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  1. 1
    Conference

    Source: 2024 7th International Conference on Artificial Intelligence and Big Data (ICAIBD) Artificial Intelligence and Big Data (ICAIBD), 2024 7th International Conference on. :138-143 May, 2024

    Relation: 2024 7th International Conference on Artificial Intelligence and Big Data (ICAIBD)

  2. 2
    Conference

    Source: 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2022. :730-735 Mar, 2022

    Relation: 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)

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    Academic Journal

    Authors: He, Chunyu1 (AUTHOR) hecy@ral.neu.edu.cn, Luo, Junyi1 (AUTHOR), Xu, Zhipeng1 (AUTHOR), Wang, Zhiqiang1 (AUTHOR), Zhao, Zhong1 (AUTHOR), Wu, Zhiqiang1 (AUTHOR), Jiao, Zhijie1 (AUTHOR) hecy@ral.neu.edu.cn

    Source: Materials (1996-1944). Dec2024, Vol. 17 Issue 23, p5964. 14p.

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    Conference

    Source: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2020 4th IEEE. :1-4 Apr, 2020

    Relation: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

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    Conference

    Source: 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) Electron Devices and Solid-State Circuits (EDSSC), 2019 IEEE International Conference on. :1-3 Jun, 2019

    Relation: 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)

  12. 12
    Conference

    Source: 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) Electron Devices and Solid-State Circuits (EDSSC), 2019 IEEE International Conference on. :1-3 Jun, 2019

    Relation: 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)

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    Academic Journal

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