TRRR: Accelerated Online Error Detecting and Correcting Fault Tolerant Architecture

Authors: K K, Raghunandana, K R, Yogesh Prasad, Reorda, M. Sonza, Singh, Virendra

Source: 2024 IEEE East-West Design & Test Symposium (EWDTS) East-West Design & Test Symposium (EWDTS), 2024 IEEE. :1-6 Nov, 2024

Relation: 2024 IEEE East-West Design & Test Symposium (EWDTS)

TCC: GPGPU Architecture for Instruction Decoder and Control Flow Error Detection

Authors: K, Raghunandana K, R, Yogesh Prasad K, Reorda, M. Sonza, Singh, Virendra

Source: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) Design & Diagnostics of Electronic Circuits & Systems (DDECS), 2024 27th International Symposium on. :104-109 Apr, 2024

Relation: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS)

Early Detection of Permanent Faults in DNNs Through the Application of Tensor-Related Metrics

Authors: Turco, V., Ruospo, A., Sanchez, E., Reorda, M. Sonza

Source: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) Design & Diagnostics of Electronic Circuits & Systems (DDECS), 2024 27th International Symposium on. :13-18 Apr, 2024

Relation: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS)

Uncovering hidden vulnerabilities in CNNs through evolutionary-based Image Test Libraries

Authors: Turco, V., Ruospo, A., Gavarini, G., Sanchez, E., Reorda, M. Sonza

Source: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2023 IEEE International Symposium on. :1-6 Oct, 2023

Relation: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

DDSR: An Online GPGPU Instruction Decoder Error Detecting and Correcting Architecture

Authors: K K, Raghunandana, Prasad K R, Yogesh, Reorda, M. Sonza, Singh, Virendra

Source: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2023 IEEE International Symposium on. :1-6 Oct, 2023

Relation: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

TREFU: An Online Error Detecting and Correcting Fault Tolerant GPGPU Architecture

Authors: K, Raghunandana K, B.K.S.V.L., Varaprasad, Reorda, M. Sonza, Singh, Virendra

Source: 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2023 IEEE 29th International Symposium on. :1-7 Jul, 2023

Relation: 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)

Image Test Libraries for the on-line self-test of functional units in GPUs running CNNs

Authors: Ruospo, A., Gavarini, G., Porsia, A., Reorda, M. Sonza, Sanchez, E., Mariani, R., Aribido, J., Athavale, J.

Source: 2023 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2023 IEEE. :1-6 May, 2023

Relation: 2023 IEEE European Test Symposium (ETS)

Assessing Convolutional Neural Networks Reliability through Statistical Fault Injections

Authors: Ruospo, A., Gavarini, G., de Sio, C., Guerrero, J., Sterpone, L., Reorda, M. Sonza, Sanchez, E., Mariani, R., Aribido, J., Athavale, J.

Source: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2023. :1-6 Apr, 2023

Relation: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)

A comparative overview of ATPG flows targeting traditional and cell-aware fault models

Authors: Mirabella, N., Floridia, A., Cantoro, R., Grosso, M., Reorda, M. Sonza

Source: 2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS) Electronics, Circuits and Systems (ICECS), 2022 29th IEEE International Conference on. :1-4 Oct, 2022

Relation: 2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)

A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip

Authors: Iaria, G., Angione, F., Bernardi, P., Reorda, M. Sonza, Appello, D., Garozzo, G., Tancorre, V.

Source: 2022 IEEE 23rd Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2022 IEEE 23rd. :1-6 Sep, 2022

Relation: 2022 IEEE 23rd Latin American Test Symposium (LATS)

In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip

Authors: Filipponi, G., Iaria, G., Reorda, M. Sonza, Appello, D., Garozzo, G., Tancorre, V.

Source: 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :646-649 Sep, 2022

Relation: 2022 IEEE International Test Conference (ITC)

REFU: Redundant Execution with Idle Functional Units, Fault Tolerant GPGPU architecture

Authors: K, Raghunandana K, BKSVL, Varaprasad, Reorda, M. Sonza, Singh, Virendra

Source: 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) ISVLSI VLSI (ISVLSI), 2022 IEEE Computer Society Annual Symposium on. :394-397 Jul, 2022

Relation: 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)

A novel SEU injection setup for Automotive SoC

Authors: Iaria, G., Foscale, T., Bernardi, P., Presicce, L., Reorda, M. Sonza, Appello, D., Tancorre, V., Ugioli, R.

Source: 2022 IEEE 31st International Symposium on Industrial Electronics (ISIE) Industrial Electronics (ISIE), 2022 IEEE 31st International Symposium on. :623-626 Jun, 2022

Relation: 2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)

Test, Reliability and Functional Safety Trends for Automotive System-on-Chip

Authors: Angione, F., Appello, D., Aribido, J., Athavale, J., Bellarmino, N., Bernardi, P., Cantoro, R., De Sio, C., Foscale, T., Gavarini, G., Guerrero, J., Huch, M., Iaria, G., Kilian, T., Mariani, R., Martone, R., Ruospo, A., Sanchez, E., Schlichtmann, U., Squillero, G., Reorda, M. Sonza, Sterpone, L., Tancorre, V., Ugioli, R.

Source: 2022 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2022 IEEE European. :1-10 May, 2022

Relation: 2022 IEEE European Test Symposium (ETS)

An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip

Authors: Angione, F., Bernardi, P., Filipponi, G., Reorda, M. Sonza, Appello, D., Tancorre, V., Ugioli, R.

Source: 2022 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2022 IEEE European. :1-6 May, 2022

Relation: 2022 IEEE European Test Symposium (ETS)

Comparing different solutions for testing resistive defects in low-power SRAMs

Authors: Mirabella, N., Grosso, M., Franchino, G., Rinaudo, S., Deretzis, I., La Magna, A., Reorda, M. Sonza

Source: 2021 IEEE 22nd Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2021 IEEE 22nd. :1-6 Oct, 2021

Relation: 2021 IEEE 22nd Latin American Test Symposium (LATS)

System-Level Test: State of the Art and Challenges

Authors: Appello, D., Chen, H. H., Sauer, M., Polian, I., Bernardi, P., Reorda, M. Sonza

Source: 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2021 IEEE 27th International Symposium on. :1-7 Jun, 2021

Relation: 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)

Testing the Divergence Stack Memory on GPGPUs: A Modular in-Field Test Strategy

Authors: Condia, Josie E Rodriguez, Reorda, M. Sonza

Source: 2020 IFIP/IEEE 28th International Conference on Very Large Scale Integration (VLSI-SOC) Very Large Scale Integration (VLSI-SOC), 2020 IFIP/IEEE 28th International Conference on. :153-158 Oct, 2020

Relation: 2020 IFIP/IEEE 28th International Conference on Very Large Scale Integration (VLSI-SOC)

A dynamic reconfiguration mechanism to increase the reliability of GPGPUs

Authors: Rodriguez Condia, Josie E., Narducci, Pierpaolo, Reorda, M. Sonza, Sterpone, L.

Source: 2020 IEEE 38th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2020 IEEE 38th. :1-6 Apr, 2020

Relation: 2020 IEEE 38th VLSI Test Symposium (VTS)

Applicative System Level Test introduction to Increase Confidence on Screening Quality

Authors: Bernardi, P., Restifo, M., Reorda, M. Sonza, Appello, D., Bertani, C., Petrali, D.

Source: 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2020 23rd International Symposium on. :1-6 Apr, 2020

Relation: 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)