Design and Analysis of 8T Radiation Hardened SRAM using 65nm Process

Authors: Gupta, Hari Shanker, Satyendra, Singh Shruti, Deo, Bhumika, Santosh, Rane Prathamesh, Khole, Ritesh, Singh, Varun Dev, Kumar, Nishant, Prakash, Krish

Source: 2024 28th International Symposium on VLSI Design and Test (VDAT) VLSI Design and Test (VDAT), 2024 28th International Symposium on. :1-4 Sep, 2024

Relation: 2024 28th International Symposium on VLSI Design and Test (VDAT)