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1Conference
Authors: Ma, H. K., Hsieh, C. H., Liao, S. K.
Source: 2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), 2017 33rd. :6-12 2017
Relation: 2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM)
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2Conference
Authors: Ma, H. K., Liao, S. K., Lee, Y. S.
Source: 2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), 2017 33rd. :144-149 2017
Relation: 2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM)
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3Conference
Thermal management of a pico projector by using a multiple fans with a piezoelectric actuator system
Authors: Ma, H. K., Liao, S. K., Lin, B. T.
Source: 2016 32nd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), 2016 32nd. :99-104 Mar, 2016
Relation: 2016 32nd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM)
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4Conference
Authors: Ma, H. K., Li, Y. T., Tan, L. K., Liu, C. L., Liao, S. K.
Source: 2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2014 30th Annual. :100-104 Mar, 2014
Relation: 2014 30th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM)
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5Conference
Authors: Ma, H. K., Liao, S. K., Li, Y. T., Li, Y. F., Liu, C. L.
Source: 2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2014 30th Annual. :159-163 Mar, 2014
Relation: 2014 30th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM)
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6Conference
Authors: Ma, H. K., Chen, C. H.
Source: 29th IEEE Semiconductor Thermal Measurement and Management Symposium Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2013 29th Annual IEEE. :33-38 Mar, 2013
Relation: 2013 IEEE/CPMT 29th Semiconductor Thermal Measurement & Management Symposium (SemiTherm)
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7Conference
Authors: Su, H. C., Liu, C. L., Pan, T. J., Ma, H. K.
Source: 29th IEEE Semiconductor Thermal Measurement and Management Symposium Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2013 29th Annual IEEE. :110-115 Mar, 2013
Relation: 2013 IEEE/CPMT 29th Semiconductor Thermal Measurement & Management Symposium (SemiTherm)
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8Conference
Authors: Ma, H. K., Luo, W. F., Su, H. C.
Source: 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2012 28th Annual IEEE. :238-242 Mar, 2012
Relation: 2012 IEEE/CPMT 28th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM)
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9Conference
Authors: Ma, H. K., Liu, C. L., Su, H. C., Ho, W. H.
Source: 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2012 28th Annual IEEE. :243-248 Mar, 2012
Relation: 2012 IEEE/CPMT 28th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM)
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10Conference
Authors: Ma, H. K., Luo, W. F., Su, H. C.
Source: 2011 International Conference on Multimedia Technology Multimedia Technology (ICMT), 2011 International Conference on. :6307-6310 Jul, 2011
Relation: 2011 International Conference on Multimedia Technology (ICMT)
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11Conference
Authors: Ma, H. K., Chen, B. R., Lan, H. W., Chao, C. Y.
Source: 2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) Semiconductor Thermal Measurement and Management Symposium, 2010. SEMI-THERM 2010. 26th Annual IEEE. :289-298 Feb, 2010
Relation: 2010 IEEE/CPMT 26th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM)
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12Conference
Authors: Ma, H. K., Chen, B. R.
Source: 2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) Semiconductor Thermal Measurement and Management Symposium, 2010. SEMI-THERM 2010. 26th Annual IEEE. :59-67 Feb, 2010
Relation: 2010 IEEE/CPMT 26th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM)
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13Conference
Authors: Ma, H. K., Hou, B. R., Gao, J. J., Lin, C. Y., Kou, M. C.
Source: 2008 Twenty-fourth Annual IEEE Semiconductor Thermal Measurement and Management Symposium Semiconductor Thermal Measurement and Management Symposium, 2008. Semi-Therm 2008. Twenty-fourth Annual IEEE. :124-131 Mar, 2008
Relation: 2008 Twenty-fourth Annual IEEE Semiconductor Thermal Measurement and Management Symposium
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14Conference
Authors: Ma, H. K., Hou, B. R., Wu, H. Y., Lin, C.Y., Gao, J. J.
Source: Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium Semiconductor Thermal Measurement and Management Symposium, 2007. SEMI-THERM 2007. Twenty Third Annual IEEE. :184-189 Mar, 2007
Relation: Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium
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15Report
Authors: Ma, H. K., Hou, B. R., Wu, H. Y., Lin, C. Y., Gao, J. J., Kou, M. C.
Source: Dans Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS - DTIP 2007, Stresa, lago Maggiore : Italie (2007)
Subject Terms: Computer Science - Other Computer Science
Access URL: http://arxiv.org/abs/0802.3070
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16Conference
Authors: Chen, Q., Zhang, D. W., Hao, H. B., Ma, H. K.
Source: Applied mechanics and materials. 740:895-899
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17Conference
Authors: Shie, J.-L., Chen, L.-X., Lin, K.-L., Li, Y.-S., Ma, H.-K., Chang, C.-Y.
Source: FRESENIUS ENVIRONMENTAL BULLETIN. 21(8C):2499-2505
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18Conference
Authors: Ma, H.-K., Wang, J.-S., Su, W.-H., Cheng, W.-Y.
Source: PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON FUEL CELL SCIENCE ENGINEERING AND TECHNOLOGY. :559-566
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19Conference
Authors: Lo, M.-C., Lin, J.-L., Guo, C.-Z., Ma, H.-K.
Source: INTERNATIONAL CONFERENCE ON DIGITAL PRINTING TECHNOLOGIES. :29-33
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20Conference
Authors: Ma, H.-K., Wang, J.-S., Chang, Y.-T.
Source: PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON FUEL CELL SCIENCE ENGINEERING AND TECHNOLOGY. CONF 8TH:489-496