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  1. 1
    Conference

    TCAD Based Study of String Current Variability in 3D NAND Flash Memory

    Authors: Mahapatra, Mrinmoy, Kekarjawlekar, Prathamesh Ganesh, K., Akshay

    Source: 2025 38th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID) VLSID VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID), 2025 38th International Conference on. :255-260 Jan, 2025

    Relation: 2025 38th International Conference on VLSI Design and 2025 24th International Conference on Embedded Systems (VLSID)

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  2. 2
    Academic Journal

    Piecewise Student's t-distribution Mixture Model-Based Estimation for NAND Flash Memory Channels

    Authors: Wang, C., Mei, Z., Li, J., Cai, K., Kong, L.

    Source: IEEE Signal Processing Letters IEEE Signal Process. Lett. Signal Processing Letters, IEEE. 32:451-455 2025

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  3. 3
    Academic Journal

    Straw: A Stress-Aware WL-Based Read Reclaim Technique for High-Density NAND Flash-Based SSDs

    Authors: Chun, M., Lee, J., Choi, I., Park, J., Kim, M., Kim, J.

    Source: IEEE Computer Architecture Letters IEEE Comput. Arch. Lett. Computer Architecture Letters. 24(1):5-8 Jan, 2025

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  4. 4
    Conference

    Intelligent NAND Flash Memory for In-Situ Block Health Prediction with Machine Learning

    Authors: Tian, Xuan, Li, Liang, Zhao, Sixiang, Wang, Weitian, Fu, Phoebe, Wang, Ming

    Source: 2024 International Conference on Microelectronics (ICM) Microelectronics (ICM), 2024 International Conference on. :1-5 Dec, 2024

    Relation: 2024 International Conference on Microelectronics (ICM)

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  5. 5
    Conference

    MCBGC: A Multi-Threshold Copyback-based Garbage Collection Scheme for 3D NAND Flash Memory

    Authors: Hu, Kang, Hu, Haihua, Han, Pengchao, Han, Guojun

    Source: 2024 International Conference on Networking, Architecture and Storage (NAS) Networking, Architecture and Storage (NAS), 2024 International Conference on. :1-4 Nov, 2024

    Relation: 2024 International Conference on Networking, Architecture and Storage (NAS)

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  6. 6
    Conference

    LA-Write: Balancing Endurance of Inter-Layer for Prolonging 3D NAND Flash Memory Lifetime

    Authors: Wan, Yu, Du, Yajuan, Huang, Siyi

    Source: 2024 International Conference on Networking, Architecture and Storage (NAS) Networking, Architecture and Storage (NAS), 2024 International Conference on. :1-4 Nov, 2024

    Relation: 2024 International Conference on Networking, Architecture and Storage (NAS)

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  7. 7
    Academic Journal

    Investigation of Inhibited String Characteristics According to Dimple Structures in 3D NAND Flash Memory

    Authors: Park, J., Kang, M.

    Source: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 46(3):409-411 Mar, 2025

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  8. 8
    Academic Journal

    Machine Learning-Based Prediction of Threshold Voltage Distribution Due to Lateral Migration in 3-D NAND Flash Memory

    Authors: Han, I., Kyu Lee, J., Ahn, S., Shin, H.

    Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(12):7425-7430 Dec, 2024

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  9. 9
    Academic Journal

    An Efficient Dynamic Threshold Voltage Detection Scheme for Improving 3-D NAND Flash Reliability

    Authors: Yin, L., Li, Y., Zhang, X., Zhai, X., Han, G.

    Source: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 24(4):529-543 Dec, 2024

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  10. 10
    Academic Journal

    Dynamic write-voltage design and read-voltage optimization for MLC NAND flash memory

    Authors: Runbin, Cai, Yi, Fang, Zhifang, Shi, Lin, Dai, Guojun, Han

    Source: China Communications China Commun. Communications, China. 21(12):297-308 Dec, 2024

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  11. 11
    Academic Journal

    ECCPM: An Efficient Internal Data Migration Scheme for Flash Memory Systems

    Authors: Hu, H., Han, G., Wu, W., Zhou, Y., Liu, C.

    Source: IEEE Transactions on Consumer Electronics IEEE Trans. Consumer Electron. Consumer Electronics, IEEE Transactions on. 70(4):6519-6532 Nov, 2024

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  12. 12
    Academic Journal

    A New Semi-Analytical Model for Erase Transients of 3-D Gate-All-Around (GAA) NAND Flash Memories

    Authors: Yoo, J., Choi, H., Shin, H.

    Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(11):6665-6671 Nov, 2024

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  13. 13
    Academic Journal

    LLD: Lightweight Latency Decrease Scheme of LDPC Hard Decision Decoding for 3-D TLC NAND Flash Memory

    Authors: Wei, D., Wang, Y., Feng, H., Xiang, H., Qiao, L.

    Source: IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 71(10):4611-4623 Oct, 2024

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  14. 14
    Academic Journal

    Decomposition of Charge Loss Mechanisms in 3-D Nand Flash Memory: Impact of Cell Dimension via High-Temperature Long-Term Retention Characteristics

    Authors: Park, J., Yoon, G., Go, D., Kim, D., Chul Sagong, H.C., Kim, J., Lee, J.

    Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(10):6040-6048 Oct, 2024

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  15. 15
    Academic Journal

    Comprehensive Characterization Method for Modeling Retention Transients in NAND Flash Memory

    Authors: Liu, W., Chiu, Y., Takeshita, T., Shirota, R.

    Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(10):6003-6008 Oct, 2024

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  16. 16
    Academic Journal

    Evidence of Widely Distributed Time Constants in the Vertical Charge Loss of 3-D Charge-Trap NAND Flash Memories

    Authors: Refaldi, D.G., Malavena, G., Chiavarone, L., Spinelli, A.S., Compagnoni, C.M.

    Source: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(10):1811-1814 Oct, 2024

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  17. 17
    Conference

    Construction of Spatially Coupled GC-LDPC Code for NAND Flash Memory

    Authors: Mo, Jinhong, Zhai, Xiongfei, Yu, Min, Fang, Yi, Han, Guojun

    Source: 2024 IEEE/CIC International Conference on Communications in China (ICCC) Communications in China (ICCC), 2024 IEEE/CIC International Conference on. :944-949 Aug, 2024

    Relation: 2024 IEEE/CIC International Conference on Communications in China (ICCC)

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  18. 18
    Conference

    On the Synthesis of Channel Codes for NAND flash devices in Space Application

    Authors: G, Achala, Srihari, Pathipati, Acharya, U Shripathi

    Source: 2024 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT) Electronics, Computing and Communication Technologies (CONECCT), 2024 IEEE International Conference on. :1-6 Jul, 2024

    Relation: 2024 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT)

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  19. 19
    Conference

    Improving the Sustainability of Solid-State Drives by Prolonging Lifetime

    Authors: Ke, Zhaokang, Kang, Dingyi, Yuan, Bo, Du, David, Li, Bingzhe

    Source: 2024 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) ISVLSI VLSI (ISVLSI), 2024 IEEE Computer Society Annual Symposium on. :502-507 Jul, 2024

    Relation: 2024 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)

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  20. 20
    Conference

    Comprehensive physics-based modeling of post-cycling long-term data retention in 176L 3-D NAND Flash Memories

    Authors: Thakor, Karansingh, Rangarajan, Nikhil, Diwakar, Himanshu, Saikia, Rashmi, Samadder, Tarun, Mahapatra, Souvik, Raghunathan, Shyam, Dong, Yingda

    Source: 2024 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2024 IEEE International. :1-4 May, 2024

    Relation: 2024 IEEE International Memory Workshop (IMW)

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