Broadband Electrical Characterization of Multiwalled Carbon Nanotubes and Contacts.

Authors: Paul Rice, T. Mitch Wallis, Stephen E. Russek, Pavel Kabos

Source: Nano Letters; Apr2007, Vol. 7 Issue 4, p1086-1090, 5p

GaN nanowire coated with atomic layer deposition of tungsten: a probe for near-field scanning microwave microscopy.

Authors: Paul T Blanchard, Aric W Sanders, Samuel Berweger, Atif Imtiaz, Kevin J Coakley, Thomas M Wallis, Kris A Bertness, Pavel Kabos, Norman A Sanford, Joel C Weber, Jonas C Gertsch, Steven M George, Victor M Bright

Source: Nanotechnology; 10/17/2014, Vol. 25 Issue 41, p1-1, 1p

Subject Terms: ATOMIC layer deposition, GALLIUM nitride, NANOWIRES, TUNGSTEN, MICROSCOPY, SURFACE contamination