Showing 1 - 20 results of 404 Refine Results
  1. 1
    Periodical

    Authors: Miller, J.W.

    Source: CHOICE: Current Reviews for Academic Libraries. August, 2024, Vol. 61 Issue 12, p1244, 2 p.

  2. 2
    Conference

    Source: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) Electrical overstress/electrostatic discharge symposium Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000. :308-317 2000

    Relation: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000

  3. 3
  4. 4
    Conference

    Source: Proceedings Electrical Overstress/Electrostatic Discharge Symposium Electrical overstress/electrostatic discharge symposium Electrical Overstress/Electrostatic Discharge Symposium,1997. Proceedings. :356-365 1997

    Relation: Proceedings of 18th Annual Electrical Overstress/Electrostatic Discharge Symposium

  5. 5
    Conference

    Source: Proceedings of CICC 97 - Custom Integrated Circuits Conference Custom integrated circuits Custom Integrated Circuits Conference, 1997., Proceedings of the IEEE 1997. :35-38 1997

    Relation: Proceedings of CICC 97 - Custom Integrated Circuits Conference

  6. 6
    Conference

    Source: Technology-Based Re-Engineering Engineering Education Proceedings of Frontiers in Education FIE'96 26th Annual Conference Frontiers in education Frontiers in Education Conference, 1996. FIE '96. 26th Annual Conference., Proceedings of. 1:319-322 vol.1 1996

    Relation: Technology-Based Re-Engineering Engineering Education Proceedings of Frontiers in Education FIE'96 26th Annual Conference

  7. 7
    Conference

    Source: Proceeding of Fourth International Conference on Spoken Language Processing. ICSLP '96 Spoken language processing Spoken Language, 1996. ICSLP 96. Proceedings., Fourth International Conference on. 1:390-393 vol.1 1996

    Relation: Proceeding of Fourth International Conference on Spoken Language Processing. ICSLP '96

  8. 8
    Conference

    Source: International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report, 1993 International. :208-214 1993

    Relation: International Integrated Reliability Workshop Final Report

  9. 9
    Conference

    Source: International Report on Wafer Level Reliability Workshop Wafer Level Reliability Workshop, 1992. Final Report., 1992 International. :151-162 1992

    Relation: International Report on Wafer Level Reliability Workshop

  10. 10
    Conference

    Source: International Report on Wafer Level Reliability Workshop Wafer Level Reliability Workshop, 1992. Final Report., 1992 International. :223-228 1992

    Relation: International Report on Wafer Level Reliability Workshop

  11. 11
    Conference

    Source: IJCNN-91-Seattle International Joint Conference on Neural Networks Neural Networks, 1991., IJCNN-91-Seattle International Joint Conference on. i:881-886 vol.1 1991

    Relation: 1991-Seattle International Joint Conference on Neural Networks

  12. 12
  13. 13
    Conference

    Source: Proceedings. Twenty-Second Annual conference Frontiers in Education Frontiers in Education, 1992. Proceedings. Twenty-Second Annual conference. :600-602 1992

    Relation: Proceedings. Twenty-Second Annual conference Frontiers in Education

  14. 14
    Academic Journal

    Source: IEEE Transactions on Information Theory IEEE Trans. Inform. Theory Information Theory, IEEE Transactions on. 39(4):1404-1408 Jul, 1993

  15. 15
    Academic Journal
  16. 16
    Periodical
  17. 17
  18. 18
    Academic Journal

    Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 37(8):1842-1851 Aug, 1990

  19. 19
    Academic Journal

    Source: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 18(11):509-511 Nov, 1997

  20. 20
    Academic Journal