Negative Bias Temperature Instability Analysis of a 15 nm p-channel Junctionless Fin Field Effect Transistor (p-JLFinFET)

Authors: Hamzah, M. Naziiruddin, Alias, N. Ezaila, Peng Tan, M. L.

Source: 2022 IEEE 20th Student Conference on Research and Development (SCOReD) Research and Development (SCOReD), 2022 IEEE 20th Student Conference on. :73-76 Nov, 2022

Relation: 2022 IEEE 20th Student Conference on Research and Development (SCOReD)

Comprehensive Analysis of Gate Oxide Short in Junctionless Fin Field Effect Transistor

Authors: Rahman, Md Wahidur, Alias, N. Ezaila, Hamzah, Afiq, Peng Tan, M. L., Kamisian, Izam

Source: 2022 IEEE International Conference on Semiconductor Electronics (ICSE) Semiconductor Electronics (ICSE), 2022 IEEE International Conference on. :73-76 Aug, 2022

Relation: 2022 IEEE International Conference on Semiconductor Electronics (ICSE)

A 2 Kbit Memory Array of Mixed-VT GC-eDRAM Implemented in 130nm Standard CMOS Technology

Authors: Abdo, Hussien, Alias, N. Ezaila, Hamzah, Afiq, Kamisian, Izam, Peng Tan, M. L., Sheikh, U. Ullah

Source: 2021 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) Micro and Nanoelectronics (RSM), 2021 IEEE Regional Symposium on. :153-156 Aug, 2021

Relation: 2021 IEEE Regional Symposium on Micro and Nanoelectronics (RSM)

An Efficient March (5n) FSM-Based Memory Built-In Self Test (MBIST) Architecture

Authors: Nguan Kong, T. S., Alias, N. Ezaila, Hamzah, Afiq, Kamisian, Izam, Peng Tan, M. L., Sheikh, U. Ullah, Wahab, Yasmin Abdul

Source: 2021 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) Micro and Nanoelectronics (RSM), 2021 IEEE Regional Symposium on. :76-79 Aug, 2021

Relation: 2021 IEEE Regional Symposium on Micro and Nanoelectronics (RSM)