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1Conference
Authors: Ogi, J., Kitamura, S., Sugaya, F., Suzuki, J., Magori, A., Matsui, T., Sumita, K., Ushiku, Y., Moriyama, K., Toshima, K., Namise, T., Ozawa, H., Tsukuda, Y., Otake, Y., Hiyama, H., Matsumoto, S., Suzuki, A., Koga, F.
Source: 2024 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2024 IEEE International. :1-4 Dec, 2024
Relation: 2024 IEEE International Electron Devices Meeting (IEDM)
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2Conference
Authors: Kobayashi, E., Yasuda, H., Hayasaka, K., Otake, Y., Ono, S., Muramatsu, S.
Source: ICASSP 2023 - 2023 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP) Acoustics, Speech and Signal Processing (ICASSP), ICASSP 2023 - 2023 IEEE International Conference on. :1-5 Jun, 2023
Relation: ICASSP 2023 - 2023 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)
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3Conference
Authors: Fujisaki, Y., Tsugawa, H., Sakai, K., Kumagai, H., Nakamura, R., Ogita, T., Endo, S., Iwase, T., Takase, H., Yokochi, K., Yoshida, S., Shimada, S., Otake, Y., Wakano, T., Hiyama, H., Hagiwara, K., Arakawal, M., Matsumotol, S., Maeda, H., Sugihara, K., Takabayashi, K., Ono, M., Ishibashi, K., Yamamoto, K.
Source: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
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4Academic Journal
Authors: Yan, M., Ma, B., Hashiguchi, T., Taketani, A., Iwamoto, C., Wakabayashi, Y., Fujita, K., Takanashi, T., Takamura, M., Kobayashi, T., Ikeda, S., Mizuta, M., Ikeda, Y., Otake, Y.
Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 69(2):118-125 Feb, 2022
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5Report
Authors: Watanabe, A., Sekiguchi, K., Ino, T., Inoue, M., Nakai, S., Otake, Y., Taketani, A., Wakabayashi, Y.
Subject Terms: Nuclear Experiment, Physics - Instrumentation and Detectors
Access URL: http://arxiv.org/abs/2209.12484
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6Academic Journal
Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 68(2):110-117 Feb, 2021
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7Conference
Authors: Shimada, S., Otake, Y., Yoshida, S., Jibiki, Y., Fujii, M., Endo, S., Nakamura, R., Tsugawa, H., Fujisaki, Y., Yokochi, K., Iwase, J., Takabayashi, K., Maeda, H., Sugihara, K., Yamamoto, K., Ono, M., Ishibashi, K., Matsumoto, S., Hiyama, H., Wakano, T.
Source: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :37.3.1-37.3.4 Dec, 2022
Relation: 2022 IEEE International Electron Devices Meeting (IEDM)
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8Conference
Authors: Kaneko, Y., Muramatsu, S., Yasuda, H., Hayasaka, K., Otake, Y., Ono, S., Yukawa, M.
Source: ICASSP 2019 - 2019 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP) Acoustics, Speech and Signal Processing (ICASSP), ICASSP 2019 - 2019 IEEE International Conference on. :1872-1876 May, 2019
Relation: ICASSP 2019 - 2019 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)
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9Academic Journal
Source: IEEE Transactions on Medical Imaging IEEE Trans. Med. Imaging Medical Imaging, IEEE Transactions on. 39(4):1030-1040 Apr, 2020
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10Academic Journal
Authors: Grupp, R.B., Hegeman, R.A., Murphy, R.J., Alexander, C.P., Otake, Y., McArthur, B.A., Armand, M., Taylor, R.H.
Source: IEEE Transactions on Biomedical Engineering IEEE Trans. Biomed. Eng. Biomedical Engineering, IEEE Transactions on. 67(2):441-452 Feb, 2020
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11Report
Authors: Watanabe, A., Nakai, S., Wada, Y., Sekiguchi, K., Deltuva, A., Akieda, T., Etoh, D., Inoue, M., Inoue, Y., Kawahara, K., Kon, H., Miki, K., Mukai, T., Sakai, D., Shibuya, S., Shiokawa, Y., Taguchi, T., Umetsu, H., Utsuki, Y., Watanabe, M., Goto, S., Hatanaka, K., Hirai, Y., Ino, T., Inomoto, D., Inoue, A., Ishikawa, S., Itoh, M., Kanda, H., Kasahara, H., Kobayashi, N., Maeda, Y., Mitsumoto, S., Nakamura, S., Nonaka, K., Ong, H. J., Oshiro, H., Otake, Y., Sakai, H., Taketani, A., Tamii, A., Tran, D. T., Wakasa, T., Wakabayashi, Y., Wakui, T.
Subject Terms: Nuclear Experiment, Nuclear Theory
Access URL: http://arxiv.org/abs/2103.14271
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12Conference
Authors: Shimada, S., Otake, Y., Yoshida, S., Endo, S., Nakamura, R., Tsugawa, H., Ogita, T., Ogasahara, T., Yokochi, K., Inoue, Y., Takabayashi, K., Maeda, H., Yamamoto, K., Ono, M., Matsumoto, S., Hiyama, H., Wakano, T.
Source: 2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :20.1.1-20.1.4 Dec, 2021
Relation: 2021 IEEE International Electron Devices Meeting (IEDM)
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13Conference
Authors: Inagaki, T., Kondo, C., Masuda, K., Bokuda, Y., Tenjin, K., Tokuchi, A., Otake, Y.
Source: 2017 IEEE 21st International Conference on Pulsed Power (PPC) Pulsed Power (PPC), 2017 IEEE 21st International Conference on. :1-6 Jun, 2017
Relation: 2017 IEEE 21st International Conference on Pulsed Power (PPC)
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14Academic Journal
Authors: Mizuta, M., Takanashi, T., Otake, Y., Ueno, A., Kurashige, I., Ueda, H., Kubo, Y.
Source: In Procedia Structural Integrity 2024 64:214-219
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15Conference
Authors: Ito, K., Otake, Y., Kitano, Y., Matsumoto, A., Yamamoto, J., Ogasahara, T., Hiyama, H., Naito, R., Takeuchi, K., Tada, T., Takabayashi, K., Nakayama, H., Tatani, K., Hirano, T., Wakano, T.
Source: 2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :16.6.1-16.6.4 Dec, 2020
Relation: 2020 IEEE International Electron Devices Meeting (IEDM)
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16Academic Journal
Authors: Morita, D., Mazen, S., Tsujiko, S., Otake, Y., Sato, Y., Numajiri, T.
Source: In International Journal of Oral & Maxillofacial Surgery July 2023 52(7):787-792
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17Conference
Authors: Kojima, H., Otake, Y., Sakaki, M., Saito, H., Hasegawa, K., Hayakawa, N.
Source: 2014 International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV) Discharges and Electrical Insulation in Vacuum (ISDEIV), 2014 International Symposium on. :13-16 Sep, 2014
Relation: 2014 International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV)
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18Academic Journal
Authors: Kojima, H., Otake, Y., Takahashi, T., Hayakawa, N., Hasegawa, K., Saito, H., Sakaki, M.
Source: IEEE Transactions on Dielectrics and Electrical Insulation IEEE Trans. Dielect. Electr. Insul. Dielectrics and Electrical Insulation, IEEE Transactions on. 23(1):43-48 Feb, 2016
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19Academic Journal
Authors: Kang, X., Armand, M., Otake, Y., Yau, W-.P., Cheung, P. Y. S., Hu, Y., Taylor, R. H.
Source: IEEE Transactions on Biomedical Engineering IEEE Trans. Biomed. Eng. Biomedical Engineering, IEEE Transactions on. 61(1):149-161 Jan, 2014
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20Academic Journal
Authors: Stayman, J. W., Otake, Y., Prince, J. L., Khanna, A. J., Siewerdsen, J. H.
Source: IEEE Transactions on Medical Imaging IEEE Trans. Med. Imaging Medical Imaging, IEEE Transactions on. 31(10):1837-1848 Oct, 2012