Catastrophic SEE in high-voltage power MOSFETs

Authors: Selva, L.E., Scheick, L.Z., McClure, S., Miyahira, T., Guertin, S.M., Shah, S.K., Edmonds, L.D., Patterson, J.D.

Source: 2003 IEEE Radiation Effects Data Workshop Radiation effects data workshop Radiation Effects Data Workshop, 2003. IEEE. :113-120 2003

Relation: 2003 IEEE Radiation Effects Data Workshop

A Rad-Hard Miniaturized Switching Module for High-Voltage Applications

Authors: Adell, P. C., Vo, T., Del Castillo, L., Miyahira, T., Thornbourn, D., Mojarradi, M.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 57(6):3596-3601 Dec, 2010

Low Dose Rate Effects in Shallow Trench Isolation Regions

Authors: Johnston, A. H., Swimm, R. T., Miyahira, T. F.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 57(6):3279-3287 Dec, 2010

Optocouplers: Fundamentals and Hardness Assurance for Space Applications

Authors: Johnston, A. H., Harris, R. D., Miyahira, T. F.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 56(6):3310-3317 Dec, 2009

Total Dose Effects in CMOS Trench Isolation Regions

Authors: Johnston, A. H., Swimm, R. T., Allen, G. R., Miyahira, T. F.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 56(4):1941-1949 Aug, 2009

Investigation of Single-Event Transients in Linear Voltage Regulators

Authors: Irom, F., Miyahira, T. F., Adell, P. C., Laird, J. S., Conder, B., Pouget, V., Essely, F.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 55(6):3352-3359 Dec, 2008

LED Technologies for Optocouplers: Fundamental Issues and Hardness Assurance

Authors: Johnston, A. H., Miyahira, T. F.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 54(6):2450-2456 Dec, 2007

Radiation Damage in Power MOSFET Optocouplers

Authors: Johnston, A. H., Miyahira, T. F.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 54(4):1104-1109 Aug, 2007

Single-Event Transients in Voltage Regulators

Authors: Johnston, A. H., Miyahira, T. F., Irom, F., Laird, J. S.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 53(6):3455-3461 Dec, 2006

Update of single event failure in power MOSFETs

Authors: Nichols, D.K., Coss, J.R., Miyahira, T., Titus, J., Oberg, D., Wert, J., Majewski, P., Lintz, J.

Source: 1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference Radiation effects data workshop Radiation Effects Data Workshop, 1996., IEEE. :67-72 1996

Relation: 1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference

Angular and energy dependence of proton upset in optocouplers

Authors: Johnston, A.H., Miyahira, T., Swift, G.M., Guertin, S.M., Edmonds, L.D.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 46(6):1335-1341 Dec, 1999

Displacement damage in bipolar linear integrated circuits

Authors: Rax, B.G., Johnston, A.H., Miyahira, T.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 46(6):1660-1665 Dec, 1999

Breakdown of gate oxides during irradiation with heavy ions

Authors: Johnston, A.H., Swift, G.M., Miyahira, T., Edmonds, L.D.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 45(6):2500-2508 Dec, 1998

Single-event upset effects in optocouplers

Authors: Johnston, A.H., Swift, G.M., Miyahira, T., Guertin, S., Edmonds, L.D.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 45(6):2867-2875 Dec, 1998

Late-News Poster: Thermal Durability of Poly-Si Films on Highly Engineered Glass for RTA Processes Enabling Advanced TFTs
Society for Information Display

Authors: Itoh, T., Mugiraneza, J.D., Miyahira, T., Sakamoto, A., Chen, Y., Okada, T., Noguchi, T.

Source: SID INTERNATIONAL SYMPOSIUM DIGEST OF TECHNICAL PAPERS. 41 NUMBER 3:1486-1489

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN076409673&indx=1&recIds=ETOCCN076409673

Electrical Activation of Boron in Si Film Using Excimer Laser Annealing
Special issue on the 4th international thin-film transistors conference

Authors: Noguchi, T., Kawai, K., Miyahira, T., Suzuki, T., Sato, M.

Source: JOURNAL- KOREAN PHYSICAL SOCIETY. 54(1):463-466

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN071293931&indx=1&recIds=ETOCCN071293931

Drastic Activation of Dopant in Si Film Using ELA for High-Performance TFT
International display workshops; IDW '07

Authors: Noguchi, T., Kawai, K., Kinjo, E., Nakamura, R., Miyahira, T., Kakazu, J., Suzuki, T., Sato, M.

Source: PROCEEDINGS OF THE INTERNATIONAL DISPLAY WORKSHOPS. CONF 14:1885-1888

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN067946606&indx=1&recIds=ETOCCN067946606

Single event transient analysis of an SOI operational amplifier for use in low-temperature Martian exploration
International conference on nuclear microprobe technology and applications

Authors: Laird, J. S., Scheick, L., Vizkelethy, G., Mojarradi, M. M., Miyahira, T., Chen, Y., Blalock, B., Greenwell, R., Terry, S., Doyle, B.

Source: NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION B. 260(1):281-287

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN064954707&indx=1&recIds=ETOCCN064954707

Hardness Assurance Methods for Radiation Degradation of Optocouplers
IEEE nuclear and space radiation effects conference

Authors: Johnston, A. H., Miyahira, T. F.

Source: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 52(NO 6):2649-2656

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN058990940&indx=1&recIds=ETOCCN058990940

Catastrophic Latchup in a CMOS Operational Amplifier
IEEE nuclear and space radiation effects conference

Authors: Irom, F., Miyahira, T. F.

Source: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 52(NO 6):2475-2480

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN058990680&indx=1&recIds=ETOCCN058990680