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    Academic Journal
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    Academic Journal
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    Conference
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    Conference

    Source: 2023 23rd European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2023 23rd European Conference on. :1-5 Sep, 2023

    Relation: 2023 23rd European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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    Academic Journal

    Authors: Lee, J., Lee, B., Sung, S.

    Source: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 73:1-13 2024

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    Conference

    Source: 2023 IEEE International Solid-State Circuits Conference (ISSCC) Solid-State Circuits Conference (ISSCC), 2023 IEEE International. :40-42 Feb, 2023

    Relation: 2023 IEEE International Solid-State Circuits Conference (ISSCC)

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    Conference

    Source: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2022 22nd European Conference on. :1-6 Oct, 2022

    Relation: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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    Conference

    Source: 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :213-218 Sep, 2022

    Relation: 2022 IEEE International Test Conference (ITC)

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    Academic Journal

    Source: IEEE Communications Surveys & Tutorials IEEE Commun. Surv. Tutorials Communications Surveys & Tutorials, IEEE. 25(3):1543-1570 Jan, 2023

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    Conference

    Source: 2021 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2021 IEEE International. :47-52 Oct, 2021

    Relation: 2021 IEEE International Test Conference (ITC)

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    Academic Journal

    Source: IEEE Transactions on Learning Technologies IEEE Trans. Learning Technol. Learning Technologies, IEEE Transactions on. 15(1):15-31 Feb, 2022

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    Conference

    Source: 2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) VLSI Design, Automation and Test (VLSI-DAT), 2021 International Symposium on. :1-4 Apr, 2021

    Relation: 2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)