Test and Repair Improvements for UCIe

Authors: Wang, Tsung-Hsuan, Chuang, Po-Yao, Lorenzelli, Francesco, Marinissen, Erik Jan

Source: 2024 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2024 IEEE. :1-6 May, 2024

Relation: 2024 IEEE European Test Symposium (ETS)

Generating Test Patterns for Chiplet Interconnects: Achieving Optimal Effectiveness and Efficiency

Authors: Chuang, Po-Yao, Lorenzelli, Francesco, Marinissen, Erik Jan

Source: 2023 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2023 IEEE International. :1-6 Sep, 2023

Relation: 2023 IEEE International Test Conference in Asia (ITC-Asia)

Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications

Authors: Lorenzelli, Francesco, Elsayed, Asser, Godfrin, Clement, Grill, Alexander, Kubicek, Stefan, Li, Ruoyu, Stucchi, Michele, Wan, Danny, De Greve, Kristiaan, Jan Marinissen, Erik, Gielen, Georges

Source: 2023 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2023 IEEE. :1-6 May, 2023

Relation: 2023 IEEE European Test Symposium (ETS)

Effective and Efficient Test and Diagnosis Pattern Generation for Many Inter-Die Interconnects in Chiplet-Based Packages

Authors: Chuang, Po-Yao, Lorenzelli, Francesco, Chakravarty, Sreejit, Boutobza, Slimane, Wu, Cheng-Wen, Gielen, Georges, Marinissen, Erik Jan

Source: 2023 IEEE International 3D Systems Integration Conference (3DIC) 3D Systems Integration Conference (3DIC), 2023 IEEE International. :1-6 May, 2023

Relation: 2023 IEEE International 3D Systems Integration Conference (3DIC)

Effective and Efficient Testing of Large Numbers of Inter-Die Interconnects in Chiplet-Based Multi-Die Packages

Authors: Chuang, Po-Yao, Lorenzelli, Francesco, Chakravarty, Sreejit, Wu, Cheng-Wen, Gielen, Georges, Marinissen, Erik Jan

Source: 2023 IEEE 41st VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2023 IEEE 41st. :1-6 Apr, 2023

Relation: 2023 IEEE 41st VLSI Test Symposium (VTS)

Speeding up Cell-Aware Library Characterization by Preceding Simulation with Structural Analysis

Authors: Lorenzelli, Francesco, Gao, Zhan, Swenton, Joe, Malagi, Santosh, Marinissen, Erik Jan

Source: 2021 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2021 IEEE European. :1-6 May, 2021

Relation: 2021 IEEE European Test Symposium (ETS)

Understanding the Transistor Behavior of Electron-Spin Qubits Above Cryogenic Temperatures

Authors: Lorenzelli, Francesco, Godfrin, Clement, Stucchi, Michele, Grill, Alexander, Li, Ruoyu, Wan, Danny, Greve, Kristiaan De, Marinissen, Erik Jan, Gielen, Georges

Source: IEEE Electron Device Letters; November 2024, Vol. 45 Issue: 11 p2217-2220, 4p