Showing 1 - 20 results of 7,064 Refine Results
  1. 1
    Academic Journal

    Source: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 74:1-10 2025

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  4. 4
    Academic Journal

    Source: IEEE Open Journal of the Industrial Electronics Society IEEEĀ Open J. Ind. Electron. Soc. Industrial Electronics Society, IEEE Open Journal of the. 5:1221-1238 2024

  5. 5
    Academic Journal

    Source: IEEE Transactions on Geoscience and Remote Sensing IEEE Trans. Geosci. Remote Sensing Geoscience and Remote Sensing, IEEE Transactions on. 62:1-16 2024

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  6. 6
    Academic Journal

    Source: IEEE Geoscience and Remote Sensing Letters IEEE Geosci. Remote Sensing Lett. Geoscience and Remote Sensing Letters, IEEE. 21:1-5 2024

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  9. 9
    Academic Journal
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    Report

    Authors: BABAR Collaboration, Lees, J. P., Poireau, V., Tisserand, V., Grauges, E., Palano, A., Eigen, G., Brown, D. N., Kolomensky, Yu. G., Fritsch, M., Koch, H., Cheaib, R., Hearty, C., Mattison, T. S., McKenna, J. A., So, R. Y., Blinov, V. E., Buzykaev, A. R., Druzhinin, V. P., Golubev, V. B., Kozyrev, E. A., Kravchenko, E. A., Onuchin, A. P., Serednyakov, S. I., Skovpen, Yu. I., Solodov, E. P., Todyshev, K. Yu., Lankford, A. J., Dey, B., Gary, J. W., Long, O., Eisner, A. M., Lockman, W. S., Vazquez, W. Panduro, Chao, D. S., Cheng, C. H., Echenard, B., Flood, K. T., Hitlin, D. G., Kim, J., Li, Y., Lin, D. X., Middleton, S., Miyashita, T. S., Ongmongkolkul, P., Oyang, J., Porter, F. C., Rƶhrken, M., Huard, Z., Meadows, B. T., Pushpawela, B. G., Sokoloff, M. D., Sun, L., Smith, J. G., Wagner, S. R., Bernard, D., Verderi, M., Bettoni, D., Bozzi, C., Calabrese, R., Cibinetto, G., Fioravanti, E., Garzia, I., Luppi, E., Santoro, V., Calcaterra, A., de Sangro, R., Finocchiaro, G., Martellotti, S., Patteri, P., Peruzzi, I. M., Piccolo, M., Rotondo, M., Zallo, A., Passaggio, S., Patrignani, C., Shuve, B. J., Lacker, H. M., Bhuyan, B., Mallik, U., Chen, C., Cochran, J., Prell, S., Gritsan, A. V., Arnaud, N., Davier, M., Diberder, F. Le, Lutz, A. M., Wormser, G., Lange, D. J., Wright, D. M., Coleman, J. P., Gabathuler, E., Hutchcroft, D. E., Payne, D. J., Touramanis, C., Bevan, A. J., Di Lodovico, F., Sacco, R., Cowan, G., Banerjee, Sw., Davis, C. L., Denig, A. G., Gradl, W., Griessinger, K., Hafner, A., Schubert, K. R., Barlow, R. J., Lafferty, G. D., Cenci, R., Jawahery, A., Roberts, D. A., Cowan, R., Robertson, S. H., Seddon, R. M., Neri, N., Palombo, F., Cremaldi, L., Godang, R., Summers, D. J., Taras, P., De Nardo, G., Sciacca, C., Raven, G., Jessop, C. P., LoSecco, J. M., Honscheid, K., Kass, R., Gaz, A., Margoni, M., Posocco, M., Simi, G., Simonetto, F., Stroili, R., Akar, S., Ben-Haim, E., Bomben, M., Bonneaud, G. R., Calderini, G., Chauveau, J., Marchiori, G., Ocariz, J., Biasini, M., Manoni, E., Rossi, A., Batignani, G., Bettarini, S., Carpinelli, M., Casarosa, G., Chrzaszcz, M., Forti, F., Giorgi, M. A., Lusiani, A., Oberhof, B., Paoloni, E., Rama, M., Rizzo, G., Walsh, J. J., Zani, L., Smith, A. J. S., Anulli, F., Faccini, R., Ferrarotto, F., Ferroni, F., Pilloni, A., Piredda, G., BĆ¼nger, C., Dittrich, S., GrĆ¼nberg, O., HeƟ, M., Leddig, T., VoƟ, C., Waldi, R., Adye, T., Wilson, F. F., Emery, S., Vasseur, G., Aston, D., Cartaro, C., Convery, M. R., Dorfan, J., Dunwoodie, W., Ebert, M., Field, R. C., Fulsom, B. G., Graham, M. T., Hast, C., Innes, W. R., Kim, P., Leith, D. W. G. S., Luitz, S., MacFarlane, D. B., Muller, D. R., Neal, H., Ratcliff, B. N., Roodman, A., Sullivan, M. K., Va'vra, J., Wisniewski, W. J., Purohit, M. V., Wilson, J. R., Randle-Conde, A., Sekula, S. J., Ahmed, H., Tasneem, N., Bellis, M., Burchat, P. R., Puccio, E. M. T., Alam, M. S., Ernst, J. A., Gorodeisky, R., Guttman, N., Peimer, D. R., Soffer, A., Spanier, S. M., Ritchie, J. L., Schwitters, R. F., Izen, J. M., Lou, X. C., Bianchi, F., De Mori, F., Filippi, A., Gamba, D., Lanceri, L., Vitale, L., Martinez-Vidal, F., Oyanguren, A., Albert, J., Beaulieu, A., Bernlochner, F. U., King, G. J., Kowalewski, R., Lueck, T., Miller, C., Nugent, I. M., Roney, J. M., Sobie, R. J., Gershon, T. J., Harrison, P. F., Latham, T. E., Prepost, R., Wu, S. L.

    Source: PHYS. REV. D 107, 092001 (2023)

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  14. 14
    Conference

    Source: 2021 IEEE 15th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG) Compatibility, Power Electronics and Power Engineering (CPE-POWERENG), 2021 IEEE 15th International Conference on. :1-7 Jul, 2021

    Relation: 2021 IEEE 15th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG)

  15. 15
  16. 16
    Academic Journal

    Source: IEEE Geoscience and Remote Sensing Letters IEEE Geosci. Remote Sensing Lett. Geoscience and Remote Sensing Letters, IEEE. 19:1-5 2022

  17. 17
    Academic Journal

    Source: IEEE Transactions on Electromagnetic Compatibility IEEE Trans. Electromagn. Compat. Electromagnetic Compatibility, IEEE Transactions on. 63(6):2134-2142 Dec, 2021

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    Conference

    Source: 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz) Infrared, Millimeter and Terahertz Waves (IRMMW-THz),2022 47th International Conference on. :1-2 Aug, 2022

    Relation: 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz)

  20. 20
    Conference

    Source: 2019 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2019 IEEE. :1-4 Oct, 2019

    Relation: 2019 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)