On the Role of NBTI and PBTI Induced Mobility Degradation for Compact Modeling in Metal-Gate/High-k FETs

Authors: Bogner, Christian, Reisinger, Hans, Lahbib, Insaf, Martin, Andreas, Gustin, Wolfgang, Grasser, Tibor, Schlunder, Christian

Source: 2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-7 Oct, 2023

Relation: 2023 IEEE International Integrated Reliability Workshop (IIRW)

Restrictive antenna rules limiting PID degradation for MOS transistors with connected MIM-capacitors

Authors: Martin, Andreas, Pham, Phi-Long, Nielen, Heiko, Feil, Maximilian W.

Source: 2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-6 Oct, 2023

Relation: 2023 IEEE International Integrated Reliability Workshop (IIRW)

Low-Cost Transition from Chip to Waveguide for E-band

Authors: Eriksson, Klas, Dahl, Torbjorn, Lindman, Richard, Martin, Andreas, Andersson, Kristoffer

Source: 2023 53rd European Microwave Conference (EuMC) Microwave Conference (EuMC), 2023 53rd European. :110-113 Sep, 2023

Relation: 2023 53rd European Microwave Conference (EuMC)

Magnetic particle imaging angiography of the femoral artery in a human cadaveric perfusion model

Authors: Viktor Hartung, Philipp Gruschwitz, Anne Marie Augustin, Jan-Peter Grunz, Florian Kleefeldt, Dominik Peter, Süleyman Ergün, Johanna Günther, Teresa Reichl, Thomas Kampf, Martin Andreas Rückert, Stefan Herz, Volker Christian Behr, Thorsten Alexander Bley, Patrick Vogel

Source: Communications Medicine, Vol 5, Iss 1, Pp 1-10 (2025)

Subject Terms: Medicine

File Description: electronic resource

Relation: https://doaj.org/toc/2730-664X

Access URL: https://doaj.org/article/7b528a1b52ca422bb54a92ae71ae4c70

Plasma Processing Induced Charging Damage (PID) Discussion Group

Authors: Martin, Andreas

Source: 2022 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2022 IEEE International. :1-11 Oct, 2022

Relation: 2022 IEEE International Integrated Reliability Workshop (IIRW)

Anomaly of NBTI data for PMOS transistors degraded by plasma processing induced charging damage (PID)

Authors: Martin, Andreas, Valdman, Lukas, Stafford, Benjamin Hamilton, Nielen, Heiko

Source: 2022 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2022 IEEE International. :1-6 Oct, 2022

Relation: 2022 IEEE International Integrated Reliability Workshop (IIRW)

Plasma induced charging damage (PID) from well charging in a BCD technology with deep trenches causing MOS device reliability lifetime degradation

Authors: Martin, Andreas, Berger, Johannes, Kamp, Angelika, Nielen, Heiko

Source: 2022 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2022 IEEE International. :1-7 Oct, 2022

Relation: 2022 IEEE International Integrated Reliability Workshop (IIRW)

New Design Optimized and IC Area Efficient Rules for the Prevention of Plasma Processing Induced Damage on CMOS Circuit Reliability

Authors: Martin, Andreas, Schuler, Bernd, Ankele, Benno, Nielen, Heiko

Source: 2022 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2022 IEEE International. :1-6 Oct, 2022

Relation: 2022 IEEE International Integrated Reliability Workshop (IIRW)

Plasma processing induced charging damage (PID) assessment with appropriate fWLR stress methods ensuring expected MOS reliability and lifetimes for automotive products (Invited)

Authors: Martin, Andreas

Source: 2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :1-11 Mar, 2022

Relation: 2022 IEEE International Reliability Physics Symposium (IRPS)

Reliability characterisation of plasma induced charging damage (PID) for MOS transistors of a silicon on insulator (SOI) process using product relevant test structures and fWLR methods

Authors: Martin, Andreas, Kamp, Angelika, Berger, Johannes

Source: 2021 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2021 IEEE International. :1-6 Oct, 2021

Relation: 2021 IEEE International Integrated Reliability Workshop (IIRW)

Plasma induced charging damage: From appropriate MOS test structures to antenna design rules, a comprehensive process qualification procedure

Authors: Martin, Andreas

Source: 2020 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2020 IEEE International. :1-8 Oct, 2020

Relation: 2020 IEEE International Integrated Reliability Workshop (IIRW)

A New Implementation Approach for Reliability Design Rules against Plasma Induced Charging Damage from Well Configurations of Complex ICs

Authors: Martin, Andreas, Kamp, Angelika

Source: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-9 Apr, 2020

Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

Anomaly detection via Gumbel Noise Score Matching

Authors: Ahsan Mahmood, Junier Oliva, Martin Andreas Styner

Source: Frontiers in Artificial Intelligence, Vol 7 (2024)

Subject Terms: anomaly, detection, categorical, unsupervised, tabular, score matching, Electronic computers. Computer science, QA75.5-76.95

File Description: electronic resource

Relation: https://www.frontiersin.org/articles/10.3389/frai.2024.1441205/full; https://doaj.org/toc/2624-8212

Access URL: https://doaj.org/article/4bf59d74cd1445abb9a099f0b1a61508

New Hybrid Techniques for Business Recommender Systems

Authors: Pande, Charuta, Witschel, Hans Friedrich, Martin, Andreas

Subject Terms: Computer Science - Information Retrieval, Computer Science - Artificial Intelligence

Access URL: http://arxiv.org/abs/2109.13922

Introduction

Authors: Lucarelli, Rita, Stadler, Martin Andreas

Contributors: Lucarelli, Rita, book editor, Stadler, Martin Andreas, book editor

Source: The Oxford Handbook of the Egyptian Book of the Dead.

Availability: https://doi.org/10.1093/oxfordhb/9780190210007.013.30

The Book of the Dead as a Source for the Study of Ancient Egyptian ReligionMethodology, Problems, Prospects

Authors: Stadler, Martin Andreas

Contributors: Lucarelli, Rita, book editor, Stadler, Martin Andreas, book editor

Source: The Oxford Handbook of the Egyptian Book of the Dead.

Availability: https://doi.org/10.1093/oxfordhb/9780190210007.013.2

The N1 domain of the peroxisomal AAA-ATPase Pex6 is required for Pex15 binding and proper assembly with Pex1

Authors: Ali, Bashir A., Judy, Ryan M., Chowdhury, Saikat, Jacobsen, Nicole K., Castanzo, Dominic T., Carr, Kaili L., Richardson, Chris D., Lander, Gabriel C., Martin, Andreas, Gardner, Brooke M.

Source: In Journal of Biological Chemistry January 2024 300(1)

Plasma Induced Charging Damage Causing MOS Device Reliability Lifetime Degradation Originating From Well Charging of a Technology With Deep Trench Isolation

Authors: Martin, Andreas, Berger, Johannes, Kamp, Angelika, Valdman, Lukas, Lehner, Anja, Mykytenko, Sergii, Nielen, Heiko

Source: IEEE transactions on device and materials reliability. 23(3):317-327

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCvdc_100192097571.0x000001&indx=1&recIds=ETOCvdc_100192097571.0x000001

Microhydration of the adamantane cation: intracluster proton transfer to solvent in [Ad(H2O)n=1–5]+ for n ≥ 3Electronic supplementary information (ESI) available. See DOI: https://doi.org/10.1039/d3cp01514a

Authors: George, Martin Andreas Robert, Dopfer, Otto

Source: Physical chemistry chemical physics. 25(19):13593-13610

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCvdc_100183167966.0x000001&indx=1&recIds=ETOCvdc_100183167966.0x000001

Microhydrated clusters of a pharmaceutical drug: infrared spectra and structures of amantadineH+(H2O)nElectronic supplementary information (ESI) available. See DOI: https://doi.org/10.1039/d2cp04556g

Authors: George, Martin Andreas Robert, Dopfer, Otto

Source: Physical chemistry chemical physics. 25(7):5529-5549

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCvdc_100178340307.0x000001&indx=1&recIds=ETOCvdc_100178340307.0x000001