Ultra-High Endurance (>1012) and High Drive-Current Selector in Sub-30nmΦ Cell using Stable Oxide Doped with As-Se Free High Melting-Point Compound

Authors: Matsushima, Yosuke, Iwasaki, Takeshi, Daibou, Tadaomi, Sasaki, Takayuki, Shimoda, Yutaro, Qi, Zhu, Goto, Masakazu, Sato, Yuya, Onizaki, Makoto, Nagamine, Makoto, Amano, Minoru, Kawai, Hiroki, Tokuhira, Hiroki, Chokawa, Kenta, Takashima, Rina, Tsukagoshi, Takayuki, Saitoh, Masumi, Ikeda, Keiji, Komatsu, Katsuyoshi

Source: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024

Relation: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

Superconductor connection to InAs two-dimensional electrons with accumulation edges

Authors: Onizaki, Makoto, Hashimoto, Yoshiaki, Nakamura, Taketomo, Katsumoto, Shingo

Source: 2019 Compound Semiconductor Week (CSW) Compound Semiconductor Week (CSW), 2019. :1-1 May, 2019

Relation: 2019 Compound Semiconductor Week (CSW)