MBIST-HSIO Concurrent Testing Strategies and Test Challenges

Authors: Krishnan, Boopala, Mishra, Shalini, Emekar, Sumit, M, Subrahmanya, Ramanujam, Prasanna, Cu, Melvin, Pu, Linfeng

Source: 2023 IEEE International Test Conference India (ITC India) Test Conference India (ITC India), 2023 IEEE International. :1-6 Jul, 2023

Relation: 2023 IEEE International Test Conference India (ITC India)

Effect of micromechanical properties of commercial grade electrolytic copper foils on lithium-ion batteries

Authors: Fu, Denglin, Kang, Caien, Wang, Chao, Li, Mengyuan, Hu, Wenxuan, Huang, Lianhong, Long, Lulu, Wang, Zhihao, Wang, SiShuang, Tang, Ping, Jia, Xuemei, Wang, Li, Pu, Linfeng, Tao, Qiuyue, Guo, Aiping, Zhao, Yu, Tan, Bochuan

Source: In Materials Today Communications December 2024 41