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1Conference
Authors: Awan, S. A., Schurr, J., MacVeigh, S., Welsh, J.
Source: 2024 Conference on Precision Electromagnetic Measurements (CPEM) Precision Electromagnetic Measurements (CPEM), 2024 Conference on. :1-2 Jul, 2024
Relation: 2024 Conference on Precision Electromagnetic Measurements (CPEM)
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2Conference
Authors: Schurr, J., Gotz, M.
Source: 2024 Conference on Precision Electromagnetic Measurements (CPEM) Precision Electromagnetic Measurements (CPEM), 2024 Conference on. :1-2 Jul, 2024
Relation: 2024 Conference on Precision Electromagnetic Measurements (CPEM)
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3Conference
Authors: Schurr, J., Awan, S. A.
Source: 2024 Conference on Precision Electromagnetic Measurements (CPEM) Precision Electromagnetic Measurements (CPEM), 2024 Conference on. :1-2 Jul, 2024
Relation: 2024 Conference on Precision Electromagnetic Measurements (CPEM)
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4Conference
Authors: Schurr, J., Judaschke, R. H., Awan, S. A.
Source: 2024 Conference on Precision Electromagnetic Measurements (CPEM) Precision Electromagnetic Measurements (CPEM), 2024 Conference on. :1-2 Jul, 2024
Relation: 2024 Conference on Precision Electromagnetic Measurements (CPEM)
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5Academic Journal
Authors: Schurr, J., Lee, J.
Source: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 71:1-8 2022
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6Academic Journal
Authors: Kruskopf, M., Bauer, S., Pimsut, Y., Chatterjee, A., Patel, D.K., Rigosi, A.F., Elmquist, R.E., Pierz, K., Pesel, E., Gotz, M., Schurr, J.
Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(7):3672-3677 Jul, 2021
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7Periodical
Authors: Schurr, J. Michael
Source: Journal of physical chemistry.B. 127(23):5199-5213
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8Conference
Authors: Bauer, S., Pimsut, Y., Behr, R., Kieler, O., Kruskopf, M., Palafox, L., Lee, J., Schurr, J.
Source: 2020 Conference on Precision Electromagnetic Measurements (CPEM) Precision Electromagnetic Measurements (CPEM), 2020 Conference on. :1-2 Aug, 2020
Relation: 2020 Conference on Precision Electromagnetic Measurements (CPEM 2020)
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9Academic Journal
Authors: Luond, F., Kalmbach, C., Overney, F., Schurr, J., Jeanneret, B., Muller, A., Kruskopf, M., Pierz, K., Ahlers, F.
Source: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 66(6):1459-1466 Jun, 2017
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10Academic Journal
Authors: Schurr, J.
Source: IEEE Instrumentation & Measurement Magazine IEEE Instrum. Meas. Mag. Instrumentation & Measurement Magazine, IEEE. 19(4):7-14 Aug, 2016
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11Conference
Authors: Bauer, S., Behr, R., Kieler, O., Lee, J., Palafox, L., Schurr, J.
Source: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) Precision Electromagnetic Measurements (CPEM 2018), 2018 Conference on. :1-2 Jul, 2018
Relation: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018)
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12Conference
Authors: Schurr, J., Fletcher, N., Gournay, P., Thevenot, O., Overney, F., Johnson, L., Xie, R., Dierikx, E.
Source: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) Precision Electromagnetic Measurements (CPEM 2018), 2018 Conference on. :1-2 Jul, 2018
Relation: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018)
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13Conference
Authors: Schurr, J., Lee, J., Burkel, V.
Source: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) Precision Electromagnetic Measurements (CPEM 2018), 2018 Conference on. :1-2 Jul, 2018
Relation: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018)
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14Report
Authors: Scherer, H, Schurr, J, Ahlers, F J
Subject Terms: Condensed Matter - Mesoscale and Nanoscale Physics, Physics - Instrumentation and Detectors
Access URL: http://arxiv.org/abs/1701.04759
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15Conference
Authors: Niemeyer, J., Kieler, O., Muller, F., Kohlmann, J., Behr, R., Palafox, L., Schleussner, D., Beug, M. F., Schurr, J.
Source: 2013 International Kharkov Symposium on Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW), 2013 International Kharkov Symposium on. :652-654 Jun, 2013
Relation: 2013 International Kharkov Symposium on Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW)
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16Conference
Authors: Kalmbach, C.-C., Schurr, J., Muller, A., Kruskopf, M., Pierz, K., Ahlers, F. J.
Source: 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) Precision Electromagnetic Measurements (CPEM 2016), 2016 Conference on. :1-2 Jul, 2016
Relation: 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)
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17Conference
Authors: Bauer, S., Behr, R., Hagen, T., Kieler, O., Palafox, L., Schurr, J.
Source: 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) Precision Electromagnetic Measurements (CPEM 2016), 2016 Conference on. :1-2 Jul, 2016
Relation: 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)
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18Conference
Authors: Schurr, J., Kalmbach, C.-C., Kruskopf, M., Muller, A., Pierz, K., Ahlers, F.
Source: 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) Precision Electromagnetic Measurements (CPEM 2016), 2016 Conference on. :1-2 Jul, 2016
Relation: 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)
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19Academic Journal
Authors: Schurr, J., Ahlers, F., Callegaro, L.
Source: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 62(6):1574-1580 Jun, 2013
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20Academic Journal
Authors: Kaneko, N., Domae, A., Oe, T., Schurr, J., Ahlers, F. J., Kiryu, S.
Source: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 62(6):1743-1748 Jun, 2013