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1Report
Authors: Sarda, Giuseppe M., Shah, Nimish, Bhattacharjee, Debjyoti, Debacker, Peter, Verhelst, Marian
Source: 2023 IEEE International Symposium on Workload Characterization (IISWC)
Subject Terms: Computer Science - Hardware Architecture
Access URL: http://arxiv.org/abs/2407.11999
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2Conference
Authors: Ueyoshi, Kodai, Papistas, Ioannis A., Houshmand, Pouya, Sarda, Giuseppe M., Jain, Vikram, Shi, Man, Zheng, Qilin, Giraldo, Sebastian, Vrancx, Peter, Doevenspeck, Jonas, Bhattacharjee, Debjyoti, Cosemans, Stefan, Mallik, Arindam, Debacker, Peter, Verkest, Diederik, Verhelst, Marian
Source: 2022 IEEE International Solid-State Circuits Conference (ISSCC) Solid-State Circuits Conference (ISSCC), 2022 IEEE International. 65:1-3 Feb, 2022
Relation: 2022 IEEE International Solid-State Circuits Conference (ISSCC)
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3Periodical
Authors: Dadras, Iman, Sarda, Giuseppe M., Laubeuf, Nathan, Bhattacharjee, Debjyoti, Mallik, Arindam
Source: IEEE access. 11:87189-87199
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4Periodical
Authors: Houshmand, Pouya, Sarda, Giuseppe M., Jain, Vikram, Ueyoshi, Kodai, Papistas, Ioannis A., Shi, Man, Zheng, Qilin, Bhattacharjee, Debjyoti, Mallik, Arindam, Debacker, Peter, Verkest, Diederik, Verhelst, Marian
Source: IEEE journal of solid-state circuits. 58(1):203-215
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5Conference
Authors: Sarda, Giuseppe M.
Source: Digest of technical papers. 2022(1):15.6-15.6
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6Periodical
Authors: Houshmand, Pouya, Sarda, Giuseppe M., Jain, Vikram, Ueyoshi, Kodai, Papistas, Ioannis A., Shi, Man, Zheng, Qilin, Bhattacharjee, Debjyoti, Mallik, Arindam, Debacker, Peter, Verkest, Diederik, Verhelst, Marian
Source: IEEE Journal of Solid-State Circuits; January 2023, Vol. 58 Issue: 1 p203-215, 13p