Investigation of the Intercalation and Deintercalation of Lithium Ions in a Thin-Film Lithium-Ion Battery by Rutherford Backscattering Spectrometry.

Authors: Kurbatov, S. V., Melesov, N. S., Parshin, E. O., Rudy, A. S., Mironenko, A. A., Naumov, V. V., Skundin, A. M., Bachurin, V. I.

Source: Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques; Dec2024, Vol. 18 Issue 6, p1374-1381, 8p

Analyzing Products of the Electrochemical Exfoliation of Graphite via Rutherford Backscattering Spectrometry and X-Ray Diffractometry

Authors: Savinsky, N. G., Melesov, N. S., Parshin, E. O., Vasiliev, S. V., Bachurin, V. I., Churilov, A. B.

Source: Bulletin of the Russian Academy of Sciences.Physics. 84(6):732-735

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Study of Multilayer Thin Film Structures by Rutherford Backscattering Spectrometry

Authors: Bachurin, V. I., Melesov, N. S., Parshin, E. O., Rudy, A. S., Churilov, A. B.

Source: Technical physics letters. 45(6):609-612

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Dislocation-Related Photoluminescence in Silicon Implanted with Germanium Ions

Authors: Sobolev, N. A., Kalyadin, A. E., Sakharov, V. I., Serenkov, I. T., Shek, E. I., Parshin, E. O., Melesov, N. S., Simakin, C. G.

Source: Semiconductors. 53(2):156-159

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Depth Profiling of Layered Si−O−Al Thin Films with Secondary Ion Mass Spectrometry and Rutherford Backscattering Spectrometry

Authors: Bachurin, V. I., Melesov, N. S., Mironenko, A. A., Parshin, E. O., Rudy, A. S., Simakin, S. G., Churilov, A. B.

Source: Journal of surface investigation. 13(2):300-305

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The opportunities of Rutherford backscattering spectroscopy for analysis of multilayer nanometer thin film structures
International Conference on Micro- and Nano-Electronics 2018

Authors: Bachurin, V., Churilov, A., Melesov, N., Parshin, E., Rudy, A., Trushin, O.

Source: Proceedings of SPIE, the International Society for Optical Engineering. 11022:110221I-110221I-8

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Influence of Annealing Temperature on Electrically Active Centers in Silicon Implanted with Germanium Ions

Authors: Sobolev, N. A., Aleksandrov, O. V., Sakharov, V. I., Serenkov, I. T., Shek, E. I., Kalyadin, A. E., Parshin, E. O., Melesov, N. S.

Source: Semiconductors. 53(2):153-155

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The opportunities of Rutherford backscattering spectroscopy for analysis of multilayer nanometer thin film structures

Authors: Lukichev, Vladimir F., Rudenko, Konstantin V., Bachurin, V., Churilov, A., Melesov, N., Parshin, E., Rudy, A., Trushin, O.

Source: Proceedings of SPIE; March 2019, Vol. 11022 Issue: 1 p110221I-110221I-8, 991998p