Showing 1 - 20 results of 55 Refine Results
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    Conference

    Source: Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) Design & Test Symposium (EWDTS), 2008 East-West. :25-29 Oct, 2008

    Relation: 2008 East-West Design & Test Symposium (EWDTS)

  13. 13
    Conference

    Source: Eleventh IEEE European Test Symposium (ETS'06) European Test Symposium Test Symposium, 2006. ETS '06. Eleventh IEEE European. :179-184 2006

    Relation: Eleventh IEEE European Test Symposium

  14. 14
    Conference

    Source: Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004. Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European. :154-159 2004

    Relation: Proceedings Ninth IEEE European Test Symposium

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    Conference

    Source: Fifth International Workshop on Microprocessor Test and Verification (MTV'04) Microprocessor test and verification Microprocessor Test and Verification (MTV'04), Fifth International Workshop on. :85-90 2004

    Relation: Proceedings. 5th International Workshop on Microprocessor Test and Verification. Common Challenges and Solutions

  16. 16
    Conference

    Source: Proceedings. Ninth IEEE International High-Level Design Validation and Test Workshop (IEEE Cat. No.04EX940) High-level design validation and test High-Level Design Validation and Test Workshop, 2004. Ninth IEEE International. :69-74 2004

    Relation: Proceedings. Ninth IEEE International High-Level Design Validation and Test Workshop

  17. 17
    Conference

    Source: Eighth IEEE International High-Level Design Validation and Test Workshop High-level design validation and test workshop High-Level Design Validation and Test Workshop, 2003. Eighth IEEE International. :108-113 2003

    Relation: Eighth IEEE International High-Level Design Validation and Test Workshop

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    Conference

    Source: 2005 Sixth International Workshop on Microprocessor Test and Verification Microprocessor Test and Verification, 2005. MTV '05. Sixth International Workshop on. :70-75 Nov, 2005

    Relation: 2005 Sixth International Workshop on Microprocessor Test and Verification

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    Academic Journal

    Authors: Marconcini, C1,2,3 (AUTHOR) cosimo.marconcini@unifi.it, D'Eugenio, F1,4 (AUTHOR), Maiolino, R1,4,5 (AUTHOR), Arribas, S6 (AUTHOR), Bunker, A7 (AUTHOR), Carniani, S8 (AUTHOR), Charlot, S9 (AUTHOR), Perna, M6 (AUTHOR), Rodríguez Del Pino, B6 (AUTHOR), Übler, H1,4 (AUTHOR), Willott, C J10 (AUTHOR), Böker, T11 (AUTHOR), Cresci, G3 (AUTHOR), Curti, M12 (AUTHOR), Jones, G C7 (AUTHOR), Lamperti, I2,3 (AUTHOR), Parlanti, E8 (AUTHOR), Venturi, G8 (AUTHOR)

    Source: Monthly Notices of the Royal Astronomical Society. Sep2024, Vol. 533 Issue 2, p2488-2501. 14p.