Showing 1 - 20 results of 499 Refine Results
  1. 1
    Conference

    A New High-Frequency Inductive Voltage Divider for QHR Measurements at Frequencies up to 2 MHz

    Authors: Awan, S. A., Schurr, J., MacVeigh, S., Welsh, J.

    Source: 2024 Conference on Precision Electromagnetic Measurements (CPEM) Precision Electromagnetic Measurements (CPEM), 2024 Conference on. :1-2 Jul, 2024

    Relation: 2024 Conference on Precision Electromagnetic Measurements (CPEM)

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  2. 2
    Conference

    Novel Impedance Standards based on Series-Connected Metal-Foil Resistors with Voltage-Supplied Encapsulations

    Authors: Schurr, J., Gotz, M.

    Source: 2024 Conference on Precision Electromagnetic Measurements (CPEM) Precision Electromagnetic Measurements (CPEM), 2024 Conference on. :1-2 Jul, 2024

    Relation: 2024 Conference on Precision Electromagnetic Measurements (CPEM)

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  3. 3
    Conference

    Toward Precision Resistance Measurements by a Precision LCR Meter at Frequencies up to 2 MHz

    Authors: Schurr, J., Awan, S. A.

    Source: 2024 Conference on Precision Electromagnetic Measurements (CPEM) Precision Electromagnetic Measurements (CPEM), 2024 Conference on. :1-2 Jul, 2024

    Relation: 2024 Conference on Precision Electromagnetic Measurements (CPEM)

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  4. 4
    Conference

    Thin-Film Resistance Standards with Calculable AC-DC Difference at Frequencies up to 2 MHz

    Authors: Schurr, J., Judaschke, R. H., Awan, S. A.

    Source: 2024 Conference on Precision Electromagnetic Measurements (CPEM) Precision Electromagnetic Measurements (CPEM), 2024 Conference on. :1-2 Jul, 2024

    Relation: 2024 Conference on Precision Electromagnetic Measurements (CPEM)

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  5. 5
    Academic Journal

    Realization of the Farad From the AC Quantum Hall Resistance at PTB—14 Years of Experience

    Authors: Schurr, J., Lee, J.

    Source: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 71:1-8 2022

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  6. 6
    Academic Journal

    Graphene Quantum Hall Effect Devices for AC and DC Electrical Metrology

    Authors: Kruskopf, M., Bauer, S., Pimsut, Y., Chatterjee, A., Patel, D.K., Rigosi, A.F., Elmquist, R.E., Pierz, K., Pesel, E., Gotz, M., Schurr, J.

    Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(7):3672-3677 Jul, 2021

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  7. 7
    Periodical

    Theory of Ethidium Binding to DNA under Tension and Torque: Possible Role of Cruciforms at Inverted Repeat Sequences

    Authors: Schurr, J. Michael

    Source: Journal of physical chemistry.B. 127(23):5199-5213

    Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN632983527&indx=1&recIds=ETOCRN632983527

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  8. 8
    Conference

    AC Quantum Hall Resistance combined with a Four-Terminal Pair Pulse-Driven Josephson Impedance Bridge

    Authors: Bauer, S., Pimsut, Y., Behr, R., Kieler, O., Kruskopf, M., Palafox, L., Lee, J., Schurr, J.

    Source: 2020 Conference on Precision Electromagnetic Measurements (CPEM) Precision Electromagnetic Measurements (CPEM), 2020 Conference on. :1-2 Aug, 2020

    Relation: 2020 Conference on Precision Electromagnetic Measurements (CPEM 2020)

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  9. 9
    Academic Journal

    AC Quantum Hall Effect in Epitaxial Graphene

    Authors: Luond, F., Kalmbach, C., Overney, F., Schurr, J., Jeanneret, B., Muller, A., Kruskopf, M., Pierz, K., Ahlers, F.

    Source: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 66(6):1459-1466 Jun, 2017

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  10. 10
    Academic Journal

    Sherlock Holmes and the rules of scientific reasoning [Basic Metrology]

    Authors: Schurr, J.

    Source: IEEE Instrumentation & Measurement Magazine IEEE Instrum. Meas. Mag. Instrumentation & Measurement Magazine, IEEE. 19(4):7-14 Aug, 2016

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  11. 11
    Conference

    Progress on PTB's Pulse-Driven Josephson Impedance Bridge Combined with an AC Quantum Hall Resistance

    Authors: Bauer, S., Behr, R., Kieler, O., Lee, J., Palafox, L., Schurr, J.

    Source: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) Precision Electromagnetic Measurements (CPEM 2018), 2018 Conference on. :1-2 Jul, 2018

    Relation: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018)

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  12. 12
    Conference

    Supplementary Comparison EURAMET.EM-S31

    Authors: Schurr, J., Fletcher, N., Gournay, P., Thevenot, O., Overney, F., Johnson, L., Xie, R., Dierikx, E.

    Source: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) Precision Electromagnetic Measurements (CPEM 2018), 2018 Conference on. :1-2 Jul, 2018

    Relation: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018)

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  13. 13
    Conference

    Improved SMD-Based Capacitance Standards

    Authors: Schurr, J., Lee, J., Burkel, V.

    Source: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) Precision Electromagnetic Measurements (CPEM 2018), 2018 Conference on. :1-2 Jul, 2018

    Relation: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018)

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  14. 14
    Report

    Electron counting capacitance standard and quantum metrology triangle experiments at PTB

    Authors: Scherer, H, Schurr, J, Ahlers, F J

    Subject Terms: Condensed Matter - Mesoscale and Nanoscale Physics, Physics - Instrumentation and Detectors

    Access URL: http://arxiv.org/abs/1701.04759

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  15. 15
    Conference

    PTB's status of AC voltage metrolgy by microwave- and pulsetrain-driven josephson junction arrays

    Authors: Niemeyer, J., Kieler, O., Muller, F., Kohlmann, J., Behr, R., Palafox, L., Schleussner, D., Beug, M. F., Schurr, J.

    Source: 2013 International Kharkov Symposium on Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW), 2013 International Kharkov Symposium on. :652-654 Jun, 2013

    Relation: 2013 International Kharkov Symposium on Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW)

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  16. 16
    Conference

    Dissipation factor and frequency dependence of graphene quantum Hall devices

    Authors: Kalmbach, C.-C., Schurr, J., Muller, A., Kruskopf, M., Pierz, K., Ahlers, F. J.

    Source: 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) Precision Electromagnetic Measurements (CPEM 2016), 2016 Conference on. :1-2 Jul, 2016

    Relation: 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)

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  17. 17
    Conference

    Implementation of an impedance bridge based on pulse-driven Josephson arrays for arbitrary impedance ratios and phase angles

    Authors: Bauer, S., Behr, R., Hagen, T., Kieler, O., Palafox, L., Schurr, J.

    Source: 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) Precision Electromagnetic Measurements (CPEM 2016), 2016 Conference on. :1-2 Jul, 2016

    Relation: 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)

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  18. 18
    Conference

    Magnetocapacitance and dissipation factor of epitaxial graphene Hall bars

    Authors: Schurr, J., Kalmbach, C.-C., Kruskopf, M., Muller, A., Pierz, K., Ahlers, F.

    Source: 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) Precision Electromagnetic Measurements (CPEM 2016), 2016 Conference on. :1-2 Jul, 2016

    Relation: 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)

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  19. 19
    Academic Journal

    Noise and Correlation Study of Quantum Hall Devices

    Authors: Schurr, J., Ahlers, F., Callegaro, L.

    Source: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 62(6):1574-1580 Jun, 2013

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  20. 20
    Academic Journal

    First Attempt to Develop an On-Chip Double-Shielded QHR Device for Use in AC Measurements

    Authors: Kaneko, N., Domae, A., Oe, T., Schurr, J., Ahlers, F. J., Kiryu, S.

    Source: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 62(6):1743-1748 Jun, 2013

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