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    Authors: Reinhard Kaindl (MATERIALS─Institute for Surface Technologies and Photonics, JOANNEUM RESEARCH), Tushar Gupta (Institute of Materials Chemistry, Technische Universität Wien (TU Wien)), Alexander Blümel (MATERIALS─Institute for Surface Technologies and Photonics, JOANNEUM RESEARCH), Songfeng Pei (Institute of Metal Research, Shenyang National Laboratory for Materials Science, Chinese Academy of Sciences), Peng-Xiang Hou (Institute of Metal Research, Shenyang National Laboratory for Materials Science, Chinese Academy of Sciences), Jinhong Du (Institute of Metal Research, Shenyang National Laboratory for Materials Science, Chinese Academy of Sciences), Chang Liu (Institute of Metal Research, Shenyang National Laboratory for Materials Science, Chinese Academy of Sciences), Paul Patter (MATERIALS─Institute for Surface Technologies and Photonics, JOANNEUM RESEARCH), Karl Popovic (MATERIALS─Institute for Surface Technologies and Photonics, JOANNEUM RESEARCH), David Dergez (ZKW Elektronik GmbH), Kenan Elibol (Faculty of Physics, University of Vienna), Erhard Schafler (Faculty of Physics, University of Vienna), Johan Liu (Electronics Materials and Systems Laboratory, Department of Microtechnology and Nanoscience, Chalmers University of Technology), Dominik Eder (Institute of Materials Chemistry, Technische Universität Wien (TU Wien)), Dietmar Kieslinger (ZKW Elektronik GmbH), Wencai Ren (Institute of Metal Research, Shenyang National Laboratory for Materials Science, Chinese Academy of Sciences), Paul Hartmann (MATERIALS─Institute for Surface Technologies and Photonics, JOANNEUM RESEARCH), Wolfgang Waldhauser (MATERIALS─Institute for Surface Technologies and Photonics, JOANNEUM RESEARCH), Bernhard C. Bayer (Institute of Materials Chemistry, Technische Universität Wien (TU Wien))

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    Academic Journal

    Source: Proceedings of the National Academy of Sciences of the United States of America; 5/18/2010, Vol. 107 Issue 20, p9055-9059, 5p, 2 Diagrams