Assessment of potential ecological risk based on the vertical characteristics of potential toxic elements in sediments from a high-density cage culture reservoir in China

Authors: Zhang Jing, Liu Kun Yi, Guo Chen Lin, Zhang Jian-min, Xing Bing

Source: Ecotoxicology and Environmental Safety, Vol 262, Iss , Pp 115136- (2023)

Subject Terms: Sediment, Cage culture, Heavy metals, Vertical characteristic, Environmental pollution, TD172-193.5, Environmental sciences, GE1-350

File Description: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S0147651323006401; https://doaj.org/toc/0147-6513

Access URL: https://doaj.org/article/49340f6ce9634a5fabdd0d578964b9e8

Changes in lipids and medium- and long-chain fatty acids during the spontaneous fermentation of ripened pu-erh tea

Authors: Chen, Qiu-yue, Liu, Ming-li, Li, Ruo-yu, Jiang, Bin, Liu, Kun-yi, Xiao, Yan-qin, Wang, Qi, Wang, Teng, Zhao, Lian-qin, Wang, Wei-tao, Liu, Zhi-wei, Chen, Li-jiao, Ma, Yan, Zhao, Ming

Source: In Current Research in Food Science 2024 9

Changes in sensory characteristics, chemical composition and microbial succession during fermentation of ancient plants Pu-erh tea

Authors: Wang, Teng, Li, Ruo-yu, Liu, Kun-yi, Chen, Qiu-yue, Bo, Nian-guo, Wang, Qi, Xiao, Yan-qin, Sha, Gen, Chen, Si-qin, Lei, Xin, Lu, Yi, Ma, Yan, Zhao, Ming

Source: In Food Chemistry: X 30 December 2023 20

Defect free deep trench method for semiconductor chip

DEFECT FREE DEEP TRENCH METHOD FOR SEMICONDUCTOR CHIP

High throughput wafer stage design for optical lithography exposure apparatus

Method and software for conducting efficient lithography WPH / lost time analysis in semiconductor manufacturing

High throughput wafer stage design for optical lithography exposure apparatus

Method and software for conducting efficient lithography WPH / lost time analysis in semiconductor manufacturing

In-situ etch process control monitor

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