Mid-order wavefront control for exoplanet imaging: preliminary characterization of the segmented deformable mirror and Zernike wavefront sensor on HiCAT

Authors: Buralli, B., N'Diaye, M., Pourcelot, R., Carbillet, M., Por, E. H., Laginja, I., Canas, L., Steiger, S., Petrone, P., Nguyen, M. M., Nickson, B., Redmond, S. F., Sahoo, A., Pueyo, L., Perrin, M. D., Soummer, R.

Subject Terms: Astrophysics - Instrumentation and Methods for Astrophysics

Access URL: http://arxiv.org/abs/2409.03411

JWST/MIRI coronagraphic performances as measured on-sky

Authors: Boccaletti, A., Cossou, C., Baudoz, P., Lagage, P. O., Dicken, D., Glasse, A., Hines, D. C., Aguilar, J., Detre, O., Nickson, B., Noriega-Crespo, A., Gáspár, A., Labiano, A., Stark, C., Rouan, D., Reess, J. M., Wright, G. S., Rieke, G., Marin, M. Garcia

Source: A&A 667, A165 (2022)

Subject Terms: Astrophysics - Instrumentation and Methods for Astrophysics, Astrophysics - Earth and Planetary Astrophysics

Access URL: http://arxiv.org/abs/2207.11080

Modeling the response of the ESAPMOS4 RADFETs for the ALPHASAT CTTB experiment

Authors: Goncalves, P., Keating, A., Trindade, A., Rodrigues, P., Ferreira, M., Assis, P., Muschitiello, M., Nickson, B., Poivey, C.

Source: 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on. :1-5 Sep, 2013

Relation: 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

Influence of beam conditions and energy for SEE testing

Authors: Ferlet-Cavrois, V., Schwank, J. R., Liu, S., Muschitiello, M., Beutier, Th., Javanainen, A., Hedlund, A., Poivey, C., Zadeh, A., Harboe-Sorensen, R., Santin, G., Nickson, B., Menicucci, A., Binois, C., Peyre, D., Hoeffgen, S. K., Metzger, S., Schardt, D., Kettunen, H., Virtanen, A., Berger, G., Piquet, B., Foy, J.-C., Zafrani, M., Truscott, P., Poizat, M., Bezerra, F.

Source: 2011 12th European Conference on Radiation and Its Effects on Components and Systems Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on. :690-699 Sep, 2011

Relation: 2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

Modeling the Response of the ESAPMOS4 RADFETs for the ALPHASAT CTTB Experiment

Authors: Goncalves, P., Keating, A., Trindade, A., Rodrigues, P., Ferreira, M., Assis, P., Muschitiello, M., Nickson, B., Poivey, C.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 61(3):1439-1443 Jun, 2014

Influence of Beam Conditions and Energy for SEE Testing

Authors: Ferlet-Cavrois, V., Schwank, J. R., Liu, S., Muschitiello, M., Beutier, T., Javanainen, A., Hedlund, A., Poivey, C., Mohammadzadeh, A., Harboe-Sorensen, R., Santin, G., Nickson, B., Menicucci, A., Binois, C., Peyre, D., Hoeffgen, S. K., Metzger, S., Schardt, D., Kettunen, H., Virtanen, A., Berger, G., Piquet, B., Foy, J.-C., Zafrani, M., Truscott, P., Poizat, M., Bezerra, F.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 59(4):1149-1160 Aug, 2012

TID Test of an 8-Gbit NAND Flash Memory

Authors: Schmidt, H., Grurmann, K., Nickson, B., Gliem, F., Harboe-Sorensen, R.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 56(4):1937-1940 Aug, 2009

Radiation effects testing facility in PSI low energy OPTIS area

Authors: Hajdas, W., Zehnder, A., Burri, F., Bialkowski, J., Adams, L., Nickson, B., Harboe-Sorensen, R.

Source: 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385) Radiation effects data workshop Radiation Effects Data Workshop, 1998. IEEE. :152-155 1998

Relation: 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference

Radiation testing of flight lots for MARS-94 covering-semiconductor types as 4 M-BIT DRAM, 256 K-BIT SRAM, 256 K-BIT EEPROM and a 53C90 SCSI controller

Authors: Harboe-Sorensen, R., Vuilleumier, P., Adams, L., Nickson, B., Muller, R.

Source: RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) Radiation and its effects on components and systems Radiation and its Effects on Components and Systems, 1993.,RADECS 93., Second European Conference on. :490-498 1993

Relation: Proceedings of 2nd European Conference Radiations and their Effects on Devices and Systems (RADECS 93)

Radiation pre-screening of 4 Mbit dynamic random access memories for space application

Authors: Harboe-Sorensen, R., Muller, R., Daly, E., Nickson, B., Schmitt, J., Rombeck, F.J.

Source: RADECS 91 First European Conference on Radiation and its Effects on Devices and Systems Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on. :489-504 1991

Relation: RADECS 91 First European Conference on Radiation and its Effects on Devices and Systems

TID and SEE Tests of an Advanced 8 Gbit NAND-Flash Memory

Authors: Schmidt, H., Walter, D., Gliem, F., Nickson, B., Harboe-Sorensen, R., Virtanen, A.

Source: 2008 IEEE Radiation Effects Data Workshop Radiation Effects Data Workshop, 2008 IEEE. :38-41 Jul, 2008

Relation: 2008 IEEE Radiation Effects Data Workshop

Modelling Packaging Effects on Proton Irradiation Response of NMRC RadFETs-New GEANT4 Simulations and Co-60 Irradiations
Radiation and its effects on components and systems; RADECS 2003

Authors: Keating, A., Mohammadzadeh, A., Nickson, B., Jaksic, A., Hajdas, W.

Source: EUROPEAN SPACE AGENCY -PUBLICATIONS- ESA SP. 536:457-464

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN053904062&indx=1&recIds=ETOCCN053904062

Teaching human resource management In hospitality and tourism: a critique

Authors: Baum, T., Nickson, B. D.

Source: INTERNATIONAL JOURNAL OF CONTEMPORARY HOSPITALITY MANAGEMENT. 10(2/3):75-79

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN043999461&indx=1&recIds=ETOCRN043999461

Proton induced radiation damage on high quality Superconducting Tunnel Junction Detectors

Authors: Rando, N., Poelaert, A., Den Hartog, R., Lumb, D., Verhoeve, P., Peacock, A., Nickson, B., Adams, L., Hajdas, W.

Source: NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION A. 394(1/2):173-179

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN031329371&indx=1&recIds=ETOCRN031329371

The Proton Irradiation Facility at the Paul Scherrer Institute
Beam Interactions with Materials and Atoms

Authors: Hajdas, W., Adams, L., Nickson, B., Zehnder, A.

Source: NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION B. 113(1/4):54-58

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN009971233&indx=1&recIds=ETOCRN009971233

The Proton Irradiation Facility at the Paul Scherrer Institute
Accelerators in applied research and technology

Authors: Hajdas, W., Adams, L., Nickson, B., Zehnder, A.

Source: NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION B. 113(1/4):54-58

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN014173754&indx=1&recIds=ETOCCN014173754

Radiation Testing of Flight Lots for MARS-94 Covering Semiconductor Types as 4 M-Bit DRAM, 256 K-Bit SRAM, 256 K-Bit EEPROM and a 53C90 SCSI Controller
RADECS 93

Authors: Harboe-Soerensen, R., Vuilleumier, P., Adams, L., Nickson, B.

Source: RADECS -EUROPEAN CONFERENCE-. :490-498

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN005753752&indx=1&recIds=ETOCCN005753752