7.72 ppm/°C, ultralow power, high PSRR CMOS bandgap reference voltage

Authors: Hamouda, Assia, Arnold, Ruediger, Manck, Otto, Bouguechal, Nour-Eddine

Source: 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC) Very Large Scale Integration (VLSI-SoC), 2013 IFIP/IEEE 21st International Conference on. :364-367 Oct, 2013

Relation: 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC)

In-pixel implementation of an area-efficient analog-signal-processing for CMOS-3D image sensor

Authors: Hafiane, Mohamed Lamine, Blachnitz, Robert, Manck, Otto, Dibi, Zohir, Wagner, Wilfried

Source: 2011 Semiconductor Conference Dresden Semiconductor Conference Dresden (SCD), 2011. :1-4 Sep, 2011

Relation: 2011 Semiconductor Conference Dresden (SCD)

A new stabilisation technique for the voltage driver using the rail to rail operation in CMOS 0, 25 µm technology

Authors: Meddour, Faycal, Dibi, Zohir, Kouda, Souhil, Abdi, Mohamed Amir, Ouarghi, Meriem, Manck, Otto

Source: 2010 XIth International Workshop on Symbolic and Numerical Methods, Modeling and Applications to Circuit Design (SM2ACD) Symbolic and Numerical Methods, Modeling and Applications to Circuit Design (SM2ACD), 2010 XIth International Workshop on. :1-4 Oct, 2010

Relation: 2010 XIth International Workshop on Symbolic and Numerical Methods, Modeling and Applications to Circuit Design (SM2ACD)

A voltage driver using the rail to rail operation in CMOS 0, 25 μm technology

Authors: Meddour, Faycal, Dibi, Zohir, Kouda, Souhil, Abdi, Mohamed Amir, Manck, Otto

Source: 2008 3rd International Design and Test Workshop Design and Test Workshop, 2008. IDT 2008. 3rd International. :118-121 Dec, 2008

Relation: 2008 3rd International Design and Test Workshop (IDT)

Two-dimensional analysis of a monolithic PNP transistor

Authors: Wieder, Armin W., Manck, Otto, Engl, Walter L.

Source: 1974 International Electron Devices Meeting (IEDM) IEDM Tech. Dig. Electron Devices Meeting (IEDM), 1974 International. :414-417 Dec, 1974

Relation: 1974 International Electron Devices Meeting (IEDM)

Analysis and estimation of NEP and DR in CMOS TOF-3D image sensor based on MDSI

Authors: Hafiane, Mohamed Lamine, Wagner, Wilfried, Dibi, Zohir, Manck, Otto

Source: In Sensors & Actuators: A. Physical 2011 169(1):66-73

An Enhanced Technique for Ultrasonic Flow Metering Featuring Very Low Jitter and Offset.

Authors: Hamouda, Assia¹ (AUTHOR) hamouda@mikro.ee.tu-berlin.de, Manck, Otto¹ (AUTHOR) manck@mikro.ee.tu-berlin.de, Hafiane, Mohamed Lamine¹ (AUTHOR) hafiane_lamine@mikro.ee.tu-berlin.de, Bouguechal, Nour-Eddine² (AUTHOR) bougnour@univ-batna.dz

Source: Sensors (14248220). Jul2016, Vol. 16 Issue 7, p1008. 12p. 3 Diagrams, 11 Graphs.

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