Graphene-Enhanced Single Ion Detectors for Deterministic Near-Surface Dopant Implantation in Diamond

Authors: Collins, Nicholas F. L., Jakob, Alexander M., Robson, Simon G., Lim, Shao Qi, Räcke, Paul, Johnson, Brett C., Liu, Boqing, Lu, Yuerui, Spemann, Daniel, McCallum, Jeffrey C., Jamieson, David N.

Subject Terms: Condensed Matter - Mesoscale and Nanoscale Physics, Physics - Instrumentation and Detectors, Quantum Physics

Access URL: http://arxiv.org/abs/2306.07496

Near-Surface Electrical Characterisation of Silicon Electronic Devices Using Focused keV Ions

Authors: Robson, Simon G., Räcke, Paul, Jakob, Alexander M., Collins, Nicholas, Firgau, Hannes R., Schmitt, Vivien, Mourik, Vincent, Morello, Andrea, Mayes, Edwin, Spemann, Daniel, Jamieson, David N.

Subject Terms: Condensed Matter - Mesoscale and Nanoscale Physics, Physics - Instrumentation and Detectors, Quantum Physics

Access URL: http://arxiv.org/abs/2201.11339

Color center formation by deterministic single ion implantation

Authors: Herzig, Tobias, Lühmann, Tobias, Räcke, Paul, Scheuner, Clemens, Pezzagna, Sébastien, Meijer, Jan

Source: Semiconductors and semimetals. 104:1-30

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN624959150&indx=1&recIds=ETOCRN624959150

Subdiffraction Distance Measurement of Dipolar Emitting Qubit Pairs.

Authors: Reinhardt, Dominic, Lühmann, Tobias, Räcke, Paul, Heupel, Julia, Kieschnick, Michael, Mändl, Stephan, Popov, Cyril, Meijer, Jan B., Wunderlich, Ralf

Source: ACS Photonics; 4/17/2024, Vol. 11 Issue 4, p1382-1389, 8p

Detection of small bunches of ions using image charges

Authors: Räcke, Paul, Spemann, Daniel, Gerlach, Jürgen, Rauschenbach, Bernd, Meijer, Jan

Source: Scientific reports. 8(1):1-10

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCvdc_100171388715.0x000001&indx=1&recIds=ETOCvdc_100171388715.0x000001

Chapter One - Color center formation by deterministic single ion implantation

Authors: Herzig, Tobias, Lühmann, Tobias, Räcke, Paul, Scheuner, Clemens, Pezzagna, Sébastien, Meijer, Jan

Source: In Semiconductors and Semimetals 2021 104:1-30

Nanoscale ion implantation using focussed highly charged ions.

Authors: Räcke, Paul (AUTHOR) paul.raecke@iom-leipzig.de, Wunderlich, Ralf (AUTHOR), Gerlach, Jürgen W (AUTHOR), Meijer, Jan (AUTHOR), Spemann, Daniel (AUTHOR)

Source: New Journal of Physics. Aug2020, Vol. 22 Issue 8, p1-7. 7p.

Subject Terms: *ION implantation, *ION bombardment, *ION sources, *ELECTRON beams, *IONS, *ELECTRONS

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