Evidence of Widely Distributed Time Constants in the Vertical Charge Loss of 3-D Charge-Trap NAND Flash Memories

Authors: Refaldi, D.G., Malavena, G., Chiavarone, L., Spinelli, A.S., Compagnoni, C.M.

Source: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(10):1811-1814 Oct, 2024

First Evidence of SET-Like Behavior of 3-D NAND Flash Cells in the Deep-Cryogenic Regime

Authors: Refaldi, D.G., Malavena, G., Giulianini, M., Chiavarone, L., Spinelli, A.S., Compagnoni, C.M.

Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(2):1066-1071 Feb, 2024