Total Ionizing Dose and Radiation Particle Strike Analysis of Nanoscale FinFET Devices and Circuits

Authors: Spoorthi, Ch., Grace, Jessy, Chavan, Ameet, Rao, Chinnam SV Maruthi

Source: 2020 4th International Conference on Electronics, Communication and Aerospace Technology (ICECA) Electronics, Communication and Aerospace Technology (ICECA), 2020 4th International Conference on. :479-484 Nov, 2020

Relation: 2020 4th International Conference on Electronics, Communication and Aerospace Technology (ICECA)