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1Conference
Authors: Kobayashi, H., Tobari, T., Matsuura, H., Miura, A., Yamanaka, R., Yakihara, T., Kobayashi, S., Oka, S., Fujita, T., Murata, D.
Source: Quality Measurement: The Indispensable Bridge between Theory and Reality (No Measurements? No Science! Joint Conference - 1996: IEEE Instrumentation and Measurement Technology Conference and IMEKO Tec Instrumentation and measurement technology Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE. 2:1160-1166 vol.2 1996
Relation: Quality Measurement: The Indispensable Bridge between Theory and Reality (No Measurements? No Science! Joint Conference - 1996: IEEE Instrumentation and Measurement Technology Conference and IMEKO Technical Committee 7. Conference Proceedings
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2Conference
Authors: Kobayashi, H., Sakayori, H., Tobari, T., Matsuura, H.
Source: 1995 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and systems Circuits and Systems (ISCAS), 1995 IEEE International Symposium on. 1:700-703 vol.1 1995
Relation: 1995 IEEE International Symposium on Circuits and Systems (ISCAS)
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3Periodical
Authors: Kobayashi, H., Mizuta, T., Kimura, M., Uchida, K., Tobari, T., Matsuura, H., Kobayashi, K., Miura, A., Yakihara, T., Kobayashi, S.
Source: COMPUTER STANDARDS AND INTERFACES. 22(2):121-139
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4Periodical
Authors: Tobari, T., Kobayashi, H., Uchida, K., Matsuura, H., Yamanaka, M., Kobayashi, S., Fujita, T., Miura, A.
Source: IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES E SERIES A. 80(3):454-460
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5Conference
Authors: Tobari, T., Kobayashi, H., Uchida, K., Matsuura, H.
Source: IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES E SERIES A. 80(3):454-460
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6Conference
Authors: Kobayashi, H., Tobari, T., Matsuura, H., Miura, A.
Source: IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS. :1160-1166
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7Conference
Authors: Kobayashi, H., Sakayori, H., Tobari, T., Matsuura, H.
Source: IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS. (1):I-700-I-703