Authors: Yuanhong Qiu, Lixin Tang, Bin Li, Suanlong Niu, Tongzhi Niu

Source: IEEE Access, Vol 8, Pp 190663-190676 (2020)

Subject Terms: Defect detection, uneven illumination, saliency detection, intrinsic image decomposition, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

File Description: electronic resource

Relation: https://ieeexplore.ieee.org/document/9229127/; https://doaj.org/toc/2169-3536

Access URL: https://doaj.org/article/9f0e366bb54141fe95ae4a5894c6b751

Multi-Disciplinary and Multi-Objective Optimization Method Based on Machine Learning.

Authors: Jiahua Dai¹, Peiqing Liu², Ling Li³, Qiulin Qu⁴, Tongzhi Niu⁵

Source: AIAA Journal; Feb2024, Vol. 62 Issue 2, p691-707, 17p